NL2014896B1 - Read-out circuit and method for reading out large-array resistive sensors. - Google Patents

Read-out circuit and method for reading out large-array resistive sensors. Download PDF

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Publication number
NL2014896B1
NL2014896B1 NL2014896A NL2014896A NL2014896B1 NL 2014896 B1 NL2014896 B1 NL 2014896B1 NL 2014896 A NL2014896 A NL 2014896A NL 2014896 A NL2014896 A NL 2014896A NL 2014896 B1 NL2014896 B1 NL 2014896B1
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Prior art keywords
connection lines
row
column
sensor value
resistive
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NL2014896A
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Dutch (nl)
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NL2014896A (en
Inventor
Lotfi Reza
Yarahmadi Roohollah
Ramazanian Sajjad
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Univ Delft Tech
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Priority to NL2014896A priority Critical patent/NL2014896B1/en
Priority to PCT/EP2016/062381 priority patent/WO2016193307A1/en
Publication of NL2014896A publication Critical patent/NL2014896A/en
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Publication of NL2014896B1 publication Critical patent/NL2014896B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/225—Measuring circuits therefor
    • G01L1/2262—Measuring circuits therefor involving simple electrical bridges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268—Arrangements for correcting or for compensating unwanted effects

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Force Measurement Appropriate To Specific Purposes (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

Read-out circuit and method for reading out a large array of resistive sensors having m column connection lines and n row connection lines. Each of a plurality of resistive 5 sensors (Rmn) is connected between one of the m column connection lines and one of the n row connection lines. Measuring a sensor value of a single one of the resistive sensors (Rmn) is accomplished by connecting the measurement circuit (5) to the row connection line associated with the single one resistive sensor, grounding all column connection lines and measuring a first sensor value, connecting a column connection 10 line associated with the single one resistive sensor to a supply voltage and measuring a second sensor value, and determining the sensor value of the single one resistive sensor by subtracting the first sensor value and second sensor value.

