NL289910A - - Google Patents
Info
- Publication number
- NL289910A NL289910A NL289910DA NL289910A NL 289910 A NL289910 A NL 289910A NL 289910D A NL289910D A NL 289910DA NL 289910 A NL289910 A NL 289910A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/82—Mounting, supporting, spacing, or insulating electron-optical or ion-optical arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
- H01J37/15—External mechanical adjustment of electron or ion optical components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/16—Vessels; Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/3002—Details
- H01J37/3005—Observing the objects or the point of impact on the object
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB8940/62A GB1009601A (en) | 1962-03-08 | 1962-03-08 | Improvements in electron beam equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL289910A true NL289910A (en:Method) |
Family
ID=9862258
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL289910D NL289910A (en:Method) | 1962-03-08 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3248542A (en:Method) |
| DE (1) | DE1253836B (en:Method) |
| FR (1) | FR1349083A (en:Method) |
| GB (1) | GB1009601A (en:Method) |
| NL (1) | NL289910A (en:Method) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3327114A (en) * | 1964-06-23 | 1967-06-20 | Alfred F Diorio | Low-angle x-ray diffraction camera comprising releasably connected sections and adjustable beam apertures and stops |
| US3514596A (en) * | 1967-10-17 | 1970-05-26 | Picker Corp | Spot filmer for x-ray radiographing which minimizes patient-to-film distance |
| US3814356A (en) * | 1970-10-02 | 1974-06-04 | J Coleman | Electron microscope |
| US3809899A (en) * | 1972-08-17 | 1974-05-07 | Tektronix Inc | Electron-beam tube including a thermionic-field emission cathode for a scanning electron microscope |
| US3872305A (en) * | 1972-12-06 | 1975-03-18 | Jeol Ltd | Convertible scanning electron microscope |
| DE2702439C3 (de) * | 1977-01-19 | 1980-08-07 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Langbrennweitige magnetische Linse zur korpuskularstrahloptischen Abbildung eines großflächigen Objektes |
| US5412211A (en) * | 1993-07-30 | 1995-05-02 | Electroscan Corporation | Environmental scanning electron microscope |
| US5362964A (en) * | 1993-07-30 | 1994-11-08 | Electroscan Corporation | Environmental scanning electron microscope |
| US20180182605A1 (en) * | 2016-12-22 | 2018-06-28 | Thermo Finnigan Llc | Aligning ion optics by aperture sighting |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2319061A (en) * | 1941-01-31 | 1943-05-11 | Rca Corp | Demountable electron gun |
| DE892491C (de) * | 1941-03-18 | 1953-10-08 | Aeg | Zerlegbares mehrstufiges, aus mehreren Teilen bestehendes UEbermikroskop |
| US2405306A (en) * | 1944-01-31 | 1946-08-06 | Rca Corp | Electronic microanalyzer monitoring |
| NL300306A (en:Method) * | 1955-06-14 | |||
| US3080481A (en) * | 1959-04-17 | 1963-03-05 | Sprague Electric Co | Method of making transistors |
-
0
- NL NL289910D patent/NL289910A/xx unknown
-
1962
- 1962-03-08 GB GB8940/62A patent/GB1009601A/en not_active Expired
-
1963
- 1963-03-07 FR FR18180A patent/FR1349083A/fr not_active Expired
- 1963-03-07 DE DEE24442A patent/DE1253836B/de active Pending
- 1963-03-20 US US266621A patent/US3248542A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| FR1349083A (fr) | 1964-01-10 |
| DE1253836B (de) | 1967-11-09 |
| US3248542A (en) | 1966-04-26 |
| GB1009601A (en) | 1965-11-10 |