NL7709847A - PROCEDURE FOR DISPLAYING IN IMAGE FORM OF A DEFLECTION IMAGE IN A IRRADIATION PARTICLE-BEAM MICROSCOPE WITH A GRID. - Google Patents

PROCEDURE FOR DISPLAYING IN IMAGE FORM OF A DEFLECTION IMAGE IN A IRRADIATION PARTICLE-BEAM MICROSCOPE WITH A GRID.

Info

Publication number
NL7709847A
NL7709847A NL7709847A NL7709847A NL7709847A NL 7709847 A NL7709847 A NL 7709847A NL 7709847 A NL7709847 A NL 7709847A NL 7709847 A NL7709847 A NL 7709847A NL 7709847 A NL7709847 A NL 7709847A
Authority
NL
Netherlands
Prior art keywords
image
grid
displaying
procedure
beam microscope
Prior art date
Application number
NL7709847A
Other languages
Dutch (nl)
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of NL7709847A publication Critical patent/NL7709847A/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/295—Electron or ion diffraction tubes
    • H01J37/2955—Electron or ion diffraction tubes using scanning ray

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL7709847A 1976-09-23 1977-09-07 PROCEDURE FOR DISPLAYING IN IMAGE FORM OF A DEFLECTION IMAGE IN A IRRADIATION PARTICLE-BEAM MICROSCOPE WITH A GRID. NL7709847A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19762643199 DE2643199B2 (en) 1976-09-23 1976-09-23 Method for the pictorial representation of a diffraction image in a transmission scanning particle beam microscope

Publications (1)

Publication Number Publication Date
NL7709847A true NL7709847A (en) 1978-03-29

Family

ID=5988814

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7709847A NL7709847A (en) 1976-09-23 1977-09-07 PROCEDURE FOR DISPLAYING IN IMAGE FORM OF A DEFLECTION IMAGE IN A IRRADIATION PARTICLE-BEAM MICROSCOPE WITH A GRID.

Country Status (4)

Country Link
JP (1) JPS5339848A (en)
DE (1) DE2643199B2 (en)
FR (1) FR2365879A1 (en)
NL (1) NL7709847A (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5613428A (en) * 1979-07-09 1981-02-09 Daido Steel Co Ltd Burning method in direct flame nonoxidizing heating furnace
JPS5633423A (en) * 1979-08-25 1981-04-03 Toyo Rokougiyou Kk Combustion apparatus for atmosphere of continuous nonoxidation heat treating furnace
JPS6014739A (en) * 1983-07-06 1985-01-25 Jeol Ltd Electron beam diffraction apparatus
JPS6080655U (en) * 1983-11-08 1985-06-04 日本電子株式会社 Electron microscope shutter device
JPS60105150A (en) * 1983-11-11 1985-06-10 Jeol Ltd Electron microscope
JPS61101954U (en) * 1984-12-11 1986-06-28
US4799900A (en) * 1987-10-15 1989-01-24 Amp Incorporated Push on right angle connector
JP2596235B2 (en) * 1991-03-04 1997-04-02 日本鋼管株式会社 Operating method of batch heating furnace
JP2776183B2 (en) * 1993-01-14 1998-07-16 住友金属工業株式会社 Combustion control method for steel heating furnace
EP3125272A1 (en) * 2015-07-29 2017-02-01 FEI Company Scan pattern in a charged particle microscope comprising nested orbital windings

Also Published As

Publication number Publication date
FR2365879A1 (en) 1978-04-21
JPS5339848A (en) 1978-04-12
DE2643199B2 (en) 1978-07-13
DE2643199A1 (en) 1978-03-30

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Legal Events

Date Code Title Description
BV The patent application has lapsed