Description

Read-out circuit and method for reading out large-array resistive sensors Field of the invention
The present invention relates to a method of reading out a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors being connected between an associated one of the m column connection lines and an associated one of the n row connection lines. In a further aspect, the present invention relates to a read-out circuit for a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors being connected between an associated one of the m column connection lines and an associated one of the n row connection lines.
Prior art
American patent publication US2005/0200732 discloses a read-out circuit for a pixel array employing an offset error compensation by subtracting from a value sensed by a color sensor a dark current offset value.
American patent publication US2013/0088247 discloses offset compensation using a dedicated offset correction circuit in a pressure sensing array.
American patent publication US2005/0207234 discloses an offset error compensation scheme for an array forming a data storage device by subtracting a predetermined offset value from a measured value for each cell in the array.
Summary of the invention
The present invention seeks to provide a low complexity solution for a read-out circuit for large-array resistive sensors, having improved performance over prior art circuitry with regard to sensitivity of error sources related to the measurement circuit used (e.g. operational amplifiers).
According to the present invention, a method according to the preamble defined above is provided further comprising, measuring a sensor value of a single one of the plurality of resistive sensors by: connecting a measurement circuit to the row connection line associated with the single one resistive sensor, grounding all column connection lines and measuring a first sensor value, connecting a column connection line associated with the single one resistive sensor to a supply voltage and measuring a second sensor value, and determining the sensor value of the single one resistive sensor by subtracting the first sensor value and second sensor value.
This will ensure a proper and robust determination of a specific single sensor value without adding complex circuitry (thus with less cost than prior art methods) and with high accuracy.
In a further aspect, the present invention relates to a read-out circuit for a large array of resistive sensors as defined in the preamble above, the read-out circuit comprising a measurement circuit (e.g. an operational amplifier based circuit) providing an output signal, m column switches each connected to one of the m column connection lines and to either ground or a supply voltage, and n row switches each connected to one of the n row connection lines and to either ground or the measurement circuit. By properly actuating the switches (e.g. under control of a control unit), the sensor values of each individual sensor in the array can be determined with high accuracy, yet without necessitating any complex measurement circuitry.
Short description of drawings
The present invention will be discussed in more detail below, using a number of exemplary embodiments, with reference to the attached drawings, in which
Fig. 1 shows a circuit diagram of a read-out circuit for an exemplary 4x4 array of resistive sensors, according to an embodiment of the present invention; and
Fig. 2 shows a circuit diagram of a read-out circuit according to an embodiment of the present invention for a generic m x n resistive sensor array.
Detailed description of exemplary embodiments
Large arrays of resistive sensors have a wide range of applications from industrial systems (e.g. pressure and gas sensors) to biomedical wearable devices (e.g. in the form of textile sensors). Several types of read-out circuits are known in the art and have been presented for such sensors, however, these suffer from drawbacks mainly due to the large number of sensing elements, or when the ratio of the maximum and minimum resistor values is very high. Also, non-idealities of the operational amplifier(s) employed in such circuits provide further disadvantages.
According to the present invention embodiments, a high-accuracy yet simple read-out circuit architecture is proposed wherein the problems caused by several main non-ideality sources and errors are overcome. In this way, not only the accuracy of the read-out circuit is increased but also its complexity and therefore cost is reduced.
This was accomplished after studying the effects of two main non-idealities of an operational amplifier, i.e. the offset voltage and the input current, on the accuracy of the read-out circuit.
In general terms, a double-sampling scheme is proposed to improve the accuracy of the read-out circuit. Both simulation and measurement results have confirmed the effectiveness of the proposed method for large arrays of resistive sensors.
Fig. 1 shows a circuit diagram of a read-out circuit for an exemplary 4x4 array of resistive sensors Rmn, according to an embodiment of the present invention. In generic terms, the present invention read-out circuit is especially suited for a large array of resistive sensors having m column connection lines and n row connection lines (m and n being positive integers), each of a plurality of resistive sensors Rmn being connected between an associated one of the m column connection lines and an associated one of the n row connection lines.
