NZ620402B2 - Test method for an elevator system and a monitoring device for carrying out the test method - Google Patents
Test method for an elevator system and a monitoring device for carrying out the test method Download PDFInfo
- Publication number
- NZ620402B2 NZ620402B2 NZ620402A NZ62040212A NZ620402B2 NZ 620402 B2 NZ620402 B2 NZ 620402B2 NZ 620402 A NZ620402 A NZ 620402A NZ 62040212 A NZ62040212 A NZ 62040212A NZ 620402 B2 NZ620402 B2 NZ 620402B2
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- New Zealand
- Prior art keywords
- microprocessor
- signal
- control unit
- test method
- value
- Prior art date
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- 238000010998 test method Methods 0.000 title claims abstract description 33
- 238000009434 installation Methods 0.000 claims description 13
- 150000001768 cations Chemical group 0.000 claims description 8
- 230000000875 corresponding Effects 0.000 description 5
- 230000002269 spontaneous Effects 0.000 description 5
- 230000001939 inductive effect Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 239000004020 conductor Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 230000002349 favourable Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B66—HOISTING; LIFTING; HAULING
- B66B—ELEVATORS; ESCALATORS OR MOVING WALKWAYS
- B66B13/00—Doors, gates, or other apparatus controlling access to, or exit from, cages or lift well landings
- B66B13/22—Operation of door or gate contacts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B66—HOISTING; LIFTING; HAULING
- B66B—ELEVATORS; ESCALATORS OR MOVING WALKWAYS
- B66B5/00—Applications of checking, fault-correcting, or safety devices in elevators
- B66B5/0006—Monitoring devices or performance analysers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B66—HOISTING; LIFTING; HAULING
- B66B—ELEVATORS; ESCALATORS OR MOVING WALKWAYS
- B66B5/00—Applications of checking, fault-correcting, or safety devices in elevators
- B66B5/0006—Monitoring devices or performance analysers
- B66B5/0018—Devices monitoring the operating condition of the elevator system
- B66B5/0031—Devices monitoring the operating condition of the elevator system for safety reasons
Abstract
The invention relates to a test method for an elevator system having a control unit (11) and at least one bus node (13). The bus node (13) has a first microprocessor (14) and a second microprocessor (15). The control unit (11) and the bus node (13) communicate by means of a bus (12). Furthermore, the first microprocessor (14) and the second microprocessor (15) are connected without interruption by means of a signal line (18). The test method comprises the following steps: a specification signal is transmitted by the control unit (11) to the first microprocessor (14), the first microprocessor (14) transmits the signal to the second microprocessor (15), and the second microprocessor (15) provides the signal for the control unit (11). Finally, the control unit (11) verifies whether the provided signal corresponds to a signal expected by the control unit (11). A second aspect relates to a monitoring device for carrying out the test method. e first microprocessor (14) and the second microprocessor (15) are connected without interruption by means of a signal line (18). The test method comprises the following steps: a specification signal is transmitted by the control unit (11) to the first microprocessor (14), the first microprocessor (14) transmits the signal to the second microprocessor (15), and the second microprocessor (15) provides the signal for the control unit (11). Finally, the control unit (11) verifies whether the provided signal corresponds to a signal expected by the control unit (11). A second aspect relates to a monitoring device for carrying out the test method.
Description
Test method for an elevator system and a monitoring device for carrying out the test
method
The invention relates to a test method for an elevator installation and to a ring
device for carrying out the test method according to the subject matter of the independent
claims.
Conventional or installations have safety circuits which consist of safety elements
1O ted in . These safety elements monitor, for example, the state of shaft or car
doors. Such a safety t may be a contact. An open contact shows, for example, that
a door is open and a potentially impermissible door state has occurred. If an
impermissible open state of the doors is now identified with the contact open, the safety
circuit is interrupted. This results in a drive or brakes, which act on the travel of an
elevator car, stopping the elevator car.
