NL6716628A - - Google Patents

Info

Publication number
NL6716628A
NL6716628A NL6716628A NL6716628A NL6716628A NL 6716628 A NL6716628 A NL 6716628A NL 6716628 A NL6716628 A NL 6716628A NL 6716628 A NL6716628 A NL 6716628A NL 6716628 A NL6716628 A NL 6716628A
Authority
NL
Netherlands
Application number
NL6716628A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to NL6716628A priority Critical patent/NL6716628A/xx
Priority to DE1810665A priority patent/DE1810665C3/de
Priority to SE7315761*3A priority patent/SE385521B/xx
Priority to SE16606/68A priority patent/SE365899B/xx
Priority to BR204576/68A priority patent/BR6804576D0/pt
Priority to CH1811168A priority patent/CH492300A/de
Priority to GB57568/68A priority patent/GB1246152A/en
Priority to BE725007D priority patent/BE725007A/xx
Priority to FR1595948D priority patent/FR1595948A/fr
Priority to US794039*A priority patent/US3629578A/en
Publication of NL6716628A publication Critical patent/NL6716628A/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/70—Arrangements for deflecting ray or beam
    • H01J29/72—Arrangements for deflecting ray or beam along one straight line or along two perpendicular straight lines
    • H01J29/76—Deflecting by magnetic fields only
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/10—Lenses
    • H01J37/14—Lenses magnetic
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/29—Reflection microscopes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Particle Accelerators (AREA)
NL6716628A 1967-12-07 1967-12-07 NL6716628A (fr)

Priority Applications (10)

Application Number Priority Date Filing Date Title
NL6716628A NL6716628A (fr) 1967-12-07 1967-12-07
DE1810665A DE1810665C3 (de) 1967-12-07 1968-11-23 Magnetisches Ablenksystem für einen Ladungsträgerstrahl und Anwendungen hiervon
SE7315761*3A SE385521B (sv) 1967-12-07 1968-12-04 Elektronoptisk apparat med en magnetisk avbojningsanordning
SE16606/68A SE365899B (fr) 1967-12-07 1968-12-04
BR204576/68A BR6804576D0 (pt) 1967-12-07 1968-12-04 Dispositivo tendo um feixe de portadores de carga e compreendendo um sistema magnetico defletindo o dito feixe
CH1811168A CH492300A (de) 1967-12-07 1968-12-04 Vorrichtung mit einem Ladungsträger-Strahlbündel und einem dieses Bündel ablenkenden magnetischen Ablenksystem
GB57568/68A GB1246152A (en) 1967-12-07 1968-12-04 Magnetic deflection apparatus
BE725007D BE725007A (fr) 1967-12-07 1968-12-05
FR1595948D FR1595948A (fr) 1967-12-07 1968-12-06
US794039*A US3629578A (en) 1967-12-07 1969-01-27 Magnetic deflection system for electron analysis devices

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL6716628A NL6716628A (fr) 1967-12-07 1967-12-07
US79403969A 1969-01-27 1969-01-27

Publications (1)

Publication Number Publication Date
NL6716628A true NL6716628A (fr) 1969-06-10

Family

ID=26644272

Family Applications (1)

Application Number Title Priority Date Filing Date
NL6716628A NL6716628A (fr) 1967-12-07 1967-12-07

Country Status (7)

Country Link
US (1) US3629578A (fr)
BE (1) BE725007A (fr)
CH (1) CH492300A (fr)
DE (1) DE1810665C3 (fr)
FR (1) FR1595948A (fr)
GB (1) GB1246152A (fr)
NL (1) NL6716628A (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1395201A (en) * 1972-09-04 1975-05-21 Nat Res Dev Magnetic lenses
US4075496A (en) * 1976-07-07 1978-02-21 Sumitomo Electric Industries, Ltd. Charged particle irradiation apparatus
JPS5367099A (en) * 1976-11-26 1978-06-15 Toshiba Corp Electron beam shape accelerator
FR2396392A1 (fr) * 1977-07-01 1979-01-26 Cgr Mev Dispositif d'irradiation bi-face d'une cible au moyen d'un accelerateur de particules chargees
US4381453A (en) * 1980-12-31 1983-04-26 International Business Machines Corporation System and method for deflecting and focusing a broad ion beam
US6184524B1 (en) 1996-08-07 2001-02-06 Gatan, Inc. Automated set up of an energy filtering transmission electron microscope
US5798524A (en) * 1996-08-07 1998-08-25 Gatan, Inc. Automated adjustment of an energy filtering transmission electron microscope
JP2978873B2 (ja) * 1997-05-09 1999-11-15 株式会社日立製作所 電磁石及び加速器、並びに加速器システム
JP2002221504A (ja) * 2001-01-26 2002-08-09 Hitachi Ltd Ｘ線検出装置および荷電粒子線装置
US9697984B2 (en) 2015-10-28 2017-07-04 Thermo Electron Scientific Instruments Llc Charged particle filter
GB201910880D0 (en) 2019-07-30 2019-09-11 Vg Systems Ltd A spectroscopy and imaging system
CN112439131B (zh) * 2019-08-27 2023-04-07 胡逸民 X-射线笔形束扫描调强治疗直线加速器装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR979098A (fr) * 1948-11-26 1951-04-23 Perfectionnement aux lentilles et aux systèmes optiques électroniques ou corpusculaires
US3287558A (en) * 1961-09-08 1966-11-22 High Voltage Engineering Corp Charged particle deflecting device consisting of sequentially positioned uniform and non-uniform magnetic field sectors
US3229087A (en) * 1961-09-25 1966-01-11 First Pennsylvania Banking And Electron microanalyzer and monitoring system
US3243667A (en) * 1962-04-09 1966-03-29 High Voltage Engineering Corp Non dispersive magnetic deflection apparatus and method
US3225192A (en) * 1962-12-28 1965-12-21 Hitachi Ltd Apparatus for producing electron microscope and diffraction images separately and simultaneously on the image plane
DE1257282B (de) * 1964-01-22 1967-12-28 Siemens Ag Magnetanordnung mit aus Blechen geschichteten Polteilen, die einen Luftspalt mit in seiner Laengsrichtung zunehmender lichter Weite einschliessen

Also Published As

Publication number Publication date
CH492300A (de) 1970-06-15
GB1246152A (en) 1971-09-15
FR1595948A (fr) 1970-06-15
US3629578A (en) 1971-12-21
DE1810665C3 (de) 1978-11-23
DE1810665A1 (de) 1969-07-17
DE1810665B2 (de) 1978-03-23
BE725007A (fr) 1969-06-05

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