NL2005457C2 - Silicone containing encapsulant. - Google Patents
Silicone containing encapsulant. Download PDFInfo
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- NL2005457C2 NL2005457C2 NL2005457A NL2005457A NL2005457C2 NL 2005457 C2 NL2005457 C2 NL 2005457C2 NL 2005457 A NL2005457 A NL 2005457A NL 2005457 A NL2005457 A NL 2005457A NL 2005457 C2 NL2005457 C2 NL 2005457C2
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- Prior art keywords
- weight
- silicone
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- epoxy resin
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- 229920001296 polysiloxane Polymers 0.000 title claims description 23
- 239000008393 encapsulating agent Substances 0.000 title description 40
- 239000000203 mixture Substances 0.000 claims description 51
- 229920000647 polyepoxide Polymers 0.000 claims description 38
- 239000003822 epoxy resin Substances 0.000 claims description 37
- -1 Carbinol siloxane Chemical class 0.000 claims description 32
- OKKJLVBELUTLKV-UHFFFAOYSA-N methanol Natural products OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 claims description 32
- 229920005989 resin Polymers 0.000 claims description 32
- 239000011347 resin Substances 0.000 claims description 32
- 239000006096 absorbing agent Substances 0.000 claims description 24
- 150000001412 amines Chemical class 0.000 claims description 21
- 239000004611 light stabiliser Substances 0.000 claims description 21
- 150000008065 acid anhydrides Chemical class 0.000 claims description 20
- 239000003795 chemical substances by application Substances 0.000 claims description 20
- 239000003963 antioxidant agent Substances 0.000 claims description 14
- 230000003078 antioxidant effect Effects 0.000 claims description 13
- 125000000217 alkyl group Chemical group 0.000 claims description 11
- RNFJDJUURJAICM-UHFFFAOYSA-N 2,2,4,4,6,6-hexaphenoxy-1,3,5-triaza-2$l^{5},4$l^{5},6$l^{5}-triphosphacyclohexa-1,3,5-triene Chemical compound N=1P(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP=1(OC=1C=CC=CC=1)OC1=CC=CC=C1 RNFJDJUURJAICM-UHFFFAOYSA-N 0.000 claims description 9
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 9
- 150000001875 compounds Chemical class 0.000 claims description 9
- 239000003063 flame retardant Substances 0.000 claims description 9
- 239000008240 homogeneous mixture Substances 0.000 claims description 9
- VYKXQOYUCMREIS-UHFFFAOYSA-N methylhexahydrophthalic anhydride Chemical compound C1CCCC2C(=O)OC(=O)C21C VYKXQOYUCMREIS-UHFFFAOYSA-N 0.000 claims description 6
- 229920000233 poly(alkylene oxides) Polymers 0.000 claims description 6
- 239000004593 Epoxy Substances 0.000 claims description 5
- 125000002947 alkylene group Chemical group 0.000 claims description 5
- MUTGBJKUEZFXGO-OLQVQODUSA-N (3as,7ar)-3a,4,5,6,7,7a-hexahydro-2-benzofuran-1,3-dione Chemical compound C1CCC[C@@H]2C(=O)OC(=O)[C@@H]21 MUTGBJKUEZFXGO-OLQVQODUSA-N 0.000 claims description 4
- 125000003118 aryl group Chemical group 0.000 claims description 3
- 229920001400 block copolymer Polymers 0.000 claims description 3
- 229920001519 homopolymer Polymers 0.000 claims description 3
- 125000000896 monocarboxylic acid group Chemical group 0.000 claims description 3
- 150000005621 tetraalkylammonium salts Chemical class 0.000 claims description 3
- 125000005497 tetraalkylphosphonium group Chemical group 0.000 claims description 3
- 125000002723 alicyclic group Chemical group 0.000 claims description 2
- 238000005538 encapsulation Methods 0.000 claims 18
- 229910052698 phosphorus Inorganic materials 0.000 claims 3
- 239000011574 phosphorus Substances 0.000 claims 3
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Inorganic materials [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 claims 2
- 229910018557 Si O Inorganic materials 0.000 claims 1
- 238000010521 absorption reaction Methods 0.000 claims 1
- 229920006301 statistical copolymer Polymers 0.000 claims 1
