NL6511452A - - Google Patents
Info
- Publication number
- NL6511452A NL6511452A NL6511452A NL6511452A NL6511452A NL 6511452 A NL6511452 A NL 6511452A NL 6511452 A NL6511452 A NL 6511452A NL 6511452 A NL6511452 A NL 6511452A NL 6511452 A NL6511452 A NL 6511452A
- Authority
- NL
- Netherlands
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR989619A FR1435801A (fr) | 1964-09-28 | 1964-09-28 | Distributeur automatique de porte-échantillons pour spectromètre à fluorescence chi |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL6511452A true NL6511452A (de) | 1966-03-29 |
Family
ID=8839254
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL6511452A NL6511452A (de) | 1964-09-28 | 1965-09-02 |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US3415987A (de) |
| AT (1) | AT261268B (de) |
| BE (1) | BE668106A (de) |
| CH (1) | CH445156A (de) |
| DE (1) | DE1623007C3 (de) |
| FR (1) | FR1435801A (de) |
| GB (1) | GB1098040A (de) |
| LU (1) | LU49317A1 (de) |
| NL (1) | NL6511452A (de) |
| OA (1) | OA02029A (de) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| LU54494A1 (de) * | 1967-09-18 | 1969-06-24 | ||
| US3527942A (en) * | 1967-11-09 | 1970-09-08 | Atlantic Richfield Co | Automatic sample changer for positioning a plurality of pellets in an x-ray analyzer |
| US3624394A (en) * | 1969-05-02 | 1971-11-30 | Atlantic Richfield Co | Automatic sample changer for x-ray fluorescence spectrometer |
| CN106658930B (zh) * | 2017-01-23 | 2018-04-10 | 中国工程物理研究院激光聚变研究中心 | 可调x射线源 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3047124A (en) * | 1960-05-05 | 1962-07-31 | Mandell S Wexler | Examining apparatus |
| US3263079A (en) * | 1962-11-26 | 1966-07-26 | Block Engineering | Method for forming an image of an invisible radiation pattern and apparatus for copying the image |
| US3342992A (en) * | 1964-06-30 | 1967-09-19 | Zeiss Jena Veb Carl | Sample changing devices for electron microscopes and electron diffraction apparatus |
-
0
- BE BE668106D patent/BE668106A/xx unknown
-
1964
- 1964-09-28 FR FR989619A patent/FR1435801A/fr not_active Expired
-
1965
- 1965-08-12 LU LU49317A patent/LU49317A1/xx unknown
- 1965-08-12 CH CH1132165A patent/CH445156A/fr unknown
- 1965-08-16 GB GB34972/65A patent/GB1098040A/en not_active Expired
- 1965-09-02 NL NL6511452A patent/NL6511452A/xx unknown
- 1965-09-03 OA OA52176A patent/OA02029A/xx unknown
- 1965-09-07 DE DE1623007A patent/DE1623007C3/de not_active Expired
- 1965-09-07 US US485212A patent/US3415987A/en not_active Expired - Lifetime
- 1965-09-10 AT AT831065A patent/AT261268B/de active
Also Published As
| Publication number | Publication date |
|---|---|
| GB1098040A (en) | 1968-01-03 |
| CH445156A (fr) | 1967-10-15 |
| US3415987A (en) | 1968-12-10 |
| DE1623007B2 (de) | 1974-08-08 |
| OA02029A (fr) | 1970-05-05 |
| DE1623007A1 (de) | 1972-02-24 |
| DE1623007C3 (de) | 1975-03-20 |
| FR1435801A (fr) | 1966-04-22 |
| LU49317A1 (de) | 1965-10-12 |
| AT261268B (de) | 1968-04-10 |
| BE668106A (de) |