PL228790A2 - - Google Patents
Info
- Publication number
- PL228790A2 PL228790A2 PL22879080A PL22879080A PL228790A2 PL 228790 A2 PL228790 A2 PL 228790A2 PL 22879080 A PL22879080 A PL 22879080A PL 22879080 A PL22879080 A PL 22879080A PL 228790 A2 PL228790 A2 PL 228790A2
- Authority
- PL
- Poland
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL22879080A PL125645B2 (en) | 1980-12-24 | 1980-12-24 | Method of relative measurement of transparency of thin film of semiconductor material during its deposition on glass substrate in vacuum chamber |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL22879080A PL125645B2 (en) | 1980-12-24 | 1980-12-24 | Method of relative measurement of transparency of thin film of semiconductor material during its deposition on glass substrate in vacuum chamber |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| PL228790A2 true PL228790A2 (pl) | 1981-10-30 |
| PL125645B2 PL125645B2 (en) | 1983-06-30 |
Family
ID=20006631
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL22879080A PL125645B2 (en) | 1980-12-24 | 1980-12-24 | Method of relative measurement of transparency of thin film of semiconductor material during its deposition on glass substrate in vacuum chamber |
Country Status (1)
| Country | Link |
|---|---|
| PL (1) | PL125645B2 (pl) |
-
1980
- 1980-12-24 PL PL22879080A patent/PL125645B2/pl unknown
Also Published As
| Publication number | Publication date |
|---|---|
| PL125645B2 (en) | 1983-06-30 |