SG11201606229VA - Modular multiplexing interface assembly for reducing semiconductor testing index time - Google Patents

Modular multiplexing interface assembly for reducing semiconductor testing index time

Info

Publication number
SG11201606229VA
SG11201606229VA SG11201606229VA SG11201606229VA SG11201606229VA SG 11201606229V A SG11201606229V A SG 11201606229VA SG 11201606229V A SG11201606229V A SG 11201606229VA SG 11201606229V A SG11201606229V A SG 11201606229VA SG 11201606229V A SG11201606229V A SG 11201606229VA
Authority
SG
Singapore
Prior art keywords
interface assembly
testing index
index time
semiconductor testing
multiplexing interface
Prior art date
Application number
SG11201606229VA
Inventor
Jr Howard H Roberts
Original Assignee
Celerint Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Celerint Llc filed Critical Celerint Llc
Publication of SG11201606229VA publication Critical patent/SG11201606229VA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG11201606229VA 2014-02-04 2015-02-03 Modular multiplexing interface assembly for reducing semiconductor testing index time SG11201606229VA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201461935517P 2014-02-04 2014-02-04
PCT/US2015/014209 WO2015119928A1 (en) 2014-02-04 2015-02-03 Modular multiplexing interface assembly for reducing semiconductor testing index time

Publications (1)

Publication Number Publication Date
SG11201606229VA true SG11201606229VA (en) 2016-08-30

Family

ID=53778367

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201606229VA SG11201606229VA (en) 2014-02-04 2015-02-03 Modular multiplexing interface assembly for reducing semiconductor testing index time

Country Status (7)

Country Link
US (1) US10197622B2 (en)
CN (1) CN105960594B (en)
MY (1) MY183095A (en)
PH (1) PH12016501494B1 (en)
SG (1) SG11201606229VA (en)
TW (1) TWI652487B (en)
WO (1) WO2015119928A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110794277B (en) * 2018-07-26 2022-06-03 株式会社爱德万测试 Electronic component handling apparatus and electronic component testing apparatus
JP7143134B2 (en) * 2018-07-26 2022-09-28 株式会社アドバンテスト Load board and electronic component test equipment

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5310039A (en) * 1992-08-19 1994-05-10 Intel Corporation Apparatus for efficient transfer of electronic devices
EP0977127A2 (en) * 1994-03-11 2000-02-02 The Panda Project Method for configuring a computer system
US6242899B1 (en) * 1998-06-13 2001-06-05 Lecroy Corporation Waveform translator for DC to 75 GHz oscillography
ES2226770T3 (en) * 1999-01-22 2005-04-01 Multigig Limited ELECTRONIC CIRCUIT.
US6856862B1 (en) 2003-03-18 2005-02-15 Xilinx, Inc. Light curtain safety system for semiconductor device handler
US6804620B1 (en) * 2003-03-21 2004-10-12 Advantest Corporation Calibration method for system performance validation of automatic test equipment
US7619432B2 (en) 2004-01-29 2009-11-17 Howard Roberts Tandem handler system and method for reduced index time
US7183785B2 (en) 2004-01-29 2007-02-27 Howard Roberts Test system and method for reduced index time
US7508191B2 (en) 2004-01-29 2009-03-24 Howard Roberts Pin electronics implemented system and method for reduced index time
TWI288241B (en) * 2005-11-30 2007-10-11 Ip Leader Technology Corp Probing apparatus, probing print-circuit board and probing system for high-voltage matrix-based probing
US7420385B2 (en) * 2005-12-05 2008-09-02 Verigy (Singapore) Pte. Ltd. System-on-a-chip pipeline tester and method
US7650255B2 (en) * 2008-05-02 2010-01-19 Texas Instruments Incorporated Automatic selective retest for multi-site testers
US9753081B2 (en) * 2010-02-05 2017-09-05 Celerint, Llc Muxing interface platform for multiplexed handlers to reduce index time system and method
US9074922B2 (en) * 2012-12-10 2015-07-07 Ge-Hitachi Nuclear Energy Americas Llc Systems and methods for remotely measuring a liquid level using time-domain reflectometry (TDR)

Also Published As

Publication number Publication date
US10197622B2 (en) 2019-02-05
MY183095A (en) 2021-02-13
WO2015119928A1 (en) 2015-08-13
TWI652487B (en) 2019-03-01
PH12016501494A1 (en) 2016-10-03
US20170168111A1 (en) 2017-06-15
TW201534942A (en) 2015-09-16
CN105960594B (en) 2019-03-15
CN105960594A (en) 2016-09-21
PH12016501494B1 (en) 2016-10-03

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