NL8200299A - Inrichting voor het werken met fluorescerende x-straling. - Google Patents
Inrichting voor het werken met fluorescerende x-straling. Download PDFInfo
- Publication number
- NL8200299A NL8200299A NL8200299A NL8200299A NL8200299A NL 8200299 A NL8200299 A NL 8200299A NL 8200299 A NL8200299 A NL 8200299A NL 8200299 A NL8200299 A NL 8200299A NL 8200299 A NL8200299 A NL 8200299A
- Authority
- NL
- Netherlands
- Prior art keywords
- radiation
- sample
- fluorescent
- collimator
- reflective plate
- Prior art date
Links
- 230000005855 radiation Effects 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 3
- 238000006073 displacement reaction Methods 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1981014677U JPS57129156U (is") | 1981-02-04 | 1981-02-04 | |
| JP1467781 | 1981-02-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL8200299A true NL8200299A (nl) | 1982-09-01 |
Family
ID=11867841
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL8200299A NL8200299A (nl) | 1981-02-04 | 1982-01-27 | Inrichting voor het werken met fluorescerende x-straling. |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4461017A (is") |
| JP (1) | JPS57129156U (is") |
| CA (1) | CA1194619A (is") |
| DE (1) | DE3203747C2 (is") |
| FR (1) | FR2499245B1 (is") |
| GB (1) | GB2095960B (is") |
| NL (1) | NL8200299A (is") |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3239379A1 (de) * | 1982-10-23 | 1984-04-26 | Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen | Vorrichtung zum messen der dicke duenner schichten |
| US4599741A (en) * | 1983-11-04 | 1986-07-08 | USC--Dept. of Materials Science | System for local X-ray excitation by monochromatic X-rays |
| US4979199A (en) * | 1989-10-31 | 1990-12-18 | General Electric Company | Microfocus X-ray tube with optical spot size sensing means |
| US5115457A (en) * | 1990-10-01 | 1992-05-19 | E. I. Du Pont De Nemours And Company | Method of determining titanium dioxide content in paint |
| RU2122725C1 (ru) * | 1996-04-22 | 1998-11-27 | Войсковая часть 75360 | Рентгеновский флюороскоп |
| RU2168166C2 (ru) * | 1998-03-30 | 2001-05-27 | Войсковая часть 75360 | Рентгенооптический эндоскоп |
| JP3996821B2 (ja) * | 2002-03-27 | 2007-10-24 | 株式会社堀場製作所 | Ｘ線分析装置 |
| US7593509B2 (en) * | 2007-09-27 | 2009-09-22 | Varian Medical Systems, Inc. | Analytical x-ray tube for close coupled sample analysis |
| DE102013102270A1 (de) * | 2013-03-07 | 2014-09-11 | Helmut Fischer GmbH Institut für Elektronik und Messtechnik | Optischer Spiegel, Röntgenfluoreszenzanalysegerät und Verfahren zur Röntgenfluoreszenzanalyse |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1976179A (en) * | 1930-04-28 | 1934-10-09 | Mannl Rudolf | Adjusting device for x-ray tubes |
| US2474421A (en) * | 1948-02-19 | 1949-06-28 | F R Machine Works | X-ray equipment |
| US2991362A (en) * | 1959-03-27 | 1961-07-04 | Ontario Research Foundation | Means and method for X-ray spectrometry |
| NL297262A (is") * | 1962-09-04 | |||
| US3921001A (en) * | 1972-08-21 | 1975-11-18 | Medinova Ab Of Sweden | Screening or aperture device for an x-ray apparatus |
| US3767931A (en) * | 1972-11-14 | 1973-10-23 | Varian Associates | Adjustable x-ray beam collimator with shutter for illumination of the radiation pattern |
| US4178513A (en) * | 1978-01-17 | 1979-12-11 | Nuclear Semiconductor | Art object analyzer |
-
1981
- 1981-02-04 JP JP1981014677U patent/JPS57129156U/ja active Pending
-
1982
- 1982-01-22 GB GB8201847A patent/GB2095960B/en not_active Expired
- 1982-01-27 NL NL8200299A patent/NL8200299A/nl not_active Application Discontinuation
- 1982-01-27 US US06/343,199 patent/US4461017A/en not_active Expired - Lifetime
- 1982-02-01 FR FR8201552A patent/FR2499245B1/fr not_active Expired
- 1982-02-04 CA CA000395561A patent/CA1194619A/en not_active Expired
- 1982-02-04 DE DE3203747A patent/DE3203747C2/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE3203747C2 (de) | 1986-06-05 |
| FR2499245B1 (fr) | 1985-12-13 |
| FR2499245A1 (fr) | 1982-08-06 |
| DE3203747A1 (de) | 1982-09-02 |
| GB2095960B (en) | 1985-07-03 |
| US4461017A (en) | 1984-07-17 |
| JPS57129156U (is") | 1982-08-12 |
| GB2095960A (en) | 1982-10-06 |
| CA1194619A (en) | 1985-10-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| BA | A request for search or an international-type search has been filed | ||
| A85 | Still pending on 85-01-01 | ||
| BB | A search report has been drawn up | ||
| BV | The patent application has lapsed |