PL1764609T3 - Urządzenie mierzące gaz - Google Patents

Urządzenie mierzące gaz

Info

Publication number
PL1764609T3
PL1764609T3 PL06012008T PL06012008T PL1764609T3 PL 1764609 T3 PL1764609 T3 PL 1764609T3 PL 06012008 T PL06012008 T PL 06012008T PL 06012008 T PL06012008 T PL 06012008T PL 1764609 T3 PL1764609 T3 PL 1764609T3
Authority
PL
Poland
Prior art keywords
measuring apparatus
gas measuring
gas
measuring
Prior art date
Application number
PL06012008T
Other languages
English (en)
Inventor
Christoph Baumgärter
Original Assignee
Woelke Ind Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Woelke Ind Gmbh filed Critical Woelke Ind Gmbh
Publication of PL1764609T3 publication Critical patent/PL1764609T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/0303—Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment
PL06012008T 2005-09-16 2006-06-10 Urządzenie mierzące gaz PL1764609T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102005044479A DE102005044479A1 (de) 2005-09-16 2005-09-16 Gasmessgerät für grubengasexplosionsgefährdete Bergwerke
EP06012008A EP1764609B1 (de) 2005-09-16 2006-06-10 Gasmessgerät

Publications (1)

Publication Number Publication Date
PL1764609T3 true PL1764609T3 (pl) 2013-04-30

Family

ID=37461447

Family Applications (1)

Application Number Title Priority Date Filing Date
PL06012008T PL1764609T3 (pl) 2005-09-16 2006-06-10 Urządzenie mierzące gaz

Country Status (4)

Country Link
EP (1) EP1764609B1 (pl)
CN (1) CN100580427C (pl)
DE (1) DE102005044479A1 (pl)
PL (1) PL1764609T3 (pl)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102590133B (zh) * 2012-03-01 2013-12-11 深圳市赛宝伦计算机技术有限公司 在线监测仪
CN103149327B (zh) * 2013-02-05 2015-04-22 中国矿业大学 高空环境气体自动采集方法及装置
DE102013104964A1 (de) 2013-05-14 2014-11-20 Micro-Hybrid Electronic Gmbh Hermetisch gasdichtes optoelektronisches oder elektrooptisches Bauteil sowie Verfahren zu seiner Herstellung
US9109951B2 (en) 2013-11-06 2015-08-18 Spectrasensors, Inc. Reduced volume spectroscopic sample cell
CN105467084B (zh) * 2015-12-21 2017-09-19 徐州江煤科技有限公司 一种矿用检测装置
CN106124710A (zh) * 2016-08-12 2016-11-16 安徽中杰信息科技有限公司 挥发性气体浓度检查方法
DE102020200187A1 (de) * 2020-01-09 2021-07-15 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Sensoranordnung und verfahren zum ermitteln eines co2-gehalts in einer vorgegebenen umgebung

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3334264A1 (de) * 1982-09-25 1984-04-05 Showa Denko K.K., Tokyo Verfahren und messgeraet zum messen der methan-konzentration in einem gasgemisch
US4709150A (en) * 1986-03-18 1987-11-24 Burough Irvin G Method and apparatus for detecting gas
CN2140059Y (zh) * 1992-05-29 1993-08-11 于鸿津 气体检定器
WO1996001418A1 (en) 1994-07-05 1996-01-18 Telaire Systems, Inc. Ndir gas analysis using spectral ratioing technique
DE19608604C2 (de) 1996-03-06 1998-09-10 Conducta Endress & Hauser Gasanalysator und Meßküvette zur Verwendung in einem Gasanalysator

Also Published As

Publication number Publication date
EP1764609A2 (de) 2007-03-21
CN100580427C (zh) 2010-01-13
CN1932479A (zh) 2007-03-21
EP1764609A3 (de) 2008-01-02
DE102005044479A1 (de) 2007-03-22
EP1764609B1 (de) 2012-10-24

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