PL4070038T3 - Sposób i układ do określania i kontrolowania odległości rozdzielającej pomiędzy głowicą roboczą maszyny do obróbki laserowej a powierzchnią obrabianego obiektu za pomocą technik niskokoherentnej interferometrii optycznej - Google Patents

Sposób i układ do określania i kontrolowania odległości rozdzielającej pomiędzy głowicą roboczą maszyny do obróbki laserowej a powierzchnią obrabianego obiektu za pomocą technik niskokoherentnej interferometrii optycznej

Info

Publication number
PL4070038T3
PL4070038T3 PL20835875.4T PL20835875T PL4070038T3 PL 4070038 T3 PL4070038 T3 PL 4070038T3 PL 20835875 T PL20835875 T PL 20835875T PL 4070038 T3 PL4070038 T3 PL 4070038T3
Authority
PL
Poland
Prior art keywords
processed
determining
controlling
laser processing
low
Prior art date
Application number
PL20835875.4T
Other languages
English (en)
Inventor
Simone DONADELLO
Barbara Previtali
Daniele Colombo
Original Assignee
Adige S.P.A.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Adige S.P.A. filed Critical Adige S.P.A.
Publication of PL4070038T3 publication Critical patent/PL4070038T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02032—Interferometers characterised by the beam path configuration generating a spatial carrier frequency, e.g. by creating lateral or angular offset between reference and object beam
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/03—Observing, e.g. monitoring, the workpiece
    • B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/04—Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
    • B23K26/046—Automatically focusing the laser beam
    • B23K26/048—Automatically focusing the laser beam by controlling the distance between laser head and workpiece
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P10/00—Technologies related to metal processing
    • Y02P10/25—Process efficiency

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Laser Beam Processing (AREA)
PL20835875.4T 2019-12-06 2020-12-07 Sposób i układ do określania i kontrolowania odległości rozdzielającej pomiędzy głowicą roboczą maszyny do obróbki laserowej a powierzchnią obrabianego obiektu za pomocą technik niskokoherentnej interferometrii optycznej PL4070038T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT102019000023181A IT201900023181A1 (it) 2019-12-06 2019-12-06 Procedimento e sistema per la determinazione ed il controllo della distanza di separazione tra una testa di lavorazione di una macchina per la lavorazione laser e la superficie di un pezzo in lavorazione tramite tecniche di interferometria ottica a bassa coerenza
PCT/IB2020/061581 WO2021111423A1 (en) 2019-12-06 2020-12-07 Method and system for determining and controlling the separation distance between a working head of a laser processing machine and the surface of an object being processed by means of low coherence optical interferometry techniques

Publications (1)

Publication Number Publication Date
PL4070038T3 true PL4070038T3 (pl) 2025-03-24

Family

ID=70009268

Family Applications (1)

Application Number Title Priority Date Filing Date
PL20835875.4T PL4070038T3 (pl) 2019-12-06 2020-12-07 Sposób i układ do określania i kontrolowania odległości rozdzielającej pomiędzy głowicą roboczą maszyny do obróbki laserowej a powierzchnią obrabianego obiektu za pomocą technik niskokoherentnej interferometrii optycznej

Country Status (14)

Country Link
US (1) US20230013723A1 (pl)
EP (1) EP4070038B1 (pl)
JP (1) JP7655912B2 (pl)
KR (1) KR102953623B1 (pl)
CN (1) CN115053110B (pl)
BR (1) BR112022011030A2 (pl)
CA (1) CA3160503A1 (pl)
ES (1) ES2994573T3 (pl)
IT (1) IT201900023181A1 (pl)
MX (1) MX2022006849A (pl)
PL (1) PL4070038T3 (pl)
TW (1) TW202142830A (pl)
WO (1) WO2021111423A1 (pl)
ZA (1) ZA202207266B (pl)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT201900023229A1 (it) * 2019-12-06 2021-06-06 Adige Spa Procedimento e sistema per la determinazione della posizione di un elemento di un sistema ottico in un complesso di lavorazione o misura di un oggetto tramite misure interferometriche parallele
CN115889975B (zh) * 2023-01-31 2024-05-24 广东工业大学 一种激光焊接过程监测系统及方法
TWI842433B (zh) * 2023-03-15 2024-05-11 中國鋼鐵股份有限公司 傳動軸元件的修護方法
CN117664019A (zh) * 2023-11-30 2024-03-08 华中科技大学 一种高反射材料熔池的检测装置和方法
CN121025982A (zh) * 2025-09-24 2025-11-28 北京东方泰阳科技有限公司 一种流延料带厚度在线连续激光检测设备和系统