It is noted that in most if not all resistive sensor arrays, the individual sensor terminals are not accessible, but only the column and row terminals.
The read-out circuit itself comprises a measurement circuit 5 providing an output signal V0, m column switches SWcm each connected to one of the m column connection lines and to either ground or a supply voltage Vcc, and n row switches SWr„ each connected to one of the n row connection lines and to either ground or the measurement circuit.
In the specific embodiment shown in Fig. 1, the switches SWcmand SWrd are operated for measuring a second sensor value of the single resistive sensor R23 from the plurality of resistive sensors Rmn, i.e. the second column switch SWc2 is connected to a supply voltage Vcc and the third row switch SWr3 is connected to the measurement circuit 5.
This is actually one of the steps of the method embodiments of the present invention, which in general can be described as measuring a sensor value of a single one of the plurality of resistive sensors Rmn by: connecting a measurement circuit 5 to the row connection line associated with the single one resistive sensor, grounding all column connection lines and measuring a first sensor value, connecting a column connection line associated with the single one resistive sensor to a supply voltage and measuring a second sensor value, and - determining the sensor value of the single one resistive sensor by subtracting the first sensor value and second sensor value (e.g. in the digital domain).
As a result, the ratio of the maximum measurable resistance to the minimum measurable resistance is increased (i.e. the dynamic range), and this is achieved simultaneously with a reduced complexity of the read-out circuit.
In the embodiment shown in Fig. 1, the measurement circuit 5 comprises a simple feedback circuit with an operational amplifier 6 (opamp) and a feedback resistor Rf connected between the opamp output and its positive input. The negative input of the opamp 6 is connected to ground, and the positive input to the instantaneous measurement value (as determined by the positions of row switches SWRn).
One of the error sources in measurement circuits is the opamp offset, the effect of which can be described for the read-out circuit of Fig. 1 as follows:
It can be shown that the output voltage Vo of the read-out circuit (i.e. output of measurement circuit 5) is affected by the opamp offset voltage V0ffSet using:
Another non-ideality source is the opamp input current (which is not zero for many commercial non-CMOS opamps). The effect of this input current on the output voltage can be considered in the following equation:
The present invention embodiments work as follows: using a double-sampling scheme, the digitized version of the output of the circuit for the case when the input switch (i.e. SWc3 in Fig. 1) is connected to Vcc (second sensor value) is subtracted from that obtained when the input is grounded (first sensor value). The subtraction result is therefore, an error-free value which is much less dependent on the offset voltage and the input current of the opamp 6. There are several problems that the present invention embodiments described herein have offered solutions for: 1. Cross-talk between different sensors in an array arrangement: in the present invention embodiments, the effect of cross-talk is reduced. 2. Limited value for the Rmax/Rmin ratio (i.e. the dynamic range): this parameter is considerably increased in the present invention embodiments.
Fig. 2 shows a circuit diagram of a read-out circuit according to an embodiment of the present invention for a generic m x n resistive sensor array. In this case, m column switches SWcm are connected to the respective m column connection lines of the array, and n row switches SWrh are connected the respective n row connection lines of the array. In further method embodiments, connecting the measurement circuit 5 to the row connection line associated with the single one resistive sensor is implemented using a row switch SWr,„ and connecting the column connection line associated with the single one resistive sensor to a supply voltage is implemented using a column switch SWcm· The row and column switches may be actual hardware switches, controlled switches, semiconductor switches, etc.
As shown in the Fig. 2 embodiment, the row and column switches SWr,„ SWcm, are controlled or actuated using a control unit 7. Or in other words, the read-out circuitry comprises a control unit 7 connected to each of the m column switches SWcm and each of the n row switches SWRn. The control unit 7 can then be used to provide proper control and timing of all switches, e.g. for determining the actual sensor value of each of the plurality of resistive sensors by subsequently connecting the associated ones of the m column connection lines and n row connection lines. Thus, the entire array of resistive sensors Rmn can be read out with improvement of sensitivity for the opamp inherent error sources in this array read-out circuit.
