NL6611314A - - Google Patents
Info
- Publication number
- NL6611314A NL6611314A NL6611314A NL6611314A NL6611314A NL 6611314 A NL6611314 A NL 6611314A NL 6611314 A NL6611314 A NL 6611314A NL 6611314 A NL6611314 A NL 6611314A NL 6611314 A NL6611314 A NL 6611314A
- Authority
- NL
- Netherlands
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16H—GEARING
- F16H35/00—Gearings or mechanisms with other special functional features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mechanical Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US47890265A | 1965-08-11 | 1965-08-11 | |
| DE19691908061 DE1908061A1 (de) | 1965-08-11 | 1969-02-18 | Vorrichtung zum Hin- und Herverschieben eines Gegenstandes auf einer gegebenen Achse |
| GB00557/69A GB1247797A (en) | 1965-08-11 | 1969-02-27 | A device for reciprocating an article along a given axis |
| FR6911574A FR2040836A5 (US08124317-20120228-C00026.png) | 1965-08-11 | 1969-04-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL6611314A true NL6611314A (US08124317-20120228-C00026.png) | 1967-02-13 |
Family
ID=27430853
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL6611314A NL6611314A (US08124317-20120228-C00026.png) | 1965-08-11 | 1966-08-11 |
Country Status (6)
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IT1113297B (it) * | 1978-01-30 | 1986-01-20 | Texas Instruments Inc | Sistema e procedimento per collaudare circuiti integrati |
| US4219771A (en) * | 1978-02-21 | 1980-08-26 | Texas Instruments Incorporated | Four-quadrant, multiprobe-edge sensor for semiconductor wafer probing |
| US4201939A (en) * | 1978-06-26 | 1980-05-06 | Texas Instruments Incorporated | Multiprobe contact monitor and control system |
| US4888550A (en) * | 1981-09-14 | 1989-12-19 | Texas Instruments Incorporated | Intelligent multiprobe tip |
| US4414438A (en) * | 1982-06-04 | 1983-11-08 | International Jensen Incorporated | Video game controller |
| US4749942A (en) * | 1985-09-26 | 1988-06-07 | Tektronix, Inc. | Wafer probe head |
| IL79820A0 (en) * | 1985-09-26 | 1986-11-30 | Tektronix Inc | Wafer probe head,and method of assembling same |
| US4904933A (en) * | 1986-09-08 | 1990-02-27 | Tektronix, Inc. | Integrated circuit probe station |
| US5036271A (en) * | 1990-05-23 | 1991-07-30 | Solid State Measurements, Inc. | Apparatus for characterization of electrical properties of a semiconductor body |
| KR0138754B1 (ko) * | 1990-08-06 | 1998-06-15 | 이노우에 아키라 | 전기회로측정용 탐침의 접촉검지장치 및 이 접촉검지장치를 이용한 전기회로 측정장치 |
| JPH08201478A (ja) * | 1995-01-27 | 1996-08-09 | Advantest Corp | 半導体試験装置の複合テストシステム |
| US5557214A (en) * | 1995-02-06 | 1996-09-17 | Barnett; C. Kenneth | Micro beam probe semiconductor test interface |
| US5635848A (en) * | 1995-03-10 | 1997-06-03 | International Business Machines Corporation | Method and system for controlling high-speed probe actuators |
| US5532611A (en) * | 1995-05-26 | 1996-07-02 | International Business Machines Corporation | Miniature probe positioning actuator |
| US5804982A (en) * | 1995-05-26 | 1998-09-08 | International Business Machines Corporation | Miniature probe positioning actuator |
| JP4490521B2 (ja) * | 1999-01-29 | 2010-06-30 | 東京エレクトロン株式会社 | 回転駆動機構及び被検査体の載置機構並びに検査装置 |
| SE524092C2 (sv) | 2002-10-28 | 2004-06-22 | Billy Palmius | Ett schabrak för placering mellan sadel och ett djur som skall ridas |
| CN113848461B (zh) * | 2021-10-26 | 2024-07-30 | 中国电子科技集团公司第五十五研究所 | 一种载片测试装置及使用方法 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2330801A (en) * | 1939-12-26 | 1943-10-05 | Physicists Res Company | Tracer mechanism for investigating surface irregularities |
| US2345022A (en) * | 1940-02-29 | 1944-03-28 | Donald E Williamson | Tracer mechanism |
| US2621224A (en) * | 1949-10-08 | 1952-12-09 | Physicists Res Company | Mechanical-electrical displacement converter |
| US2703007A (en) * | 1952-03-15 | 1955-03-01 | Gen Motors Corp | Surface smoothness gauge |
| US3074175A (en) * | 1960-03-14 | 1963-01-22 | Ryan Aeronautical Co | Displacement transducer |
| DE1250135B (US08124317-20120228-C00026.png) * | 1963-04-01 | 1967-09-14 | ||
| DE1274804B (de) * | 1963-07-08 | 1968-08-08 | Siemens Ag | Torsionsstab zur Umwandlung eines Drehwinkels in einen elektrischen Wert nach dem Dehnungswiderstandsprinzip |
| US3212325A (en) * | 1963-07-30 | 1965-10-19 | Katz Lester | Force measuring instrument |
| FR1375135A (fr) * | 1963-08-09 | 1964-10-16 | Realisations D Installations D | Potentiomètre à jauges à fils résistants |
-
1965
- 1965-08-11 US US478902A patent/US3446065A/en not_active Expired - Lifetime
-
1966
- 1966-08-10 CH CH1150366A patent/CH476313A/de not_active IP Right Cessation
- 1966-08-11 NL NL6611314A patent/NL6611314A/xx unknown
-
1969
- 1969-02-18 DE DE19691908061 patent/DE1908061A1/de active Pending
- 1969-02-27 GB GB00557/69A patent/GB1247797A/en not_active Expired
- 1969-04-15 FR FR6911574A patent/FR2040836A5/fr not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| CH476313A (de) | 1969-07-31 |
| GB1247797A (en) | 1971-09-29 |
| DE1908061A1 (de) | 1970-09-03 |
| FR2040836A5 (US08124317-20120228-C00026.png) | 1971-01-22 |
| US3446065A (en) | 1969-05-27 |