The patent specification A1 discloses a monitoring device for an
elevator installation having a control unit and at least one bus node and a bus. The bus
enables communication between the bus nodes and the control unit. The bus node
monitors, for example, the state of shaft doors using a safety element. The bus node has a
first microprocessor and a second microprocessor. In this case, the first rocessor is
designed to read l specification signals from the control unit, to convert said signals
into an analog signal and to apply the latter to the safety element. The second
microprocessor in turn measures the analog signal downstream of the safety element and
converts said analog signal into a digital signal. The second rocessor provides the
control unit with this digital information. This information is either transmitted from the
bus nodes to the control unit in the form of digital signals or is requested by the control
unit by means of a query. If the safety switch is open and the second microprocessor
consequently does not measure an analog signal, it spontaneously transmits an item of
negative status information to the control unit.
So that safe operation of the elevator installation can be ensured, it is necessary to
recurrently test the proper functionality of the two microprocessors, in ular the
second microprocessor if a ve status occurs, that is to say if a safety element is
open. Al proposes a specification signal test for this e. During
this test, the control unit transmits different digital specification signals to the first
microprocessor. The control unit can determine, on the basis of the digital signals
transmitted or provided by the second microprocessor, r the two microprocessors
correctly convert the varying specification signals. A cation signal having the value
of zero or an error value is a special situation in which the spontaneous response of the
second microprocessor is provoked. The control unit transmits a digital specification
signal having an error value to the first microprocessor, which converts said signal into an
analog cation signal having an error value and applies it to the safety element. An
open safety element is simulated as a . The l unit expects the second
microprocessor to spontaneously respond on the basis of the detected analog specification
signal having an error value and to send a digital signal to this control unit. If these
expectations of the control unit are met and the other specification signals are correctly
converted, the l unit can assume that both the first microprocessor and the second
microprocessor are operating properly.
A antage of such testable bus nodes is their still relatively expensive production. In
the mass production of these bus nodes, small cost savings already have a large price
effect.
The object of the present invention is therefore to provide a test method for an elevator
installation and a monitoring device for carrying out the test method which make it
possible to bly produce the monitoring device, in particular the bus nodes.
In a first aspect, the present invention provides a test method for an elevator installation
having a control unit and at least one bus node which has a first microprocessor and a
second microprocessor, the control unit and the bus node communicating via a bus, and
the first rocessor and the second microprocessor being connected without
interruption via a signal line; having the following steps: the control unit transmits a
specification signal to the first microprocessor; the first microprocessor transmits the
signal to the second microprocessor via the signal line; the second microprocessor
provides the signal for the control unit; and the l unit verifies whether the signal
provided corresponds to a signal expected by the control unit.
In a further aspect, the present invention provides a monitoring device designed to carry
out the test method as set out in the first aspect, having a control unit and at least one bus
node which has a first microprocessor and a second microprocessor, the control unit and
the bus node communicating via a bus, and the first microprocessor and the second
microprocessor being connected without interruption Via a signal line.
An uninterrupted signal line is intended to be understood here as meaning a signal line
which comprises a continuous conductor which, like here, directly connects two
1O microprocessors to one another, for example. In ular, a signal line which consists of
a plurality of assembled subelements which are in contact is not considered to be a
continuous conductor or uninterrupted signal line here. An uninterrupted signal line
therefore does not comprise any subelements such as switches, safety elements or the
like, even if these ments are in contact with the signal line or parts of the latter.
The advantage of this monitoring device is that, during the test method, the specification
signal transmitted by the control unit and then ted in the first microprocessor is
transmitted by the first microprocessor to the second rocessor via a signal line.
This is e this signal line connects the first microprocessor and the second
microprocessor without interruption, with the result that the second signal line directly
ts the first microprocessor and the second microprocessor. It is particularly
advantageous that the signal line is arranged inside the bus node. Since this signal line
does not contain any additional elements, such as a safety element or a switch, and can be
very short, its ance is very small. Signals can therefore be transmitted from the first
microprocessor to the second microprocessor with very little energy. In comparison with
the bus node bed at the outset, a low—performance signal amplifier can accordingly
be used. The bus node can therefore be produced in a particularly favorable manner.
In a first embodiment of the test method, the control unit transmits a specification signal
having a first value to a bus node. In response, the bus node provides a signal having a
second value. The control unit then verifies whether the second value provided can be
associated with the first transmitted value. The second value can be associated with the
first value when the second value ed ponds to a second value expected by the
control unit in response to the first value. If the second value provided can be associated,
the test has been passed. If the second value ed cannot be associated with the first
W0 2013/020806
_ 4 -
value, the test is considered to not have been passed.
Furthermore, the first rocessor of the bus node reads the specification signal
having the first value, which is transmitted by the control unit, and converts this
specification signal into a bus—node-internal signal which is transmitted by the first
microprocessor to the second microprocessor via the signal line. The second
microprocessor reads this signal, converts it into a response signal having a second value
and provides the l unit with the response .
1O In a preferred first embodiment, the specification signal is a first digital current value.
The first microprocessor reads in this t value and converts it into an analog current
signal with a current intensity corresponding to the first l t value of the
specification signal. The first microprocessor s the analog current signal to the
signal line. The second microprocessor measures the current intensity of the analog
current signal and converts the measured current intensity into a digital signal having a
second t value corresponding to the ed current value. The second
microprocessor provides the control unit with this digital signal as a response signal. The
control unit verifies whether the second t value can be associated with or
corresponds to the first transmitted current value.
Instead of the current value, it is also possible to specify a voltage value, a frequency
value, a switched-on duration value or a code value. The first microprocessor accordingly
applies an analog signal comprising one of these values to the signal line.
atively, the first microprocessor applies a digital signal having a code value which
preferably corresponds to a code value of the specification signal to the signal line. This
code value is read by the second microprocessor and is accordingly provided to the
control unit. The conversion of the digital signal into an analog signal and back into a
digital signal again in the first and second microprocessors is dispensed with here. In this
alternative, the code value may be any number or a number sequence.
At least two queries having two different specification values are preferably carried out
during this test method. If the value of the response signal provided can be associated
twice with the two different values of the specification signals, the test is considered to
have been passed.
The control unit preferably carries out the test method for the bus node at recurring
intervals of time. The interval of time depends on the ility of the first and second
microprocessors used and is between 1 and 100 s.
In the event of negative verification of the digital signal ed or if the test is not
passed, the control unit takes es to change the elevator installation to a safe
operating state.
In another embodiment of the test method, the control unit transmits a specification signal
containing an error value to a bus node. A signal which is provided to the second
microprocessor by a safety element and represents an unsafe state of the elevator
installation is ted during this test. In this case, the control unit expects the bus node
being tested to spontaneously transmit a response signal to the control unit. A t zero
value, a voltage zero value, a frequency zero value or a switched-on duration zero value
corresponds to such an error value. One of these zero values is used, for example, to
simulate an open safety element designed as a safety switch. A code value can likewise
represent an unsafe state of the elevator installation or an error value.
In this case, the control unit transmits a specification signal having an error value to the
first microprocessor. The latter reads in the value and applies a signal having an error
value to the signal line inside the bus node. The second microprocessor reads in this
signal having the error value and spontaneously transmits a response signal to the control
unit. In this case too, the signal transmitted by the first microprocessor via the second
signal line is an analog or digital .
The invention is illustrated and described in more detail below using a plurality of
ary embodiments and two figures, in which:
figl shows a schematic view of a first embodiment of the monitoring device; and
fig.2 shows a schematic view of a second embodiment of the monitoring .
As described at the outset, the present monitoring device 10 and the present test method
wo 2013/020806
_ 6 -
are particularly suitable for use in or installations.
Fig.1 shows a first embodiment of the monitoring device 10. The ring device 10
has a control unit 11 and at least one bus node 13. The control unit 11 and the bus node
13 communicate via a bus 12. Data can therefore be sent in both directions between the
bus node 13 and the control unit 11 Via the bus. The bus node 13 itself comprises a first
microprocessor 14 and a second microprocessor 15. The first microprocessor l4 and the
second microprocessor 15 are each designed in such a manner that the former receives
specification s from the control unit 11 and the latter provides the control unit 11
1O with state information as response s. The bus node 13 is also connected to a safety
element 16 via a signal line 17.1, 17.2 outside the bus node, a first part 17.1 of the signal
line outside the bus node connecting the first microprocessor 14 to the safety element 16
and a second part 17.2 of the signal line outside the bus node connecting the safety
element 16 to the second microprocessor 15. Finally, the first microprocessor l4 and the
second microprocessor 15 are connected to one another without interruption Via a signal
line 18 inside the bus node.
The control unit 11, the bus 12 and the at least one bus node 13 form a bus system. Inside
this bus system, each bus node 13 has its own, unique address. Messages are set up
between the ller 11 and a bus node 13 using this address.