- 238000004383 yellowing Methods 0.000 description 16
- 235000006708 antioxidants Nutrition 0.000 description 11
- 230000003247 decreasing effect Effects 0.000 description 7
- 238000009472 formulation Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 239000007787 solid Substances 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 230000009477 glass transition Effects 0.000 description 3
- 230000005923 long-lasting effect Effects 0.000 description 3
- 238000013508 migration Methods 0.000 description 3
- 230000005012 migration Effects 0.000 description 3
- 229920002050 silicone resin Polymers 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 229920005604 random copolymer Polymers 0.000 description 2
- 239000004094 surface-active agent Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- HVLLSGMXQDNUAL-UHFFFAOYSA-N triphenyl phosphite Chemical compound C=1C=CC=CC=1OP(OC=1C=CC=CC=1)OC1=CC=CC=C1 HVLLSGMXQDNUAL-UHFFFAOYSA-N 0.000 description 2
- LCFVJGUPQDGYKZ-UHFFFAOYSA-N Bisphenol A diglycidyl ether Chemical compound C=1C=C(OCC2OC2)C=CC=1C(C)(C)C(C=C1)=CC=C1OCC1CO1 LCFVJGUPQDGYKZ-UHFFFAOYSA-N 0.000 description 1
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 1
- OUUQCZGPVNCOIJ-UHFFFAOYSA-M Superoxide Chemical compound [O-][O] OUUQCZGPVNCOIJ-UHFFFAOYSA-M 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 150000001334 alicyclic compounds Chemical class 0.000 description 1
- 150000008064 anhydrides Chemical class 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- LSDYBCGXPCFFNM-UHFFFAOYSA-M dimethyl phosphate;tributyl(methyl)phosphanium Chemical compound COP([O-])(=O)OC.CCCC[P+](C)(CCCC)CCCC LSDYBCGXPCFFNM-UHFFFAOYSA-M 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000002391 heterocyclic compounds Chemical class 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 150000004714 phosphonium salts Chemical class 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- JRMUNVKIHCOMHV-UHFFFAOYSA-M tetrabutylammonium bromide Chemical compound [Br-].CCCC[N+](CCCC)(CCCC)CCCC JRMUNVKIHCOMHV-UHFFFAOYSA-M 0.000 description 1
- RKHXQBLJXBGEKF-UHFFFAOYSA-M tetrabutylphosphanium;bromide Chemical compound [Br-].CCCC[P+](CCCC)(CCCC)CCCC RKHXQBLJXBGEKF-UHFFFAOYSA-M 0.000 description 1
- HWCKGOZZJDHMNC-UHFFFAOYSA-M tetraethylammonium bromide Chemical compound [Br-].CC[N+](CC)(CC)CC HWCKGOZZJDHMNC-UHFFFAOYSA-M 0.000 description 1
- SZWHXXNVLACKBV-UHFFFAOYSA-N tetraethylphosphanium Chemical compound CC[P+](CC)(CC)CC SZWHXXNVLACKBV-UHFFFAOYSA-N 0.000 description 1
- LIXPXSXEKKHIRR-UHFFFAOYSA-M tetraethylphosphanium;bromide Chemical compound [Br-].CC[P+](CC)(CC)CC LIXPXSXEKKHIRR-UHFFFAOYSA-M 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- RLZMYANQLOCZOB-UHFFFAOYSA-M tributyl(methyl)phosphanium;iodide Chemical compound [I-].CCCC[P+](C)(CCCC)CCCC RLZMYANQLOCZOB-UHFFFAOYSA-M 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/42—Polycarboxylic acids; Anhydrides, halides or low molecular weight esters thereof
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/16—Nitrogen-containing compounds
- C08K5/34—Heterocyclic compounds having nitrogen in the ring
- C08K5/3467—Heterocyclic compounds having nitrogen in the ring having more than two nitrogen atoms in the ring
- C08K5/3477—Six-membered rings
- C08K5/3492—Triazines
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L83/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon only; Compositions of derivatives of such polymers
- C08L83/04—Polysiloxanes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/852—Encapsulations
- H10H20/854—Encapsulations characterised by their material, e.g. epoxy or silicone resins
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Epoxy Resins (AREA)
Description
SILICONE CONTAINING ENCAPSULANT
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to an encapsulant composition and, more particularly, to an encapsulant composition that can be used for a solid state light emitting device .
