PL3553505T3 - Aparat i sposób do wykrywania promieniowania, oraz sposób i procesory do przetwarzania danych - Google Patents

Aparat i sposób do wykrywania promieniowania, oraz sposób i procesory do przetwarzania danych

Info

Publication number
PL3553505T3
PL3553505T3 PL17878824.6T PL17878824T PL3553505T3 PL 3553505 T3 PL3553505 T3 PL 3553505T3 PL 17878824 T PL17878824 T PL 17878824T PL 3553505 T3 PL3553505 T3 PL 3553505T3
Authority
PL
Poland
Prior art keywords
processors
data processing
detection apparatus
radiation detection
processing method
Prior art date
Application number
PL17878824.6T
Other languages
English (en)
Inventor
Yuanjing Li
Ziran Zhao
Jianmin Li
Yulan Li
Weibin Zhu
Xiang Zou
Qingjun Zhang
Chunguang ZONG
Xiaolin Zhao
Shuwei Li
Junxiao Wang
Original Assignee
Nuctech Company Limited
Tsinghua University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Company Limited, Tsinghua University filed Critical Nuctech Company Limited
Publication of PL3553505T3 publication Critical patent/PL3553505T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/248Silicon photomultipliers [SiPM], e.g. an avalanche photodiode [APD] array on a common Si substrate
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/17Circuit arrangements not adapted to a particular type of detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/03Investigating materials by wave or particle radiation by transmission
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/50Detectors
    • G01N2223/505Detectors scintillation

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Nuclear Medicine (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PL17878824.6T 2016-12-08 2017-09-22 Aparat i sposób do wykrywania promieniowania, oraz sposób i procesory do przetwarzania danych PL3553505T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201611143083.5A CN106596597B (zh) 2016-12-08 2016-12-08 辐射探测装置、方法以及数据处理方法和处理器
PCT/CN2017/103011 WO2018103414A1 (zh) 2016-12-08 2017-09-22 辐射探测装置、方法以及数据处理方法和处理器

Publications (1)

Publication Number Publication Date
PL3553505T3 true PL3553505T3 (pl) 2025-08-04

Family

ID=58597696

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17878824.6T PL3553505T3 (pl) 2016-12-08 2017-09-22 Aparat i sposób do wykrywania promieniowania, oraz sposób i procesory do przetwarzania danych

Country Status (7)

Country Link
US (1) US10338236B2 (pl)
EP (1) EP3553505B1 (pl)
JP (1) JP6954998B2 (pl)
CN (1) CN106596597B (pl)
DE (1) DE102017122546A1 (pl)
PL (1) PL3553505T3 (pl)
WO (1) WO2018103414A1 (pl)

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CN106596597B (zh) 2016-12-08 2019-10-11 同方威视技术股份有限公司 辐射探测装置、方法以及数据处理方法和处理器
CN107340308A (zh) * 2017-07-26 2017-11-10 苏州曼德克光电有限公司 一种基于光子计数式的绿色通道检测系统及方法
CN107219548B (zh) * 2017-07-31 2023-10-27 四川省核地质调查研究所 一种便携式反康普顿探测仪
CN110187356B (zh) * 2019-06-14 2021-07-09 中国科学技术大学 远距离超分辨单光子成像重构方法
DE102019210421B4 (de) * 2019-07-15 2023-03-09 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zur Messung eines Lichtsignalparameters und nichtflüchtiges Speichermedium
CN110971796A (zh) * 2019-11-28 2020-04-07 南昌大学 一种基于SiPM的超快相机及其成像方法
CN111246190B (zh) * 2020-01-21 2021-12-07 北京中科核安科技有限公司 基于核辐射定位仪的图像处理方法、装置及电子设备
CN111638545B (zh) * 2020-04-27 2022-03-04 北京永新医疗设备有限公司 确定NaI能谱仪的能量计算积分点数的方法
CN113109858A (zh) * 2021-04-13 2021-07-13 中北大学 一种高度集成的γ辐照探测器
CN118758980B (zh) * 2021-07-12 2025-10-10 同方威视技术股份有限公司 辐射成像系统和方法
CN113848580B (zh) * 2021-09-26 2024-09-27 中国科学院高能物理研究所 一种X/γ射线辐射量探测系统及探测方法
US20240125948A1 (en) * 2022-10-13 2024-04-18 The Regents Of The University Of California Single light photon counting radiation detector and data transmission methods

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JPS61226675A (ja) * 1985-03-30 1986-10-08 Toshiba Corp 放射線測定装置
DE10106221A1 (de) * 2001-02-10 2002-08-14 Philips Corp Intellectual Pty Röntgendetektor mit großem Dynamikbereich
JP5670739B2 (ja) * 2007-12-20 2015-02-18 コーニンクレッカ フィリップス エヌ ヴェ 放射線感知型の検出器アレー及び放射線を感知する方法
EP2376942B1 (en) * 2008-12-15 2013-03-27 Koninklijke Philips Electronics N.V. Temperature compensation circuit for silicon photomultipliers and other single photon counters
EP2404196B1 (en) * 2009-03-06 2013-10-16 Koninklijke Philips N.V. Temperature compensation and control circuit for single photon counters
JP5650719B2 (ja) * 2009-04-16 2015-01-07 コーニンクレッカ フィリップス エヌ ヴェ イメージング・システムおよびイメージング検出器アレイを用いた放射線検出方法
CN101576514B (zh) * 2009-06-12 2012-03-07 北京紫方启研科技有限公司 基于高灵敏线阵列探测器的便携式x射线探测仪
DE102011076358B4 (de) * 2011-05-24 2016-11-03 Siemens Healthcare Gmbh Computertomographiesystem mit integrierenden und zählenden Detektorelementen
CN104165639B (zh) * 2014-08-07 2017-07-28 中国科学院西安光学精密机械研究所 一种x射线脉冲探测器测试标定光源的方法及装置
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CN106596597B (zh) * 2016-12-08 2019-10-11 同方威视技术股份有限公司 辐射探测装置、方法以及数据处理方法和处理器

Also Published As

Publication number Publication date
US10338236B2 (en) 2019-07-02
EP3553505B1 (en) 2025-04-23
EP3553505A4 (en) 2020-09-02
CN106596597B (zh) 2019-10-11
JP2020501108A (ja) 2020-01-16
EP3553505A1 (en) 2019-10-16
WO2018103414A1 (zh) 2018-06-14
JP6954998B2 (ja) 2021-10-27
DE102017122546A1 (de) 2018-06-14
US20180164449A1 (en) 2018-06-14
CN106596597A (zh) 2017-04-26

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