In an even further embodiment, the control unit 7 is connected to the measurement circuit 5 for receiving the output signal V0 thereof, and the control unit 7 is further arranged to execute the method steps of any one of method embodiments as described above. For example, the first sensor value and second sensor value are stored and subsequently processed. This can e.g. be achieved by adding processing circuitry (e.g. data processor, memory, input signal digitization, etc.) to the control unit 7.
Both simulation results of a 40*50 array and also the measurement results confirm the effectiveness of the read-circuit of the present invention embodiments in improving the accuracy of the read-out mechanism without introducing additional complexity. The present invention embodiments will lead to more accurate yet less complex read-out circuits for large arrays of read-out (resistive) sensors. One of the examples is a platform measuring the pressure profile under the feet with more than 2000 resistive sensors. With this invention, the accuracy of the measurement system will be increased without additional circuit complexity overhead.
The large arrays of resistive sensors as discussed above have a wide range of applications from medical to industrial, and the present invention method embodiments and read-out circuit embodiments may equally be applied in these applications. An example is textile sensors which are becoming smarter. In wearing biomedical devices, another booming application field is emerging. Other examples include, but are not limited to Barefoot Pressure Analysis; In-Shoe Planar Pressure Analysis; Seating & Positioning Pressure Analysis; Human Joint Analysis; Animal Gait Analysis; Body Pressure Mapping (Seating & Mattress); Occlusal Analysis (Dentistry); Tire Footprint Pressure Measurement; Wiper Force Measurement; Grip Pressure Measurement.
It is noted that the array indications (column, row) in the exemplary embodiments described above can be interchanged of course, without departing from the scope of protection as defined in the appended claims.
The present invention may be described in various numbered embodiments: Embodiment 1. Method of reading out a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors (Rmn) being connected between an associated one of the m column connection lines and an associated one of the n row connection lines, comprising measuring a sensor value of a single one of the plurality of resistive sensors (Rmn) by: connecting a measurement circuit (5) to the row connection line associated with the single one resistive sensor, grounding all column connection lines and measuring a first sensor value, connecting a column connection line associated with the single one resistive sensor to a supply voltage and measuring a second sensor value, and determining the sensor value of the single one resistive sensor by subtracting the first sensor value and second sensor value.
Embodiment 2. Method according to embodiment 1, further comprising determining the actual sensor value of each of the plurality of resistive sensors by subsequently connecting the associated ones of the m column connection lines and n row connection lines.
Embodiment 3. Method according to embodiment 1 or 2, wherein the measurement circuit (5) comprises an operational amplifier (6).
Embodiment 4. Method according to any one of embodiments 1-3, wherein connecting the measurement circuit (5) to the row connection line associated with the single one resistive sensor is implemented using a row switch (SWr„) (thus n row switches being present).
Embodiment 5. Method according to any one of embodiments 1-4, wherein connecting the column connection line associated with the single one resistive sensor to a supply voltage is implemented using a column switch (SWcm) (thus m column switches being present).
Embodiment 6. Method according to any one of embodiments 1-5, wherein the first sensor value and second sensor value are stored and subsequently processed. Embodiment 7. Read-out circuit for a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors (Rmn) being connected between an associated one of the m column connection lines and an associated one of the n row connection lines, the read-out circuit comprising - a measurement circuit (5) providing an output signal (Y0), - m column switches (SWcm) each connected to one of the m column connection lines and to either ground or a supply voltage (Vcc), and - n row switches (SWr„) each connected to one of the n row connection lines and to either ground or the measurement circuit (5).
Embodiment 8. Read-out circuit according to embodiment 7, further comprising a control unit (7) connected to each of the m column switches (SWcm) and each of the n row switches (SWrm).
Embodiment 9. Read-out circuit according to embodiment 7 or 8, wherein the measurement circuit (5) comprises an operational amplifier (6).
Embodiment 10. Read-out circuit according to embodiment 7, 8 or 9, wherein the control unit (7) is connected to the measurement circuit (5) for receiving the output signal (V0) thereof, and wherein the control unit (7) is further arranged to execute the method steps of any one of the embodiments 1-6.
The present invention embodiments have been described above with reference to a number of exemplary embodiments as shown in the drawings. Modifications and alternative implementations of some parts or elements are possible, and are included in the scope of protection as defined in the appended claims.