5 2. Description of Related Art
In the recent years, light emitting diodes (LEDs) have been widely used in many electronic devices such as LCD back-light sources, large displaying devices, and light illuminating equipment. Hence, demands for LEDs with high 10 brightness have increased. Owing to the environmental requirement of various LED application, an encapsulant composition suitable for being used in light emitting devices should have certain characteristics such as being homogeneous, having high transparency, and being capable of long 15 term storage capacity in order to resist to the high temperature when a large electrical current is applied. Conventional transparent encapsulant materials used in LEDs include epoxy or silicone resins, in which the cost of silicone resin is high though it has superior optical 20 characteristics. In contrast, epoxy resin has been widely used due to its low cost. However, epoxy resin has a serious problem that yellowing occurs when it is used as the encapsulant composition of the LEDs. The yellowing of the epoxy resin, caused by the high temperature of the high 25 power operation may influence the transmittance to the short-wavelength light and causing color shift. Therefore, epoxy resin is limited in its application for being used in a high current and high temperature operating environment .
2
The anti-yellowing of the encapsulant composition such as the epoxy resin is usually obtained by adding an antioxidant. The added antioxidant can remove the peroxide radical to stop the chain reaction, or reduce the degrada-5 tion speed of the polymers by decomposing the hydroperoxide generated during the degradation. However, it is proved that the anti-yellowing obtained by adding of the antioxidant cannot be satisfactory for long operating time of the LEDs, not only suitable anti-oxidant is hard to 10 find but also some anti-oxidants have high volatility that may result in a migration problem within the encapsulant material.
Besides, internal stress caused by high temperature during high power operation may contribute negative influ-15 ence to the semiconductor element, cause a short circuit, and reduce the brightness of the applied LEDs. Therefore, for reducing the internal stress of the encapsulant composition, US Patent No. 5,145,889 has disclosed four methods, which comprise: (1) decreasing the glass transition 20 temperature (Tg) of the encapsulant composition; (2) decreasing the linear expansion coefficient of the encapsulant composition; (3) decreasing the Young's modulus of elasticity(E); and (4) decreasing the shrinkage factor(8). In general, decreasing of the glass transition temperature 25 (Tg) will lower the mechanical strength of the encapsulant at high temperature; decreasing of the Young's modulus of elasticity will dramatically decrease the adhesion of the encapsulant to chip, board, or lead frame ; besides if the amount of filler increase significantly, the viscosity of 3 0 the encapsulant will increase too much and is unfavorable to the workability.
In US Patent No. 6,800,373, an encapsulant composition is disclosed, which comprises silicone resin, low molecular weight of alicyclic compounds, aromatic com-35 pounds, hetero-cyclic compounds which having epoxy resin functional group, and siloxane surfactant. However, the optical transparency is unsatisfactory, and the siloxane surfactant is neither involved in the reaction nor does it 3 form a homogeneous mixture with common epoxy encapsulant composition.
Therefore, it is desirable to provide an improved encapsulant composition that can be used for a solid state 5 light emitting device to achieve low internal stress and better anti-yellowing performance.
SUMMARY OF THE INVENTION
10 An object of the present invention is to provide an encapsulant composition for a solid state light emitting device, such as LEDs, which can overcome the problems of yellowing and achieve low internal stress in a long term high temperature operation conditions.
15 To achieve the object, the present invention provide an encapsulant composition comprising: (a) 30 to 60 weight% of an epoxy resin; (b) 30 to 60 weight% of an acid anhydride curing agent; (c) 0.1 to 30 weight% of a Carbi- nol siloxane resin which can form a homogeneous mixture 20 with the said (a) and (b) ; and (d) 0.1 to 5 weight% of a reactive UV absorber and/or a reactive hindered amine light stabilizer (HALS).
Also, the present invention provides another encapsulant composition comprising: (a) 30 to 60 weight% of an 25 epoxy resin; (b) 30 to 60 weight% of an acid anhydride curing agent; (c) 0.1 to 30 weight% of a Carbinol siloxane resin which can form a homogeneous mixture with the said (a) and (b); (d) 0.01 to 3.0 weight% of a curing accelerator; (e) 0.1 to 5 weight% of a reactive UV absorber; and 30 (f) 0.1 to 5 weight% of a reactive hindered amine light stabilizer (HALS). Additionally a reactive anti-oxidant and a phosphor containing flame retardant can be selectively used.
Besides, the present invention also· provides a sili-35 cone containing encapsulant composition comprising: (a) 30 to 60 weight% of an epoxy resin; (b) 30- to 60 weight% of an acid anhydride curing agent; (c) 0.1 to 30 weight% of a Carbinol siloxane resin which can form a homogeneous mix- 4 ture with the said (a) and (b) ; (d) 0.1 to 5 weight% of a normal ÜV absorber; and (e) 0.1 to 5 weight% of a normal hindered amine light stabilizer (HALS).
5 BRIEF DESCRIPTION OF THE DRAWINGS
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
The object, technique features, and advantages ac-10 cording to the present invention will explain later in more detail.
The present invention provide an encapsulant composition for a solid state light emitting device, such as LEDs, which can achieve low internal stress, and provide 15 better anti-yellowing performance with long term and high temperature operation. Under the presence of epoxy resin and acid anhydride, the present invention introduce a Car-binol siloxane resin to lower the hardness and the internal stress while curing the epoxy resin composition; in 20 addition, the use of Carbinol siloxane resin can prevent the encapsulant from cracking and overcome the problem of low adhesion. The adding of the UV absorber and the hindered amine light stabilizer (HALS) having reactive group may contribute to the increasing of the anti-yellowing 25 ability of the encapsulant.
The addition of Carbinol siloxane resin is to react with the unreacted acid anhydride to reduce the yellowing caused by the unreacted acid anhydride left after the polymerization óf epoxy resin and acid anhydride, if any. 30 Also, the Carbinol siloxane resin can react with the reactive group of the epoxy resin to increase the elasticity of the encapsulant. Furthermore, any unreacted Carbinol siloxane resin left can serve as a filler to reduce the linear expansion coefficient of the encapsulant. According 35 to the present invention, the Carbinol siloxane resin is a compound of the following formula: 5 R2 \ ƒ R2 \ (R4)3Si-0--Si-o-jj— Si— θ4 Si(R4)3 \ I A ' ly R3 (CH2)n (V)m
OH
r wherein (F^COm is an alkylene oxide group (when m=l) or a poly(alkylene oxide) group (when m>l); and R1 independ-5 ently represents a linear and branched divalent radical selected from - C2H4 - , - C3H6 - , - C4Hs - . It is to be noted that when m is greater than 1, e.g., 2 or more, the alkylene oxide groups can be the same or different and can form poly(alkylene oxide) homopolymers, random copolymers 10 and block copolymers.
R2 and R3 are independently H or C1-C2 alkyl; R4is H or C1-C2 alkyl and is the same with or different from R2; x is an integer of 1 to 100; y is an integer of 1 to 100; n is an integer of 1 to 5; and m is an integer of 1 to 40.
15 Though the Carbinol siloxane resin is advantageous in lower internal stress and linear expansion coefficient, it may not solving all the yellowing problems, therefore by addition of a UV absorber and/or a hindered amine light stabilizer (HALS) having reactive group would be helpful. 20 By controlling the amount of the Carbinol siloxane resin being used, the reactive ÜV absorber containing an OH or a COOH reactive group may react with the encapsulant to form a polymeric UV absorber. Hence, the volatilization due to the migration of the low molecular weight UV absorbers can 25 be reduced, then the long lasting performance of the UV absorber can be enhanced. Since the anti-yellowing performance of this type encapsulant has been substantially increased, therefore, the long lasting requirement for LEDs can be satisfied.
6
The encapsulant composition of the present invention comprises: (a) 30 to 60 weight% of an epoxy resin; (b) 30 to 60 weight% of an acid anhydride curing agent; (c) 0.1 to 30 weight% of a Carbinol siloxane resin 5 which can form a homogeneous mixture with the said (a) and (b) ; and (d) 0.1 to 5 weight% of a reactive ÜV absorber or a reactive hindered amine light stabilizer (HALS). Also, the present invention provides another encapsulant composition comprising: (a) 30 to 60 weight% of an epoxy resin; 10 (b) 30 to 60 weight% of an acid anhydride curing agent; (c) 0.1 to 30 weight% of a Carbinol siloxane resin which can form a homogeneous mixture with the said (a) and (b) ; (d) 0.01 to 3.0 weight% of a curing accelerator; (e) 0.1 to 5 weight% of a reactive UV absorber; and (f) 0.1 to 5 15 weight% of a reactive hindered amine light stabilizer (HALS). Additionally a reactive anti-oxidant and a phosphor containing flame retardant can be selectively used.
The encapsulant composition of the present invention comprises an epoxy resin and a curing agent as the primary 20 components, a Carbinol siloxane resin for reducing the internal stress of the encapsulant, and a UV absorber or a hindered amine light stabilizer (HALS) having reactive group, additionally a reactive anti-oxidant and a phosphor containing flame retardant can be selectively added to en-25 hance a better anti-yellowing performance. According to the encapsulant composition of the present invention, the (a) epoxy resin may be an aromatic epoxy resin, an ali-cyclic epoxy resin, or a silicone modified epoxy resin; the (b) acid anhydride curing agent may be methyl hexahy-30 drophthalic anhydride (MHHPA) or hexahydrophthalic anhydride (HHPA); the (c) Carbinol siloxane . resin may be a compound of following formula: 35 7 R2 / R2 \ 4 1 ƒ I \ 4 (R4)3Si-0--Si--0---Si— O--Si(R4)3 ' I \ ly R3 ( CH2 )n ( or1) ' I 'm
OH
r wherein (F^O)m is an alkylene oxide group (when m=l) or a poly(alkylene oxide) group (when m>l); and R1 independ-5 ently represents a linear and branched divalent radical selected from - C2H4 - , - C3H6 -, - C4H8 - . It is to be noted that when m is greater than 1, e.g., 2 or more, the al kylene oxide groups can be the same or different and can form poly(alkylene oxide) homopolymers, random copolymers 10 and block copolymers. R2 and R3 are independently H or C— C2 alkyl; and R4 is H or Ci-C2 alkyl and is the same with or different from R2. According to a preferred embodiment of the present invention, R2 and R4 may be both methyl. X is an integer of 1 to 100; y is an integer of 1 to 100; n 15 is an integer of 1 to 5; and m is an integer of 1 to 40.
