NL52570C - - Google Patents
Info
- Publication number
- NL52570C NL52570C NL52570DA NL52570C NL 52570 C NL52570 C NL 52570C NL 52570D A NL52570D A NL 52570DA NL 52570 C NL52570 C NL 52570C
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE517704X | 1937-08-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL52570C true NL52570C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Family
ID=6549657
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL52570D NL52570C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1937-08-17 |
Country Status (5)
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE955537C (de) * | 1942-01-17 | 1957-01-03 | Siemens Ag | Halter fuer Objekttraeger, der in das Innere eines Vakuumraumes eines Korpuskularstrahlapparates, insbesondere eines Elektronenmikroskops, eingebaut ist |
| US2423158A (en) * | 1944-04-19 | 1947-07-01 | Rca Corp | Specimen chamber for electron microscopes |
| US2418317A (en) * | 1944-04-27 | 1947-04-01 | Rca Corp | Electronic gun adjustment |
| US2679018A (en) * | 1950-06-30 | 1954-05-18 | Rca Corp | Magnetic electron lens pole piece |
| US3939353A (en) * | 1972-05-22 | 1976-02-17 | Kabushiki Kaisha Akashi Seisakusho | Electron microscope specimen mounting apparatus |
| EP1526372A3 (en) * | 2004-11-02 | 2005-05-04 | Agilent Technologies, Inc. | Microfluidic system with adjustment for an optical detection |
| CN103730312B (zh) * | 2014-01-09 | 2015-12-02 | 东北大学 | 一种纳米力学测试系统用样品台及其使用方法 |
-
0
- NL NL52570D patent/NL52570C/xx active
- BE BE429638D patent/BE429638A/xx unknown
-
1938
- 1938-08-05 GB GB23222/38A patent/GB517704A/en not_active Expired
- 1938-08-08 FR FR841824D patent/FR841824A/fr not_active Expired
- 1938-08-17 US US225278A patent/US2268539A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US2268539A (en) | 1941-12-30 |
| FR841824A (fr) | 1939-05-31 |
| GB517704A (en) | 1940-02-06 |
| BE429638A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |