NL289910A - - Google Patents

Info

Publication number
NL289910A
NL289910A NL289910DA NL289910A NL 289910 A NL289910 A NL 289910A NL 289910D A NL289910D A NL 289910DA NL 289910 A NL289910 A NL 289910A
Authority
NL
Netherlands
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of NL289910A publication Critical patent/NL289910A/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/82Mounting, supporting, spacing, or insulating electron-optical or ion-optical arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147Arrangements for directing or deflecting the discharge along a desired path
    • H01J37/15External mechanical adjustment of electron or ion optical components
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/16Vessels; Containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002Details
    • H01J37/3005Observing the objects or the point of impact on the object

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
NL289910D 1962-03-08 NL289910A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8940/62A GB1009601A (en) 1962-03-08 1962-03-08 Improvements in electron beam equipment

Publications (1)

Publication Number Publication Date
NL289910A true NL289910A (ja)

Family

ID=9862258

Family Applications (1)

Application Number Title Priority Date Filing Date
NL289910D NL289910A (ja) 1962-03-08

Country Status (5)

Country Link
US (1) US3248542A (ja)
DE (1) DE1253836B (ja)
FR (1) FR1349083A (ja)
GB (1) GB1009601A (ja)
NL (1) NL289910A (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3327114A (en) * 1964-06-23 1967-06-20 Alfred F Diorio Low-angle x-ray diffraction camera comprising releasably connected sections and adjustable beam apertures and stops
US3514596A (en) * 1967-10-17 1970-05-26 Picker Corp Spot filmer for x-ray radiographing which minimizes patient-to-film distance
US3814356A (en) * 1970-10-02 1974-06-04 J Coleman Electron microscope
US3809899A (en) * 1972-08-17 1974-05-07 Tektronix Inc Electron-beam tube including a thermionic-field emission cathode for a scanning electron microscope
US3872305A (en) * 1972-12-06 1975-03-18 Jeol Ltd Convertible scanning electron microscope
DE2702439C3 (de) * 1977-01-19 1980-08-07 Siemens Ag, 1000 Berlin Und 8000 Muenchen Langbrennweitige magnetische Linse zur korpuskularstrahloptischen Abbildung eines großflächigen Objektes
US5362964A (en) * 1993-07-30 1994-11-08 Electroscan Corporation Environmental scanning electron microscope
US5412211A (en) * 1993-07-30 1995-05-02 Electroscan Corporation Environmental scanning electron microscope
US20180182605A1 (en) * 2016-12-22 2018-06-28 Thermo Finnigan Llc Aligning ion optics by aperture sighting

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2319061A (en) * 1941-01-31 1943-05-11 Rca Corp Demountable electron gun
DE892491C (de) * 1941-03-18 1953-10-08 Aeg Zerlegbares mehrstufiges, aus mehreren Teilen bestehendes UEbermikroskop
US2405306A (en) * 1944-01-31 1946-08-06 Rca Corp Electronic microanalyzer monitoring
NL300306A (ja) * 1955-06-14
US3080481A (en) * 1959-04-17 1963-03-05 Sprague Electric Co Method of making transistors

Also Published As

Publication number Publication date
GB1009601A (en) 1965-11-10
DE1253836B (de) 1967-11-09
FR1349083A (fr) 1964-01-10
US3248542A (en) 1966-04-26

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