For example, commercially-available products such as Silwet L-7608, CoatOSil 7604, BYK-373, BYK-377, and TEGO- PREN 5842 can serve as the Carbinol siloxane resin herein. According to another encapsulant composition of the pre-20 sent invention, besides the epoxy resin and curing agent as the primary components being used, a Carbinol siloxane resin may be further included to reduce the internal stress of the encapsulant, and a reactive UV absorber or a reactive hindered amine light stabilizer (HALS) having re-25 active group may be selectively added simultaneously. Also, a reactive anti-oxidant and a phosphor containing flame retardant can be selectively used to enhance antiyellowing performance of the encapsulant. The detail information of the (a) epoxy resin, the (b) acid anhydride 8 curing agent, and the (c) Carbinol siloxane resin are described as above. The (d) curing accelerator may be a tetra-alkyl ammonium salt such as tetra-ethylammonium bromide or tetra-n-butylammonium bromide; or a tetra-alkyl 5 phosphonium salt such as tetra-ethylphosphonium bromide, tetra-n-butylphosphonium bromide, methyltri- butylphosphonium iodide, methyltri-n-butylphosphonium di-methylphosphate, or tetra-ethylphosphonium tetrafluorobo-rate. The reactive UV absorber may be a compound of the 10 following formula: HO r rr\>i X (CH2)pCO(OR50)q(R5)OH HO r CC/^ X(ch2)wcooh / or HO r X(CH2)xOH .
15 wherein p, q, w, x are each independently an integer of 1 to 5; R is H or Ci-C8 alkyl; R5 is a C2-C4 alkyl with straight chain or branched chain. The (f) reactive hindered amine light stabilizer (HALS) may be a compound of 20 the following formula: (CH2)yOH 1 r ch3 9 wherein y is an integer of 0 to 8.
Besides, the reactive anti-oxidant and the phosphor containing flame retardant can serve as additives to enhance anti-yellowing performance of the encapsulant. The phos-5 phor containing flame retardant may be, for example, triphenylphosphite and 3, 4:5, 6-Dibenzo-2H-l,2- oxaphosphorin-2-oxide.
The encapsulant composition of the present invention is advantageous in many aspects, such as (1) low internal 10 stress, due to the adding of the Carbinol siloxane resin; (2) excellent anti-yellowing performance, due to the adding of the UV absorber or the hindered amine light stabilizer (HALS) having reactive group and the adding of the reactive anti-oxidant and phosphor containing flame retar-15 dant; and (3) long lasting of anti-yellowing performance by forming polymeric UV absorber and/or polymeric hindered amine light stabilizers in situ, thus avoid the possibility of decreasing UV absorbers contain due to the migration and high volatility of common low molecular weight UV 20 absorbers and/or hindered amine light stabilizers.
[Example 1] [Formulation for table 1] main components_
Samples__El__E2__E3__E4
Epoxy resin (wt%) 52.4 51.2__50.3__48.5 acid anhydride curing 47.6 47.5 47.0 46.1 agent(wt%)_____
Carbinol siloxane 1.3 · 2.7 5.4 resin A (wt%)_____ 25
The epoxy resin used herein is Bisphenol A Diglycidyl ether (NPEL-128E, purchased from Nan Ya Plastics Company), the acid anhydride curing agent used herein is methylhexa-hydrophthalic anhydride (MHHPA), and the Carbinol siloxane 30 resin A used herein is Silwet L-7608 (purchased from GE Silicone Company).
10
Tetra alkyl phosphonium salt(curing accelerator) was added into curing agent (such as MHHPA in Tablel) at room temperature and stirring to form a solution(about 0.5 hour), additional components were then added and stirred 5 to get a homogenous mixture. The resulting resin mixture was heated at 120°C for 1.5 hours and then heated at 140°C for 3.5 hours to be cured.
Films thus formed were subjected to the thermal mechanical analysis (TMA, Perkin Elmer DMA7e) to measure 10 their internal stress (c^/oii) values at a testing temperature of 25 to 250°C with the heating speed of 5°C/min. Results are listed in table 1 below.
[Table 1]_____
Samples El E2 E3 E4 αχ 61.1 62.98 73.20 79.74 a.2 187.5 176.08 191.23 192.0 (α2/αι) 3.07 2.80 2.61 2.41 15 [Example 2] [Formulation for table 2] main components_
Samples__E5__E6__E7__E8 epoxy resin (wt%)__52.4 51.4__50.7__49.1 acid anhydride curing 47.6 47.3 46.6 45.4 agent(wt%)____
Carbinol siloxane 1.3 2.7 5.5 resin B(wt%)_____
Following the same procedure as described in Examplel, except the Silwet L-7608 was replaced by CoatOSil 20 7604 (purchased from GE Silicone Company). The internal stress (α2/οίι) values measured are as shown in table 2 below .
11 [Table 2]_____
Samples E5 E6 E7 E8 ot! 61.1 71.2 70.0 80.0 <x2 187.5 191.2 182.6 183.9 (aa/ax) 3.07 2.69 2.61 2.30 [Example 3] [Formulation for table 3] main components_
Samples__E9__ElO__Ell_' E12 epoxy resin (wt%)__52.4__51.4_ 50.7 49.3
Acid anhydride curing 47.6 47.3 46.6 45.3 agent(wt%)_____ carbinol siloxane 1.3 2.7 5.4 resin C(wt%)_____ 5
Following the same procedure as described in Example 1, except the Carbinol siloxane resin C was BYK-373 (purchased from BYK Company) , and the internal stress (02/0(1) values measured are as shown in table 3 below.
10 [Table 3]_____
Samples E9 E10 Ell E12 : αχ 61.1 82.9 83.9 89.7 a2 187.5 208.0 201.8 _____194.7 (a2/«i) 3.07 2.51 2.41 2.17
According to the results shown in the above tables 1 to 3, it is believed that the use of the Carbinol siloxane resin A, B, and C can reduce the hardness of the epoxy resin and 15 reduce the internal stress caused by the' different thermo expansion coefficients of the organic material and the inorganic material. In detail, the internal stress (02/01) 12 values decrease when the content of the Carbinol siloxane resin increases. The difference between the thermo expansion coefficients below and over the glass transition temperature decreases, which means the internal 5 stress is efficiently reduced and the problem of cracking of the encapsulant and short circuit of the electronics can be overcome.
[Example 4] 10 [Formulation for table 4] main components_ E14 El5 E13
Samples (experiment (control (blank) ___group)__group) epoxy resin (wt%)_ 46.8 46.7 46.7
Carbinol siloxane 5.2 5.1 5.1
Resin A(wt%) acid anhydride curing 48 48 48 agent(wt%) reactive UVA(wt%) - 0.2 normal type UVA(wt%) - - 0.2
The epoxy resin used herein is Bisphenol A Diglycidyl ether (NPEL-128E, purchased from Nan Ya Plastics Company), the Carbinol siloxane resin A is Silwet L-7608 (purchased 15 from GE Silicone Company), the acid anhydride curing agent used herein is methylhexahydrophthalic anhydride (MHHPA), the reactive UVA (UV absorber) used herein is SV8A (make by Everlight Chemical Industrial Corp.), and the normal type UVA used herein is EV81 (purchased from Everlight 20 Chemical Industrial Corp.).
Ccv??" CH2CH2COOH (chemical structure of SV8A) 13 HO V—
C&Q
^ CHaCHaCOOCgHn (chemical structure of EV81)
The resin mixtures were prepared similar to the procedure described in the Example 1, except the curing time was heated at 120°C for 2 hours and then heated at 140°C for 4 hour .
10 The films (thickness of 3mm) made from the example 4 are then placed in a QUV Accelerated Weathering Tester (Model QUV/SE with solar Eye Irradiance Control), and the testing conditions were temperature of 70°C; 340nm; and 1.35w/m2. A spectrophotometer (SPECTROPHOTOMETER CM-3500d 15 /MINOLTA) is used to measure the yellowness index (YI) for before and after the exposure of UV lights, in which AYI= YI/t-YI/to- Results are listed in table 4 below.
