NL53538C - - Google Patents
Info
- Publication number
- NL53538C NL53538C NL53538DA NL53538C NL 53538 C NL53538 C NL 53538C NL 53538D A NL53538D A NL 53538DA NL 53538 C NL53538 C NL 53538C
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2257774X | 1937-02-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL53538C true NL53538C (en:Method) |
Family
ID=7992688
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL53538D NL53538C (en:Method) | 1937-02-18 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US2257774A (en:Method) |
| BE (1) | BE426347A (en:Method) |
| FR (1) | FR833491A (en:Method) |
| NL (1) | NL53538C (en:Method) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2418228A (en) * | 1943-10-08 | 1947-04-01 | Rca Corp | Electronic microanalyzer |
| US2418029A (en) * | 1943-10-08 | 1947-03-25 | Rca Corp | Electron probe analysis employing X-ray spectrography |
| US2464229A (en) * | 1943-11-10 | 1949-03-15 | Univ Leland Stanford Junior | High-frequency apparatus and method |
| US2477307A (en) * | 1946-11-09 | 1949-07-26 | Mackta Leo | Combined x-ray and fluoroscopic apparatus |
| US2593925A (en) * | 1948-10-05 | 1952-04-22 | Sheldon Edward Emanuel | Device for color projection of invisible rays |
| US2619598A (en) * | 1949-06-29 | 1952-11-25 | Westinghouse Electric Corp | Electron diffraction detecting system |
| US2727153A (en) * | 1949-06-29 | 1955-12-13 | Westinghouse Electric Corp | Electron diffraction camera |
| US2561988A (en) * | 1949-06-30 | 1951-07-24 | Westinghouse Electric Corp | Electron diffraction detector system |
| US2666890A (en) * | 1950-07-27 | 1954-01-19 | Bendix Aviat Corp | Apparatus for testing geiger tubes |
| US2891166A (en) * | 1954-03-15 | 1959-06-16 | Phillips Petroleum Co | Well logging |
| US2877353A (en) * | 1954-07-14 | 1959-03-10 | Gen Electric | X-ray microscope |
| US2802948A (en) * | 1954-09-22 | 1957-08-13 | Haloid Co | Prevention of ion-caused undercutting in xeroradiography |
| US3013467A (en) * | 1957-11-07 | 1961-12-19 | Minsky Marvin | Microscopy apparatus |
| US3010021A (en) * | 1959-02-24 | 1961-11-21 | William C Roesch | Method for measuring radiation |
| NL271119A (en:Method) * | 1961-07-10 | |||
| US3229087A (en) * | 1961-09-25 | 1966-01-11 | First Pennsylvania Banking And | Electron microanalyzer and monitoring system |
| US3191028A (en) * | 1963-04-22 | 1965-06-22 | Albert V Crewe | Scanning electron microscope |
| NL142277B (nl) * | 1964-06-11 | 1974-05-15 | Philips Nv | Elektronenmicroscoop. |
| US3385967A (en) * | 1967-09-07 | 1968-05-28 | Welch Scient Company | Electron diffraction apparatus for measuring wave length of electrons |
| JPS4833903B1 (en:Method) * | 1969-04-08 | 1973-10-17 | ||
| GB1280013A (en) * | 1969-09-05 | 1972-07-05 | Atomic Energy Authority Uk | Improvements in or relating to apparatus bombarding a target with ions |
-
0
- NL NL53538D patent/NL53538C/xx active
- BE BE426347D patent/BE426347A/xx unknown
-
1938
- 1938-02-11 FR FR833491D patent/FR833491A/fr not_active Expired
- 1938-02-15 US US190629A patent/US2257774A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| FR833491A (fr) | 1938-10-21 |
| US2257774A (en) | 1941-10-07 |
| BE426347A (en:Method) |