Claims (10)

1. Werkwijze voor uitlezen van een groot array resistieve sensoren met m kolomaansluitlijnen en n rijaansluitlijnen, waarbij elk van een veelvoud van resistieve sensoren (Rmn) aangesloten is tussen één bijbehorende van de m kolomaansluitlijnen en één bijbehorende van de n rijaansluitlijnen, omvattende meten van een sensorwaarde van één enkele van het veelvoud van resistieve sensoren (Rmn) door: - verbinden van een meetschakeling (5) met de rijaansluitlijn die behoort bij de ene enkele resistieve sensor, aarden van alle kolomaansluitlijnen en meten van een eerste sensorwaarde, - verbinden van een kolomaansluitlijn die behoort bij de ene enkele resistieve sensor met een voedingspanning en meten van een tweede sensorwaarde, en - bepalen van de sensorwaarde van de ene enkele resistieve sensor door het aftrekken van de eerste sensorwaarde en de tweede sensorwaarde.A method for reading a large array of resistive sensors with m column connection lines and n row connection lines, wherein each of a plurality of resistive sensors (Rmn) is connected between one associated of the m column connection lines and one associated of the n row connection lines, comprising measuring a sensor value of a single of the plurality of resistive sensors (Rmn) by: - connecting a measuring circuit (5) to the row connection line associated with the one single resistive sensor, grounding all column connection lines and measuring a first sensor value, - connecting a column connection line associated with the one single resistive sensor with a supply voltage and measuring a second sensor value, and - determining the sensor value of the one single resistive sensor by subtracting the first sensor value and the second sensor value. 2. Werkwijze volgens conclusie 1, verder omvattende bepalen van de actuele sensorwaarde van elk van het veelvoud van resistieve sensoren door het opeenvolgend verbinden van de bijbehorende van de m kolomaansluitlijnen en n rijaansluitlijnen.The method of claim 1, further comprising determining the current sensor value of each of the plurality of resistive sensors by sequentially connecting the associated one of the m column connection lines and n row connection lines. 3. Werkwijze volgens conclusie 1 of 2, waarbij de meetschakeling (5) een operationele versterker (6) omvat.Method according to claim 1 or 2, wherein the measuring circuit (5) comprises an operational amplifier (6). 4. Werkwijze volgens één van de conclusies 1-3, waarbij het verbinden van de meetschakeling (5) met de rijaansluitlijn behorende bij de ene enkele resistieve sensor is geïmplementeerd met gebruik van een rij schakelaar (SWRn).The method of any one of claims 1-3, wherein connecting the measurement circuit (5) to the row connection line associated with the one single resistive sensor is implemented using a row switch (SWRn). 5. Werkwijze volgens één van de conclusies 1-4, waarbij het verbinden van de kolomaansluitlijn behorende bij de ene enkele resistieve sensor met een voedingspanning is geïmplementeerd met gebruik van een kolomschakelaar (SWcm)·The method of any one of claims 1-4, wherein connecting the column termination line associated with the one single resistive sensor to a supply voltage is implemented using a column switch (SW cm). 6. Werkwijze volgens één van de conclusies 1-5, waarbij de eerste sensorwaarde en tweede sensorwaarde worden opgeslagen en vervolgens verwerkt.The method of any one of claims 1-5, wherein the first sensor value and second sensor value are stored and then processed. 7. Uitleesschakeling voor een groot array resistieve sensoren met m kolomaansluitlijnen en n rijaansluitlijnen, waarbij elk van een veelvoud van resistieve sensoren (Rmn) aangesloten zijn tussen een bijbehorende van de m kolomaansluitlijnen en een bijbehorende van de n rijaansluitlijnen, waarbij de uitleesschakeling omvat een meetschakeling (5) die een uitgangssignaal (V0) verschaft, - m kolom schakel aars (SWcm) die elk verbonden zijn met één van de m kolomaansluitlijnen en hetzij met aarde, hetzij met een voedingspanning (Vcc), en - n rij schakelaars (SWr„) die elk verbonden zijn met één van de n rijaansluitlijnen en hetzij met aarde, hetzij met de meetschakeling (5).A readout circuit for a large array of resistive sensors with m column connection lines and n row connection lines, each of a plurality of resistive sensors (Rmn) being connected between a corresponding one of the m column connection lines and a corresponding one of the n row connection lines, the read circuit comprising a measuring circuit (5) providing an output signal (V0), - m column switching arrays (SW cm) which are each connected to one of the m column connection lines and either to ground or to a supply voltage (Vcc), and - n row of switches (SWr ) which are each connected to one of the n row connection lines and either to ground or to the measuring circuit (5). 8. Uitleesschakeling volgens conclusie 7, verder omvattende een besturingseenheid (7) die verbonden is met elk van de m kolomschakelaars (SWcm) en elk van de n rij schakelaars (SWro).The readout circuit of claim 7, further comprising a control unit (7) connected to each of the m column switches (SW cm) and each of the n row of switches (SW cm). 9. Uitleesschakeling volgens conclusie 7 of 8, waarbij de meetschakeling (5) een operationele versterker (6) omvat.The readout circuit according to claim 7 or 8, wherein the measuring circuit (5) comprises an operational amplifier (6). 10. Uitleesschakeling volgens conclusie 7, 8 of 9, waarbij de besturingseenheid (7) verbonden is met de meetschakeling (5) voor het ontvangen van het uitgangssignaal daarvan, en waarbij de besturingseenheid (7) verder is ingericht voor het uitvoeren van de werkwijzestappen volgens één van de conclusies 1-6.A readout circuit according to claim 7, 8 or 9, wherein the control unit (7) is connected to the measuring circuit (5) for receiving its output signal, and wherein the control unit (7) is further adapted to carry out the method steps according to one of claims 1-6.
NL2014896A 2015-06-01 2015-06-01 Read-out circuit and method for reading out large-array resistive sensors. NL2014896B1 (en)

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NL2014896A NL2014896B1 (en) 2015-06-01 2015-06-01 Read-out circuit and method for reading out large-array resistive sensors.
PCT/EP2016/062381 WO2016193307A1 (en) 2015-06-01 2016-06-01 Read-out circuit and method for reading out large-array resistive sensors

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CN109059969A (en) * 2018-08-13 2018-12-21 中国科学院电子学研究所 A kind of resistive sensor array reading circuit and measurement method
CN112903151A (en) * 2021-01-25 2021-06-04 华东师范大学 Decoupling method suitable for thin film pressure sensor array and application thereof

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US7173547B2 (en) * 2004-03-22 2007-02-06 International Business Machines Incorporated Offset compensation in local-probe data storage devices
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