[Table 4] 168 hours 336 hours 168 hours 336 hours vt/ of light of light of light of light judg samples ii/to , expo- exposure exposure exposure ment ___sure/YI /YI__/ ΔΥΙ ' / ΔΥΙ__
E13 _ NOT
(blank) ?2 7.49 14.13 8.21 14.85 PASS
E14 (experi
ment , 0.57 1.63 2.52 1.06 1.95 PASS
group) E15
(con- · NOT
trol 0.68 2.37 3.80 1.69 3.12 PASS
group)_____ 20 14
In the above table 4, "NOT PASS" means ΔΥΙ value >3.00 after 336 hours of light exposure; "PASS" means ΔΥΙ value <3.00 after 336 hours of light exposure.
5 [Example 5] [Formulation for table 5] main components_ E17 E18 E16 (experi-
Samples (control (Blank) ment group) __group)__ epoxy resin (wt%) 4 6.8__46.6__46.6_
Carbinol siloxane 5.2 5.1 5.1
Resin A(wt%)_______ acid anhydride 48 48 48 curing agent(wt%)____ normal type ^ 0 0.2 0.2 UVA(wt%)____ reactive hindered amine light stabi- - 0.1 lizer (wt%)____ normal type hindered amine light - - 0.1 stabilizer (wt%)____
Using the similar procedure as described in Example 1, the effect of hindered amine light stabilizers were measured. 10 The reactive hindered amine light stabilizer in the present example is IA38 (purchased from Nantong City Zhenxing Fine Chemical Co.,Ltd., China, the normal type hindered amine light stabilizer is EV77 (purchased from Everlight Chemical Industrial Corp.). The measured ΔΥΙ values are as 15 shown in table 5 below.
-P co c co Φ c Ρ 0-1 en co co τί B co co p o c < 'I i 12 Dj O) ° ï p ra -P co ld
P 40 O M 00 LD LD
CD 3 & di>H · Γ-
CO O -Η X <3 «T
n £ H (1) \ H O rH
o ω υ u
P
ra -p co
P 43 O H rH 00 LD
OD 3 o a>c CM CM O
CD O -Η X <
H 3 H 4) M 00 O O
ÏÏ ° s rH £ ra -P ra oo P 43 o t—i σι o cd p ion Oh η · ^ σι OO O -Η X >h "sf
OO 43 <—i CU i—I t—I i—I
4H
°
>H
ra +j i \ p 43 O Φ σο r~ o co 3 !? ft M c’ σ uo
CD O -Η X P
γΗ43ΉΦΚ!0'00 o DJ
5 O' -=31 LD
\ . f"
M O
>J i O O
Ά
P
O — U Oh
Cn p
O
•P p c en Φ Ë rp
1 1 CO -—- *H O
c° Φ Ai P P
rH G Φ -P
® &, (Ö pj G
g ^r-ir-xoDO
rM CÖ rH £} rH φ tH O
co W—'W— w—' 16
In the above table 5, "NOT PASS" means ΔΥΙ value >3.00 after 336 hours of light exposure; "PASS" means ΔΥΙ value <3.00 after 336 hours of light exposure.
According to the results indicated in the above tables 4 and 5 5, it had shown that adding the UVA and hindered amine light stabilizer (HALS) with reactive group can achieve an excellent anti-yellowing efficiency. Although the present invention has been explained in relation to its preferred embodiment, it is to be understood that many other possible modifications and 10 variations can be made without departing from the scope of the invention as hereinafter claimed.
Claims (19)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL2005457A NL2005457C2 (en) | 2010-10-05 | 2010-10-05 | Silicone containing encapsulant. |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL2005457A NL2005457C2 (en) | 2010-10-05 | 2010-10-05 | Silicone containing encapsulant. |
| NL2005457 | 2010-10-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL2005457C2 true NL2005457C2 (en) | 2012-04-06 |
Family
ID=52023033
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL2005457A NL2005457C2 (en) | 2010-10-05 | 2010-10-05 | Silicone containing encapsulant. |
Country Status (1)
| Country | Link |
|---|---|
| NL (1) | NL2005457C2 (en) |
-
2010
- 2010-10-05 NL NL2005457A patent/NL2005457C2/en not_active IP Right Cessation
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