NO20042724L - System og fremgangsmate for maling av egenskaper i eller under overflaten til et materiale, samt anvendelse av dette - Google Patents
System og fremgangsmate for maling av egenskaper i eller under overflaten til et materiale, samt anvendelse av detteInfo
- Publication number
- NO20042724L NO20042724L NO20042724A NO20042724A NO20042724L NO 20042724 L NO20042724 L NO 20042724L NO 20042724 A NO20042724 A NO 20042724A NO 20042724 A NO20042724 A NO 20042724A NO 20042724 L NO20042724 L NO 20042724L
- Authority
- NO
- Norway
- Prior art keywords
- well
- painting properties
- painting
- properties
- Prior art date
Links
- 238000000034 method Methods 0.000 title 1
- 238000010422 painting Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02097—Self-interferometers
- G01B9/02098—Shearing interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
- G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
- G01B9/02082—Caused by speckles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
- G01J3/433—Modulation spectrometry; Derivative spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
- G01J3/453—Interferometric spectrometry by correlation of the amplitudes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/35—Mechanical variable delay line
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N2021/8472—Investigation of composite materials
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO20042724A NO322717B1 (no) | 2004-06-28 | 2004-06-28 | System og fremgangsmate for maling av egenskaper i eller under overflaten til et materiale, samt anvendelse av dette |
PCT/NO2005/000235 WO2006001712A2 (en) | 2004-06-28 | 2005-06-28 | Non-destructive testing of materials |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO20042724A NO322717B1 (no) | 2004-06-28 | 2004-06-28 | System og fremgangsmate for maling av egenskaper i eller under overflaten til et materiale, samt anvendelse av dette |
Publications (3)
Publication Number | Publication Date |
---|---|
NO20042724D0 NO20042724D0 (no) | 2004-06-28 |
NO20042724L true NO20042724L (no) | 2005-12-29 |
NO322717B1 NO322717B1 (no) | 2006-12-04 |
Family
ID=35005972
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO20042724A NO322717B1 (no) | 2004-06-28 | 2004-06-28 | System og fremgangsmate for maling av egenskaper i eller under overflaten til et materiale, samt anvendelse av dette |
Country Status (2)
Country | Link |
---|---|
NO (1) | NO322717B1 (no) |
WO (1) | WO2006001712A2 (no) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5637738B2 (ja) * | 2010-06-04 | 2014-12-10 | キヤノン株式会社 | 変形計測装置および変形計測方法 |
GB2544727A (en) | 2015-11-16 | 2017-05-31 | Optonor As | Optical interferometry |
CN106596556B (zh) * | 2016-10-12 | 2019-04-05 | 上海大学 | 一种基于剪切散斑干涉的容器内壁粘接质量无损检测方法 |
US10337969B2 (en) | 2017-06-21 | 2019-07-02 | The Boeing Company | High speed vacuum cycling excitation system for optical inspection systems |
US10180403B1 (en) * | 2017-06-21 | 2019-01-15 | The Boeing Company | Shearography for sub microcellular substrate nondestructive inspection |
GB2570742B (en) | 2018-06-01 | 2020-10-28 | Optonor As | Optical-interference analysis |
NO20200190A1 (en) | 2020-02-14 | 2021-08-16 | Optonor As | System and method for analysing an object |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5094528A (en) * | 1990-05-25 | 1992-03-10 | Laser Technology, Inc. | Apparatus and method for performing electronic shearography |
DE19639213A1 (de) * | 1996-09-25 | 1998-03-26 | Wolfgang Prof Dr Ing Steinchen | Verfahren und Vorrichtung für die Shearing-Speckle-Interferometrie an schwingenden Objekten |
US6175411B1 (en) * | 1998-02-25 | 2001-01-16 | Bechtel Bwxt Idaho, Llc | Apparatus and method for measuring and imaging traveling waves |
US6717681B1 (en) * | 1999-03-31 | 2004-04-06 | Benjamin A. Bard | Portable real-time high-resolution digital phase-stepping shearography with integrated excitation mechanisms |
-
2004
- 2004-06-28 NO NO20042724A patent/NO322717B1/no unknown
-
2005
- 2005-06-28 WO PCT/NO2005/000235 patent/WO2006001712A2/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
NO20042724D0 (no) | 2004-06-28 |
WO2006001712A2 (en) | 2006-01-05 |
NO322717B1 (no) | 2006-12-04 |
WO2006001712A3 (en) | 2006-04-06 |
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