PL3094995T3 - Sposób i układ do kontroli rentgenowskiej, zwłaszcza do nieniszczącego badania obiektu - Google Patents

Sposób i układ do kontroli rentgenowskiej, zwłaszcza do nieniszczącego badania obiektu

Info

Publication number
PL3094995T3
PL3094995T3 PL15700396T PL15700396T PL3094995T3 PL 3094995 T3 PL3094995 T3 PL 3094995T3 PL 15700396 T PL15700396 T PL 15700396T PL 15700396 T PL15700396 T PL 15700396T PL 3094995 T3 PL3094995 T3 PL 3094995T3
Authority
PL
Poland
Prior art keywords
inspection system
ray inspection
inspecting objects
destructively inspecting
destructively
Prior art date
Application number
PL15700396T
Other languages
English (en)
Inventor
Pia Dreiseitel
Sebastian König
Andreas Mader
Dirk Naumann
Jörg NITTIKOWSKI
Original Assignee
Smiths Detection Germany Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smiths Detection Germany Gmbh filed Critical Smiths Detection Germany Gmbh
Publication of PL3094995T3 publication Critical patent/PL3094995T3/pl

Links

Classifications

    • G01V5/226
PL15700396T 2014-01-16 2015-01-16 Sposób i układ do kontroli rentgenowskiej, zwłaszcza do nieniszczącego badania obiektu PL3094995T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102014200679.1A DE102014200679A1 (de) 2014-01-16 2014-01-16 Verfahren und Röntgenprüfanlage, insbesondere zur zerstörungsfreien Inspektion von Objekten
EP15700396.3A EP3094995B1 (de) 2014-01-16 2015-01-16 Verfahren und röntgenprüfanlage, insbesondere zur zerstörungsfreien inspektion von objekten
PCT/EP2015/050773 WO2015107150A2 (de) 2014-01-16 2015-01-16 Verfahren und röntgenprüfanlage, insbesondere zur zerstörungsfreien inspektion von objekten

Publications (1)

Publication Number Publication Date
PL3094995T3 true PL3094995T3 (pl) 2021-12-13

Family

ID=52350130

Family Applications (1)

Application Number Title Priority Date Filing Date
PL15700396T PL3094995T3 (pl) 2014-01-16 2015-01-16 Sposób i układ do kontroli rentgenowskiej, zwłaszcza do nieniszczącego badania obiektu

Country Status (6)

Country Link
US (1) US10338269B2 (pl)
EP (1) EP3094995B1 (pl)
CN (1) CN106164707B (pl)
DE (1) DE102014200679A1 (pl)
PL (1) PL3094995T3 (pl)
WO (1) WO2015107150A2 (pl)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10255671B1 (en) * 2015-03-06 2019-04-09 Assembly Guidance Systems, Inc. System and method for capture of high resolution/high magnification images
US9989483B2 (en) * 2015-08-17 2018-06-05 The Boeing Company Systems and methods for performing backscatter three dimensional imaging from one side of a structure
EP3351179A4 (en) * 2015-09-17 2018-08-29 Shimadzu Corporation Radiography apparatus
CN106526686B (zh) * 2016-12-07 2019-05-07 同方威视技术股份有限公司 螺旋ct设备和三维图像重建方法
DE102017102441A1 (de) * 2017-02-08 2018-08-09 Smiths Heimann Gmbh Projektion von Gegenständen in CT-Röntgenbilder
WO2019130373A1 (ja) * 2017-12-25 2019-07-04 株式会社日立製作所 X線インライン検査方法および装置
JP7157948B2 (ja) * 2018-04-25 2022-10-21 パナソニックIpマネジメント株式会社 部品実装ライン、部品実装方法及び品質管理システム
DE102019103429A1 (de) * 2019-02-12 2020-08-13 Volume Graphics Gmbh Computerimplementiertes Verfahren zur Bestimmung von Oberflächen in Messdaten
TWI726569B (zh) * 2020-01-06 2021-05-01 財團法人工業技術研究院 建立組合件之交界軌跡的系統及方法
CN114152637B (zh) * 2022-02-07 2022-04-26 东莞市志橙半导体材料有限公司 一种硬质碳化硅材料打孔检测装置与方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE58906047D1 (de) * 1989-08-09 1993-12-02 Heimann Systems Gmbh & Co Vorrichtung zum Durchstrahlen von Gegenständen mittels fächerförmiger Strahlung.
JPH04353792A (ja) * 1991-05-31 1992-12-08 Toshiba Corp 散乱線映像装置及びそれに用いる散乱線検出器
US5661774A (en) * 1996-06-27 1997-08-26 Analogic Corporation Dual energy power supply
US6088423A (en) * 1998-06-05 2000-07-11 Vivid Technologies, Inc. Multiview x-ray based system for detecting contraband such as in baggage
US6345113B1 (en) 1999-01-12 2002-02-05 Analogic Corporation Apparatus and method for processing object data in computed tomography data using object projections
DE10044357A1 (de) 2000-09-07 2002-03-21 Heimann Systems Gmbh & Co Detektoranordnung zur Detektion von Röntgenstrahlen
DE10149254B4 (de) 2001-10-05 2006-04-20 Smiths Heimann Gmbh Verfahren und Vorrichtung zur Detektion eines bestimmten Materials in einem Objekt mittels elektromagnetischer Strahlen
US6816571B2 (en) * 2002-02-06 2004-11-09 L-3 Communications Security And Detection Systems Corporation Delaware Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner
US20050058242A1 (en) * 2003-09-15 2005-03-17 Peschmann Kristian R. Methods and systems for the rapid detection of concealed objects
US7609807B2 (en) * 2004-02-17 2009-10-27 General Electric Company CT-Guided system and method for analyzing regions of interest for contraband detection
US7324625B2 (en) 2004-05-27 2008-01-29 L-3 Communications Security And Detection Systems, Inc. Contraband detection systems using a large-angle cone beam CT system
CN101326437A (zh) 2005-12-12 2008-12-17 显示成像技术有限公司 移置光线型ct检查
EP2676128B1 (en) 2011-02-18 2019-08-21 Smiths Heimann GmbH System and method for multi-scanner x-ray inspection

