NO125554B - - Google Patents
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- Publication number
- NO125554B NO125554B NO2327/70A NO232770A NO125554B NO 125554 B NO125554 B NO 125554B NO 2327/70 A NO2327/70 A NO 2327/70A NO 232770 A NO232770 A NO 232770A NO 125554 B NO125554 B NO 125554B
- Authority
- NO
- Norway
- Prior art keywords
- interferometer
- light
- bundles
- detector
- contrast
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 claims description 20
- 238000005215 recombination Methods 0.000 claims description 14
- 230000006798 recombination Effects 0.000 claims description 14
- 238000006073 displacement reaction Methods 0.000 claims description 4
- 230000004913 activation Effects 0.000 claims description 2
- 230000002452 interceptive effect Effects 0.000 claims 1
- 230000003595 spectral effect Effects 0.000 description 6
- 239000003086 colorant Substances 0.000 description 3
- 230000005021 gait Effects 0.000 description 3
- 230000010287 polarization Effects 0.000 description 3
- 238000000576 coating method Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910052754 neon Inorganic materials 0.000 description 2
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 206010007134 Candida infections Diseases 0.000 description 1
- 208000007027 Oral Candidiasis Diseases 0.000 description 1
- 241000287411 Turdidae Species 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 201000003984 candidiasis Diseases 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- CPBQJMYROZQQJC-UHFFFAOYSA-N helium neon Chemical compound [He].[Ne] CPBQJMYROZQQJC-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/08—Construction or shape of optical resonators or components thereof
- H01S3/081—Construction or shape of optical resonators or components thereof comprising three or more reflectors
- H01S3/083—Ring lasers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/45—Multiple detectors for detecting interferometer signals
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Optical Transform (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NO2327/70A NO125554B (enrdf_load_stackoverflow) | 1970-06-16 | 1970-06-16 | |
| GB2797071A GB1309378A (en) | 1970-06-16 | 1971-06-15 | Multi-frequency laser interferometers |
| DE19712129899 DE2129899A1 (de) | 1970-06-16 | 1971-06-16 | Mehrfrequenz-Laser-Interferometer |
| SE7107746*[A SE379244B (sv) | 1970-06-16 | 1971-12-17 | Anordning vid interferometer med flerfrekvenslaser med utvidgat metomrade. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NO2327/70A NO125554B (enrdf_load_stackoverflow) | 1970-06-16 | 1970-06-16 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NO125554B true NO125554B (enrdf_load_stackoverflow) | 1972-09-25 |
Family
ID=19878772
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NO2327/70A NO125554B (enrdf_load_stackoverflow) | 1970-06-16 | 1970-06-16 |
Country Status (4)
| Country | Link |
|---|---|
| DE (1) | DE2129899A1 (enrdf_load_stackoverflow) |
| GB (1) | GB1309378A (enrdf_load_stackoverflow) |
| NO (1) | NO125554B (enrdf_load_stackoverflow) |
| SE (1) | SE379244B (enrdf_load_stackoverflow) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1979000506A1 (en) | 1978-01-13 | 1979-08-09 | Nat Res Dev | Interferometer systems |
| US4702603A (en) * | 1985-07-23 | 1987-10-27 | Cmx Systems, Inc. | Optical phase decoder for interferometers |
| DE102005038362A1 (de) * | 2005-08-11 | 2007-02-15 | Prüftechnik Dieter Busch AG | Strahlteiler für optische Meßsysteme zur Bestimmung von Kenngrößen an Werkzeugmaschinen |
| CN108089217B (zh) * | 2017-11-15 | 2023-06-13 | 中国工程物理研究院激光聚变研究中心 | 基于迈克尔逊干涉仪的x射线探测器 |
-
1970
- 1970-06-16 NO NO2327/70A patent/NO125554B/no unknown
-
1971
- 1971-06-15 GB GB2797071A patent/GB1309378A/en not_active Expired
- 1971-06-16 DE DE19712129899 patent/DE2129899A1/de active Pending
- 1971-12-17 SE SE7107746*[A patent/SE379244B/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| DE2129899A1 (de) | 1971-12-23 |
| GB1309378A (en) | 1973-03-07 |
| SE379244B (sv) | 1975-09-29 |
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