The control unit 11 passes digital cation s to the first microprocessor 14 via
the bus 12. In this case, the control unit addresses a particular bus node 13 and
communicates the specification signal to the first microprocessor 14. The first
microprocessor 14 receives this specification signal and generates an analog signal
corresponding to the specification signal, which analog signal is applied to the signal line
17.1, 17.2 e the bus node. The analog signal may be a particular voltage, current
intensity, ncy or switched-on duration value.
The safety element 16 shows the state of a safety-relevant element. The safety element 16
is therefore used, for example, as a door contact, a bolt t, a buffer contact, a flap
contact, a movement control switch or an emergency stop switch. As a safety switch, the
safety element 16 is designed, for example, such that a closed safety element 16
represents a safe state and an open safety element 16 represents a potentially dangerous
state of an elevator installation.
When the safety element 16 is closed, the second microprocessor 15 measures,
dOWnstream of the safety element 16, the analog signal arriving via the signal line 17.2
outside the bus node. After measurement, the second microprocessor 15 converts the
measured analog signal into a digital signal. The second microprocessor 15 finally
es the control unit 11 with the l signal.
The safety element 16 monitors, for example, the state of a car or shaft door. If one of
1O these doors is open, the safety element 16 is likewise open and therefore indicates a
potentially ous state of the elevator installation. In this case, the signal line 17.1,
17.2 outside the bus node is interrupted. As bed above, the second microprocessor
measures the analog signal arriving downstream of the safety element 16. If a safety
element 16 is open, this analog signal can no longer be measured by the second
microprocessor 15. In this case, the second microprocessor 15 measures an analog signal
having an error value of zero. Depending on the type of analog signal, there is therefore
an error current with a current value of 0 mA, an error voltage with a voltage value of
0 mV, an error frequency with a frequency value of 0 Hz or an error switched—on duration
value with a switched—on duration value of 0%. If an error value is now measured by the
second microprocessor 15, the second microprocessor 15 spontaneously transmits a
l signal to the control unit 11 Via the bus 12 on the basis of the measured error
value.
Thanks to the unique address of the bus node 13, the control unit 11 is able to accurately
locate the error. If necessary, the control unit 11 takes measures to eliminate the error or
to change the elevator to a safe operating mode. These operating modes comprise, inter
alia, the maintenance of ing availability of the elevator in a safe travel range of the
elevator car, the tion of trapped passengers, an emergency stop or finally the
alerting of maintenance and service personnel in order to free trapped passengers and/or
in order to ate an error which cannot be eliminated by the control unit.
The safe operation of a bus node 13 ily depends on the functionality of the first
microprocessor 14 and of the second microprocessor 15. In particular, it must be ensured
that the ing steps are carried out by the first and second microprocessors 14, 15
_ g _
without errors: conversion of the cation signal into an analog signal in the first
microprocessor 14, measurement of the analog signal in the second microprocessor 15,
provision of the response signal by the second microprocessor 15 and the spontaneous
behavior of the second microprocessor 15 when measuring an analog signal having an
error value.
During a first test, the functional behavior of a bus node 13 when converting a
specification signal during normal operation is checked. In this case, the control unit 11
transmits a specification signal having a current, voltage, frequency or switched-on
duration value in digital form to a selected bus node 13 by g the address of the bus
node 13. This specification signal is renewed at particular intervals of time, that is to say
the control unit 11 transmits specification signal having a new current, voltage, frequency
or switched-on duration value to the bus node 13. The new value preferably differs from
the preceding value. Within such an interval of time, the first microprocessor 14 generates
a corresponding analog signal in ance with the specification signal. The first
microprocessor 14 applies this analog signal to the signal line 18 inside the bus node. The
second microprocessor 15 es this analog signal and provides the measured value
as a digital response signal. In time with the al of time, the control unit 11 addresses
the second microprocessor 15 of the bus node 13 and obtains the data relating to the
current, voltage, frequency or switched—on duration value ed as a digital response
signal via a reading function.
The intervals of time between such specification/query cycles can be freely set, in
ple, and primarily depend on the reliability of the bus node ents. These
intervals of time preferably last for several seconds. With a high degree of reliability,
intervals of time of 100 s or longer can also be set.
