NL73366C - Inrichting voor het onderzoek van kristalstructuren met behulp van röntgenstralen. - Google Patents

Inrichting voor het onderzoek van kristalstructuren met behulp van röntgenstralen.

Info

Publication number
NL73366C
NL73366C NL133993A NL133993A NL73366C NL 73366 C NL73366 C NL 73366C NL 133993 A NL133993 A NL 133993A NL 133993 A NL133993 A NL 133993A NL 73366 C NL73366 C NL 73366C
Authority
NL
Netherlands
Prior art keywords
investigation
rays
crystal structures
crystal
structures
Prior art date
Application number
NL133993A
Other languages
English (en)
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Application granted granted Critical
Publication of NL73366C publication Critical patent/NL73366C/nl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL133993A 1945-07-14 1947-08-08 Inrichting voor het onderzoek van kristalstructuren met behulp van röntgenstralen. NL73366C (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US605162A US2474835A (en) 1945-07-14 1945-07-14 X-ray spectrometer

Publications (1)

Publication Number Publication Date
NL73366C true NL73366C (nl) 1953-10-15

Family

ID=24422513

Family Applications (1)

Application Number Title Priority Date Filing Date
NL133993A NL73366C (nl) 1945-07-14 1947-08-08 Inrichting voor het onderzoek van kristalstructuren met behulp van röntgenstralen.

Country Status (5)

Country Link
US (1) US2474835A (nl)
CH (1) CH258972A (nl)
FR (1) FR951832A (nl)
GB (1) GB637744A (nl)
NL (1) NL73366C (nl)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2585740A (en) * 1946-03-02 1952-02-12 Phillips Petroleum Co Fast X-ray diffraction camera
NL74667C (nl) * 1949-04-19
US2532810A (en) * 1950-01-13 1950-12-05 Gen Electric X-ray diffraction apparatus for use with radioactive materials
US2610301A (en) * 1951-03-27 1952-09-09 Gen Electric X-ray photometer
US2648011A (en) * 1951-08-16 1953-08-04 Good James Nathan Apparatus for electronic spectrometric analysis of back-reflection diffraction
US2805343A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
US2805341A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
US2881327A (en) * 1955-10-14 1959-04-07 Philips Corp Method and apparatus for making x-ray measurements
US3005098A (en) * 1958-03-31 1961-10-17 Gen Electric X-ray emission analysis
DE1210585B (de) * 1960-02-29 1966-02-10 Picker X Ray Corp Waite Mfg Di Roentgenspektralapparat, bestehend aus zwei mit der Strahlung einer gemeinsamen Roentgenroehre betriebenen gleichartigen Spektrometern

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1589833A (en) * 1923-12-21 1926-06-22 Behnken Hermann Measuring device for the examination of electromagnetic waves
US2025488A (en) * 1933-03-29 1935-12-24 Yap Chu-Phay X-ray diffraction apparatus
US2145686A (en) * 1935-07-15 1939-01-31 Dessauer Friedrich Arrangement for the execution of deep x-ray therapy
US2383764A (en) * 1943-09-10 1945-08-28 Bell Telephone Labor Inc Apparatus for x-ray analysis

Also Published As

Publication number Publication date
US2474835A (en) 1949-07-05
FR951832A (fr) 1949-11-04
GB637744A (en) 1950-05-24
CH258972A (de) 1949-06-01

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