NL7605956A - Met corpusculaire stralen werkende rastermi- croscoop. - Google Patents
Met corpusculaire stralen werkende rastermi- croscoop.Info
- Publication number
- NL7605956A NL7605956A NL7605956A NL7605956A NL7605956A NL 7605956 A NL7605956 A NL 7605956A NL 7605956 A NL7605956 A NL 7605956A NL 7605956 A NL7605956 A NL 7605956A NL 7605956 A NL7605956 A NL 7605956A
- Authority
- NL
- Netherlands
- Prior art keywords
- mixer working
- corpuscular rays
- grid mixer
- grid
- corpuscular
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/10—Lenses
- H01J37/14—Lenses magnetic
- H01J37/141—Electromagnetic lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19752541245 DE2541245A1 (de) | 1975-09-12 | 1975-09-12 | Korpuskularstrahl-rastermikroskop |
Publications (1)
Publication Number | Publication Date |
---|---|
NL7605956A true NL7605956A (nl) | 1977-03-15 |
Family
ID=5956594
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL7605956A NL7605956A (nl) | 1975-09-12 | 1976-06-02 | Met corpusculaire stralen werkende rastermi- croscoop. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4097739A (nl) |
JP (1) | JPS5235977A (nl) |
DE (1) | DE2541245A1 (nl) |
GB (1) | GB1557800A (nl) |
NL (1) | NL7605956A (nl) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5412211A (en) * | 1993-07-30 | 1995-05-02 | Electroscan Corporation | Environmental scanning electron microscope |
JP3785458B2 (ja) * | 2002-11-20 | 2006-06-14 | 国立大学法人名古屋大学 | 透過型電子顕微鏡及び立体観察法 |
WO2012014870A1 (ja) * | 2010-07-27 | 2012-02-02 | 株式会社日立ハイテクノロジーズ | 収差補正装置およびそれを用いた荷電粒子線装置 |
JP6718782B2 (ja) * | 2016-09-21 | 2020-07-08 | 日本電子株式会社 | 対物レンズおよび透過電子顕微鏡 |
US10557793B1 (en) | 2017-08-16 | 2020-02-11 | United States Of America As Represented By The Secretary Of The Air Force | Scanning microscope using a probe beam deflection technique (PBDT) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3188465A (en) * | 1959-12-29 | 1965-06-08 | Kabushikikaisha Nihondenshi Ka | Two stage electron beam magnification device comprising plural adjustable magnetic lens system |
GB1238889A (nl) * | 1968-11-26 | 1971-07-14 | ||
DE2213208C3 (de) * | 1972-03-16 | 1975-11-13 | Max Planck Gesellschaft | Rotationssymetrisches, sphärisch korrigiertes korpuskularstrahloptisches Abbildungssystem |
-
1975
- 1975-09-12 DE DE19752541245 patent/DE2541245A1/de active Pending
-
1976
- 1976-06-02 NL NL7605956A patent/NL7605956A/nl not_active Application Discontinuation
- 1976-08-25 GB GB35275/76A patent/GB1557800A/en not_active Expired
- 1976-08-31 US US05/719,111 patent/US4097739A/en not_active Expired - Lifetime
- 1976-09-06 JP JP51106582A patent/JPS5235977A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
US4097739A (en) | 1978-06-27 |
JPS5235977A (en) | 1977-03-18 |
GB1557800A (en) | 1979-12-12 |
DE2541245A1 (de) | 1977-03-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
BV | The patent application has lapsed |