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5330749B2 (ja) * 2008-07-01 2013-10-30 株式会社トプコン 測定装置
WO2010092533A1 (en) * 2009-02-13 2010-08-19 Ecole Polytechnique Federale De Lausanne (Epfl) Method and apparatus for 3d object shape and surface topology measurements by contour depth extraction acquired in a single shot
EP2541193A1 (de) * 2011-06-27 2013-01-02 Hexagon Technology Center GmbH Interferometrisches Entfernungsmessverfahren zum Vermessen von Oberflächen und ebensolche Messanordnung
FR2978969B1 (fr) 2011-08-09 2013-09-13 Ascometal Sa Acier pour la fabrication de pieces cementees, piece cementee realisee avec cet acier et son procede de fabrication
CN103962723A (zh) * 2013-01-28 2014-08-06 鸿富锦精密工业（深圳）有限公司 激光加工装置
CA2905616C (en) * 2013-03-13 2021-08-24 Queen's University At Kingston Methods and systems for characterizing laser machining properties by measuring keyhole dynamics using interferometry
US8830475B1 (en) * 2013-08-19 2014-09-09 National Cheng Kung University Interferometer and spatial interference fourier transform spectrometer
DE102013016752A1 (de) * 2013-09-03 2015-03-05 Universität Stuttgart Verfahren und Anordnung zur robusten One-shot-Interferometrie, insbesondere auch zur optischen Kohärenz-Tomografie nach dem Spatial-domain-Ansatz (SD-OCT)
DE102013015656B4 (de) * 2013-09-23 2016-02-18 Precitec Optronik Gmbh Verfahren zum Messen der Eindringtiefe eines Laserstrahls in ein Werkstück, Verfahren zum Bearbeiten eines Werkstücks sowie Laserbearbeitungsvorrichtung
DE102014011569B4 (de) * 2014-08-02 2016-08-18 Precitec Optronik Gmbh Verfahren zum Messen des Abstands zwischen einem Werkstück und einem Bearbeitungskopf einer Laserbearbeitungsvorrichtung
DE102017117413B4 (de) 2017-08-01 2019-11-28 Precitec Gmbh & Co. Kg Verfahren zur optischen Messung der Einschweißtiefe
EP3647757B1 (en) * 2018-04-03 2022-06-08 Opt Gate Co., Ltd. Reflected light measurement device

Also Published As

Publication number Publication date
CN115053110B (zh) 2025-11-07
JP7655912B2 (ja) 2025-04-02
KR102953623B1 (ko) 2026-04-15
CN115053110A (zh) 2022-09-13
US20230013723A1 (en) 2023-01-19
EP4070038B1 (en) 2024-10-30
CA3160503A1 (en) 2021-06-10
ES2994573T3 (en) 2025-01-27
MX2022006849A (es) 2022-07-12
ZA202207266B (en) 2023-10-25
IT201900023181A1 (it) 2021-06-06
TW202142830A (zh) 2021-11-16
JP2023505772A (ja) 2023-02-13
EP4070038A1 (en) 2022-10-12
WO2021111423A1 (en) 2021-06-10
KR20220110254A (ko) 2022-08-05
BR112022011030A2 (pt) 2022-08-16

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