Also Published As

Publication number Publication date
DE102014200679A1 (de) 2015-07-16
US10338269B2 (en) 2019-07-02
EP3094995A2 (de) 2016-11-23
US20160334535A1 (en) 2016-11-17
WO2015107150A2 (de) 2015-07-23
EP3094995B1 (de) 2021-02-24
WO2015107150A3 (de) 2015-10-29
CN106164707B (zh) 2019-02-15
CN106164707A (zh) 2016-11-23

Similar Documents

Publication Publication Date Title
IL271440B (en) A method and system for classifying defects
IL285052B (en) Method and system for edge-of-wafer inspection and review
IL255814B (en) System and method for automatic inspection of surfaces
IL258804A (en) Systems and methods for adaptive-area detection of defects
PL3171332T3 (pl) Sposoby i systemy do kontroli towarów
PL3094995T3 (pl) Sposób i układ do kontroli rentgenowskiej, zwłaszcza do nieniszczącego badania obiektu
IL259578B (en) Inspection apparatus and method
EP3098594A4 (en) X-ray inspection apparatus and x-ray inspection method
GB2571045B (en) Facility inspection system and facility inspection method
EP3105101A4 (en) Method and system for non-destructive rail inspection
SG11201702570TA (en) Position accuracy inspecting method, position accuracy inspecting apparatus, and position inspecting unit
EP3348997A4 (en) X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE
EP3173780A4 (en) Nondestructive inspection method and nondestructive inspection device for anchor bolt
EP3267189A4 (en) Defect inspection device, defect inspection method, and program
HK1215473A1 (zh) 對移動目標進行輻射檢查的系統和方法
EP3190402A4 (en) Measurement processing device, x-ray inspection apparatus, method for manufacturing structure, measurement processing method, x-ray inspection method, measurement processing program, and x-ray inspection program
SG11201706758YA (en) Abrasion inspection apparatus, abrasion inspection method, and program
EP3361247A4 (en) NON-DESTRUCTIVE INSPECTION DEVICE AND METHOD FOR PRODUCING A BEARING
GB201413080D0 (en) Apparatus and method for testing materials
EP3267190A4 (en) Defect inspection device, defect inspection method, and program
GB201507839D0 (en) Method and apparatus for aircraft inspection
EP3225983A4 (en) Defect inspection device and defect inspection method
HK1211703A1 (en) An inspection device, method and system
PL3440364T3 (pl) Układ i sposób do badania materiałów
GB2570377B (en) Defect inspection method and defect inspection system