The control unit 11 carries out this test method with all bus nodes 13 in order and checks
their resonance. That is to say, the digital specification s and the digital response
signals provided by the respective second microprocessors 15 are verified or associated
by the control unit 11. If the specification signals can be associated with the digital
se signals provided, the l unit 11 recognizes that the first microprocessor 14
and the second microprocessor 15 are operating correctly when converting a specification
signal during normal operation.
An open safety element 16 is simulated in a second test. The control unit 11 simulates the
open safety element 16 by specifying a specification signal having an error value
0 mA, 0 mV, 0 Hz or 0% to a ular bus node 13. This digital cation signal
having an error value is converted by the first microprocessor 14 into an analog signal
having an error value. In a next step, the first rocessor 14 applies the analog signal
to the signal line 18 inside the bus node. The second microprocessor 15 measures this
analog signal and spontaneously reports to the control unit 11 in the case of a proper
method of operation. With a positive output, this test guarantees that every opening of a
safety element 16 results in spontaneous transmission of a digital response signal from the
bus node 13 to the control unit 11.
This second test is recurrently carried out in terms of time for each bus node 13. In this
case, the test time is largely ent on the data transmission speed via the bus 12 and
is generally 50 to 100 ms. The frequency of the zero cation test s primarily
on the ility of the second microprocessor 15 used. The more reliable the second
microprocessor 15, the more rarely it must be tested so that safe operation of the elevator
can be ensured.
The specification test with an error value is generally carried out at least once a day.
However, this test can also be repeated in the order of magnitude of minutes or hours.
Fig. 2 shows a second embodiment of the monitoring device 10. This monitoring device
likewise comprises a control unit 11, at least one bus node 13 and a bus 12 which
connects the control unit 11 to a bus node 13. In a manner corresponding to the first
embodiment from fig. 1, the bus node 13 has a first microprocessor 14 and a second
microprocessor 15, which are connected to one another without uption via a signal
line 18 inside the bus node.
Unlike the first example, a contactless safety element 16.1, 16.2 is connected to the
second microprocessor 15 via a signal line 17 outside the bus node. In this case, the
contactless safety t 16.1 , 16.2 comprises, for example, an RFID tag 16.2 and an
RFID reading unit 16.1. The RFID tag 16.2 and the RFID reading unit 16.1 each have an
induction coil. The induction coil in the RFID reading unit is supplied with electrical
2012/064541
_ 10 _
energy and s the induction coil in the RFID tag if a certain distance is undershot. In
this case, the RFID tag 16.2 transmits a digital code value to the RFID reading unit 16.1
via the two induction coils. The RFID reading unit 16.1 reads in this digital code value
and converts this code value into an analog signal having the same code value. The RFID
reading unit 16.1 accordingly applies the analog signal to the signal line 17 outside the
bus node. The second microprocessor 15 measures this analog signal, converts it into a
digital response signal having the code value and provides said response signal for the
control unit 11.
1O The contactless safety element 16.1, 16.2 monitors, for e, the state of a car or shaft
door. As long as such a door is closed, the distance between the RFID tag 16.2 and the
RFID reading unit 16.1 remains sufficiently small to enable the digital code value to be
transmitted. The second microprocessor 15 accordingly es the control unit 11 with
a digital signal having the code value of the RFID tag 16.2 which has been read out. In
contrast, in the case of an open door which constitutes a potential unsafe state of the
elevator installation, the transmission of the code value to the RFID reading unit 16.1 is
interrupted. The RFID reading unit 16.1 therefore does not read a code value or an error
value. Accordingly, the second rocessor 15 also measures a signal having an error
value. In this situation, the second microprocessor 15 spontaneously transmits a digital
signal to the control unit 11.
In this second embodiment of the monitoring device 10 as well, the reliable functionality
of a bus node 13 is checked using two tests.
In a first test, the control unit 11 transmits a digital specification signal having a first code
value to the first microprocessor 14. The first microprocessor l4 converts the
specification signal into an analog signal having the code value and applies said analog
signal to the signal line 18 inside the bus node. The second microprocessor 15 measures
this analog signal and converts it into a digital response signal having the measured code
value. Finally, the second microprocessor 15 provides the digital response signal for the
control unit 11. The control unit 11 s whether the code value of the response signal
corresponds to the code value of the specification signal. If the code value of the response
signal can be ated with the code value of the specification signal, the test is
considered to have been . The code value of the specification signal preferably
_ 11 _
differs from the code value of the RFID tag 16.2.
