NL55969C - - Google Patents
Info
- Publication number
- NL55969C NL55969C NL55969DA NL55969C NL 55969 C NL55969 C NL 55969C NL 55969D A NL55969D A NL 55969DA NL 55969 C NL55969 C NL 55969C
- Authority
- NL
- Netherlands
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/91—Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Chemical Treatment Of Metals (AREA)
- Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE224242X | 1940-11-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL55969C true NL55969C (fr) |
Family
ID=5854864
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL55969D NL55969C (fr) | 1940-11-06 |
Country Status (2)
| Country | Link |
|---|---|
| CH (1) | CH224242A (fr) |
| NL (1) | NL55969C (fr) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2636127A (en) * | 1949-03-14 | 1953-04-21 | Magnaflux Corp | Method of detecting cracks in porous surfaces |
| US2667070A (en) * | 1949-03-26 | 1954-01-26 | Northrop Aircraft Inc | Dye solution flaw inspection method |
| US2839918A (en) * | 1949-04-06 | 1958-06-24 | Robert C Switzer | Flaw detection |
| DE1109918B (de) * | 1955-02-01 | 1961-06-29 | Siemens Ag | Verfahren zum Sichtbarmachen von bis zur Oberflaeche durchgehenden Rissen oder Spalten in Metallstuecken |
| US2959471A (en) * | 1957-12-04 | 1960-11-08 | United Aircraft Corp | Acid etch inspection process |
| US4665738A (en) * | 1985-09-12 | 1987-05-19 | United Technologies Automotive, Inc. | Accelerated solvent resistivity test |
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0
- NL NL55969D patent/NL55969C/xx active
-
1941
- 1941-09-30 CH CH224242D patent/CH224242A/de unknown
Also Published As
| Publication number | Publication date |
|---|---|
| CH224242A (de) | 1942-11-15 |