PH12016501494B1 - Modular multiplexing interface assembly for reducing semiconductor testing index time - Google Patents

Modular multiplexing interface assembly for reducing semiconductor testing index time

Info

Publication number
PH12016501494B1
PH12016501494B1 PH12016501494A PH12016501494A PH12016501494B1 PH 12016501494 B1 PH12016501494 B1 PH 12016501494B1 PH 12016501494 A PH12016501494 A PH 12016501494A PH 12016501494 A PH12016501494 A PH 12016501494A PH 12016501494 B1 PH12016501494 B1 PH 12016501494B1
Authority
PH
Philippines
Prior art keywords
modular
interface assembly
multiplexing interface
testing index
index time
Prior art date
Application number
PH12016501494A
Other languages
English (en)
Other versions
PH12016501494A1 (en
Inventor
Jr Howard H Roberts
Original Assignee
Celerint Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Celerint Llc filed Critical Celerint Llc
Publication of PH12016501494B1 publication Critical patent/PH12016501494B1/en
Publication of PH12016501494A1 publication Critical patent/PH12016501494A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
PH12016501494A 2014-02-04 2016-07-28 Modular multiplexing interface assembly for reducing semiconductor testing index time PH12016501494A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201461935517P 2014-02-04 2014-02-04
PCT/US2015/014209 WO2015119928A1 (en) 2014-02-04 2015-02-03 Modular multiplexing interface assembly for reducing semiconductor testing index time

Publications (2)

Publication Number Publication Date
PH12016501494B1 true PH12016501494B1 (en) 2016-10-03
PH12016501494A1 PH12016501494A1 (en) 2016-10-03

Family

ID=53778367

Family Applications (1)

Application Number Title Priority Date Filing Date
PH12016501494A PH12016501494A1 (en) 2014-02-04 2016-07-28 Modular multiplexing interface assembly for reducing semiconductor testing index time

Country Status (7)

Country Link
US (1) US10197622B2 (zh)
CN (1) CN105960594B (zh)
MY (1) MY183095A (zh)
PH (1) PH12016501494A1 (zh)
SG (1) SG11201606229VA (zh)
TW (1) TWI652487B (zh)
WO (1) WO2015119928A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110794277B (zh) * 2018-07-26 2022-06-03 株式会社爱德万测试 电子部件处理装置及电子部件测试装置
JP7143134B2 (ja) * 2018-07-26 2022-09-28 株式会社アドバンテスト ロードボード及び電子部品試験装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5310039A (en) * 1992-08-19 1994-05-10 Intel Corporation Apparatus for efficient transfer of electronic devices
EP0973098A1 (en) 1994-03-11 2000-01-19 The Panda Project High density connector system
US6242899B1 (en) * 1998-06-13 2001-06-05 Lecroy Corporation Waveform translator for DC to 75 GHz oscillography
ES2226770T3 (es) 1999-01-22 2005-04-01 Multigig Limited Circuito electronico.
US6856862B1 (en) 2003-03-18 2005-02-15 Xilinx, Inc. Light curtain safety system for semiconductor device handler
US6804620B1 (en) * 2003-03-21 2004-10-12 Advantest Corporation Calibration method for system performance validation of automatic test equipment
US7619432B2 (en) 2004-01-29 2009-11-17 Howard Roberts Tandem handler system and method for reduced index time
US7183785B2 (en) 2004-01-29 2007-02-27 Howard Roberts Test system and method for reduced index time
US7508191B2 (en) 2004-01-29 2009-03-24 Howard Roberts Pin electronics implemented system and method for reduced index time
TWI288241B (en) 2005-11-30 2007-10-11 Ip Leader Technology Corp Probing apparatus, probing print-circuit board and probing system for high-voltage matrix-based probing
US7420385B2 (en) * 2005-12-05 2008-09-02 Verigy (Singapore) Pte. Ltd. System-on-a-chip pipeline tester and method
US7650255B2 (en) * 2008-05-02 2010-01-19 Texas Instruments Incorporated Automatic selective retest for multi-site testers
US9753081B2 (en) 2010-02-05 2017-09-05 Celerint, Llc Muxing interface platform for multiplexed handlers to reduce index time system and method
US9074922B2 (en) * 2012-12-10 2015-07-07 Ge-Hitachi Nuclear Energy Americas Llc Systems and methods for remotely measuring a liquid level using time-domain reflectometry (TDR)

Also Published As

Publication number Publication date
SG11201606229VA (en) 2016-08-30
MY183095A (en) 2021-02-13
CN105960594A (zh) 2016-09-21
US20170168111A1 (en) 2017-06-15
CN105960594B (zh) 2019-03-15
TWI652487B (zh) 2019-03-01
US10197622B2 (en) 2019-02-05
TW201534942A (zh) 2015-09-16
WO2015119928A1 (en) 2015-08-13
PH12016501494A1 (en) 2016-10-03

Similar Documents

Publication Publication Date Title
MX2019008904A (es) Probador funcional para tarjetas de circuito impreso y metodos y sistemas asociados.
TW201129814A (en) Electrical connecting apparatus and testing system using the same
EP3822801A3 (en) Method and apparatus for providing interface
GB2563762A (en) Method and apparatus for modular power distribution
EP4170711A3 (en) High voltage power module
WO2015061596A3 (en) Unified connector for multiple interfaces
MY176156A (en) Electronic assembly test system
PL3076195T3 (pl) Układ obwodów do badania kabli, testowania kabli, diagnostyki kabli i/albo lokalizacji uszkodzeń kabli oraz urządzenie z takim układem obwodów
WO2014065843A3 (en) Testing of devices with multiple interfaces using a single multi-pin cable
EP2899552A3 (en) Current detection structure
MY168794A (en) Parallel concurrent test system and method
MX371263B (es) Elemento de fijación para fijarse a un tablero de circuitos asi como un dispositivo de fijación y método para la conexión separada de tableros de circuitos con tal elemento de fijación.
MX361114B (es) Elemento de conexión eléctrica para poner en contacto una estructura conductora de electricidad sobre un sustrato.
PH12014501769A1 (en) High speed communication jack
MX2017010473A (es) Deteccion de fallas en un ensamblaje de luz de diodos de emision de luz (led).
TW201614241A (en) Circuit board testing apparatus and circuit board testing method
TW201712576A (en) Integrated circuit layout using library cells with alternating conductive lines
HUE061586T2 (hu) Csatlakozó hibrid kábelelrendezéssel és áramköri lap elrendezéssel
MX2017006876A (es) Dispositivo de tarjeta de punto de prueba para un banco de pruebas.
MX2016010509A (es) Sistema electrónicos modular con componentes intercambiables de interconexión.
PH12016501494B1 (en) Modular multiplexing interface assembly for reducing semiconductor testing index time
PH12018501261A1 (en) Array of electrical generator units and shedding of inter-unit transmission cables in response to fault
GB201106054D0 (en) Coupling unit for use with a twisted pair cable and associated apparatuses and methods
EP3491402C0 (de) Testsystem zur überprüfung von elektronischen verbindungen von bauteilen mit einer leiterplatte
EP2677392A3 (en) Memory Apparatus and Electronic Apparatus