A second test relates to the simulation of an error value and the ingly spontaneous
on of the second microprocessor 15. In this case, the control unit 11 transmits a
digital specification signal having an error value to the first microprocessor 14. The first
microprocessor l4 ts this specification signal into an analog signal having the error
value and applies this analog signal to the signal line 18 inside the bus node. The second
microprocessor 15 measures the analog signal having the error value and neously
transmits a digital response signal to the control unit 11. The second test is positively
concluded if the control unit 11 verifies the expected spontaneous reaction of the second
microprocessor 15.
The intervals of time at which the control unit 11 transmits specification signals to a bus
node 13 for test purposes can be set in accordance with the first embodiment of the
monitoring device 10.
The two test methods in the second embodiment of the monitoring device 10 are likewise
carried out by the control unit 11 for each bus node 13.
In one particularly preferred alternative, a digital signal which corresponds to the
different values of the specification signal is respectively applied to the signal line 18
inside the bus node in the two ments of the monitoring device 10.
Claims (13)
1. A test method for an elevator installation having a control unit and at least one bus node which has a first microprocessor and a second microprocessor, the control unit and the bus node communicating via a bus, and the first microprocessor and the second microprocessor being connected without interruption via a signal line; having the following steps: the control unit transmits a cation signal to the first microprocessor; the first rocessor transmits the signal to the second microprocessor via the signal line; the second microprocessor provides the signal for the 10 control unit; and the control unit verifies whether the signal provided corresponds to a signal expected by the control unit.
2. The test method as d in claim 1, the signal provided by the second microprocessor being queried by the control unit at als of time.
3. The test method as claimed in claim 2, the interval of time preferably being set between 1 and 100 s.
4. The test method as claimed in any one of the preceding claims, es being 20 taken by the control unit, on the basis of a negative verification of the signal provided, in order to change the elevator installation to a safe operating state.
5. The test method as claimed in any one of the preceding , characterized in that the specification signal is a voltage value, a current value, a frequency value, a 25 switched—on duration value or a code value.
6. The test method as claimed in any one of the preceding claims, characterized in that the signal transmitted from the first microprocessor to the second microprocessor is transmitted via a direct signal line, in particular a signal line inside the bus node.
7. The test method as claimed in any one of the preceding claims, characterized in that at least two cation signals having a different value are transmitted from the control unit to the first microprocessor, and the control unit s whether the signal respectively provided by the second microprocessor corresponds to a signal expected by 35 the control unit.
8. The test method as d in any one of claims 1 to 6, characterized in that a specification signal having an error value is transmitted from the control unit to the first microprocessor, and the control unit verifies whether the second microprocessor spontaneously transmits a signal to the control unit.
9. A monitoring device designed to carry out the test method as claimed in any one of claims 1 to 8, having a control unit and at least one bus node which has a first microprocessor and a second microprocessor, the control unit and the bus node 1O communicating via a bus, and the first microprocessor and the second rocessor being connected without interruption Via a signal line.
10. The monitoring device as claimed in claim 9, the signal line directly connecting the first microprocessor and the second microprocessor.
11. The monitoring device as claimed in claim 9 or claim 10, the signal line being arranged inside the bus node.
12. A test method according to claim 1, ntially as herein described or 20 exemplified.
13. A monitoring device substantially as herein described, with reference to and as shown in the anying drawings.
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP11177268.7 | 2011-08-11 | ||
EP11177268 | 2011-08-11 | ||
EP11194235.5 | 2011-12-19 | ||
EP11194235.5A EP2607286A1 (en) | 2011-12-19 | 2011-12-19 | Test method of an elevator system and a monitoring device for performing the test method |
PCT/EP2012/064541 WO2013020806A1 (en) | 2011-08-11 | 2012-07-24 | Test method for an elevator system and a monitoring device for carrying out the test method |
Publications (2)
Publication Number | Publication Date |
---|---|
NZ620402A NZ620402A (en) | 2014-11-28 |
NZ620402B2 true NZ620402B2 (en) | 2015-03-03 |
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