NO20042724L - System og fremgangsmate for maling av egenskaper i eller under overflaten til et materiale, samt anvendelse av dette - Google Patents

System og fremgangsmate for maling av egenskaper i eller under overflaten til et materiale, samt anvendelse av dette

Info

Publication number
NO20042724L
NO20042724L NO20042724A NO20042724A NO20042724L NO 20042724 L NO20042724 L NO 20042724L NO 20042724 A NO20042724 A NO 20042724A NO 20042724 A NO20042724 A NO 20042724A NO 20042724 L NO20042724 L NO 20042724L
Authority
NO
Norway
Prior art keywords
well
painting properties
painting
properties
Prior art date
Application number
NO20042724A
Other languages
English (en)
Other versions
NO20042724D0 (no
NO322717B1 (no
Inventor
Eiolf Vikhagen
Original Assignee
Optonor As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optonor As filed Critical Optonor As
Priority to NO20042724A priority Critical patent/NO322717B1/no
Publication of NO20042724D0 publication Critical patent/NO20042724D0/no
Priority to PCT/NO2005/000235 priority patent/WO2006001712A2/en
Publication of NO20042724L publication Critical patent/NO20042724L/no
Publication of NO322717B1 publication Critical patent/NO322717B1/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02097—Self-interferometers
    • G01B9/02098—Shearing interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02082—Caused by speckles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433—Modulation spectrometry; Derivative spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/35—Mechanical variable delay line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8472—Investigation of composite materials

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
NO20042724A 2004-06-28 2004-06-28 System og fremgangsmate for maling av egenskaper i eller under overflaten til et materiale, samt anvendelse av dette NO322717B1 (no)

Priority Applications (2)

Application Number Priority Date Filing Date Title
NO20042724A NO322717B1 (no) 2004-06-28 2004-06-28 System og fremgangsmate for maling av egenskaper i eller under overflaten til et materiale, samt anvendelse av dette
PCT/NO2005/000235 WO2006001712A2 (en) 2004-06-28 2005-06-28 Non-destructive testing of materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO20042724A NO322717B1 (no) 2004-06-28 2004-06-28 System og fremgangsmate for maling av egenskaper i eller under overflaten til et materiale, samt anvendelse av dette

Publications (3)

Publication Number Publication Date
NO20042724D0 NO20042724D0 (no) 2004-06-28
NO20042724L true NO20042724L (no) 2005-12-29
NO322717B1 NO322717B1 (no) 2006-12-04

Family

ID=35005972

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20042724A NO322717B1 (no) 2004-06-28 2004-06-28 System og fremgangsmate for maling av egenskaper i eller under overflaten til et materiale, samt anvendelse av dette

Country Status (2)

Country Link
NO (1) NO322717B1 (no)
WO (1) WO2006001712A2 (no)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5637738B2 (ja) * 2010-06-04 2014-12-10 キヤノン株式会社 変形計測装置および変形計測方法
GB2544727A (en) 2015-11-16 2017-05-31 Optonor As Optical interferometry
CN106596556B (zh) * 2016-10-12 2019-04-05 上海大学 一种基于剪切散斑干涉的容器内壁粘接质量无损检测方法
US10337969B2 (en) 2017-06-21 2019-07-02 The Boeing Company High speed vacuum cycling excitation system for optical inspection systems
US10180403B1 (en) * 2017-06-21 2019-01-15 The Boeing Company Shearography for sub microcellular substrate nondestructive inspection
GB2570742B (en) 2018-06-01 2020-10-28 Optonor As Optical-interference analysis
NO20200190A1 (en) 2020-02-14 2021-08-16 Optonor As System and method for analysing an object

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5094528A (en) * 1990-05-25 1992-03-10 Laser Technology, Inc. Apparatus and method for performing electronic shearography
DE19639213A1 (de) * 1996-09-25 1998-03-26 Wolfgang Prof Dr Ing Steinchen Verfahren und Vorrichtung für die Shearing-Speckle-Interferometrie an schwingenden Objekten
US6175411B1 (en) * 1998-02-25 2001-01-16 Bechtel Bwxt Idaho, Llc Apparatus and method for measuring and imaging traveling waves
US6717681B1 (en) * 1999-03-31 2004-04-06 Benjamin A. Bard Portable real-time high-resolution digital phase-stepping shearography with integrated excitation mechanisms

Also Published As

Publication number Publication date
NO20042724D0 (no) 2004-06-28
WO2006001712A2 (en) 2006-01-05
NO322717B1 (no) 2006-12-04
WO2006001712A3 (en) 2006-04-06

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