NL1037616C2 - Measuring system used for measuring the thickness and location of contact wires. - Google Patents
Measuring system used for measuring the thickness and location of contact wires. Download PDFInfo
- Publication number
- NL1037616C2 NL1037616C2 NL1037616A NL1037616A NL1037616C2 NL 1037616 C2 NL1037616 C2 NL 1037616C2 NL 1037616 A NL1037616 A NL 1037616A NL 1037616 A NL1037616 A NL 1037616A NL 1037616 C2 NL1037616 C2 NL 1037616C2
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- NL
- Netherlands
- Prior art keywords
- sensor
- optical path
- measuring
- axis
- light
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
- G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
Title: Measuring system used for measuring the thickness and location of contact wires
Field of the invention 5 The invention refers to a system for measuring or monitoring the size in one dimension (y) of at least one object located within an area extending along a second dimension (x) , the system comprising a sensor. The system may - not exclusively - be used for monitoring the thickness (height) and location of contact 10 wires of trains etc.
There are some problems to solve when looking for a system as indicated above: 15 - Preferably, several objects lying behind each other (spread over the x-axis) have to be measured individually; - Preferably, a near by and a far off object (or an object moving along the x-axis) has to be projected to the sensor 20 with the same magnification, so that their projections to the sensor reflect their real sizes (in the direction of the y-axis) without any need for scaling; - Preferably, the projection of the object to the sensor is 25 sharp at any position of the object on the x-axis; - Preferably, if the objects to be measured are illuminated, solely light which is reflected by the objects must be detected, excluding light which is reflected by e.g. the 30 object's background.
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Summary of the invention
The present invention aims to fill the needs as outlined above. According to the invention a system is presented for measuring or monitoring the size in one direction (y) of at least one 5 object located at or moving along a predetermined straight line (x), using optical transfer means and a sensor which is sensitive for light which is reflected by said at least one object, comprises one or any combination of next provisions: 10 - To provide that a near by and a far off object (or an object moving along the x-axis) will be projected to the sensor always having the same magnification, so that their projections to the sensor reflect their real sizes (in the direction of the y-axis) without any need for scaling, it 15 is preferred that optical path between the sensor and the object is a telecentric optical path. Such a telecentric optical path is defined as a path, comprising one or more lenses and/or mirrors, causing that the chief rays for all points across the object or image are collimated. For 20 example, telecentricity occurs when the chief rays are parallel to the optical axis, in object and/or image space. Another way of describing telecentricity is to state that the entrance pupil and/or exit pupil of the system is located at infinity.
25 - To be capable to detect several objects lying behind each other (spread over the x-axis) individually it is preferred that the optical path between the object (or objects) and the sensor is provided such that, in the plane through the 30 x-axis, the y-axis and the sensor, the (collimated) chief rays between the object and the sensor extend under an angle to the y-axis which is substantially unequal to zero: in other words, the chief rays from the object diverge from the x-axis.
3 - To provide that the projection of the object to the sensor is sharp at any position of the object on the x-axis, it is preferred to apply the "Scheimpflug"-principle. The 5 Scheimpflug principle is a geometric rule that describes the orientation of the plane of focus of an optical system (such as a camera) when the lens plane is not parallel to the image plane. It is commonly applied to the use of camera movements on a view camera. The principle is named 10 after Austrian army captain Theodor Scheimpflug, who used it in devising a systematic method and apparatus for correcting perspective distortion in aerial photographs (GB Patent No. 1196 and GB Patent No. 1139).
15 - It may be preferred that the object the height of which has to be measured, is illuminated by a source of visible or invisible (e.g. infrared or ultraviolet) light. To achieve that solely the light reflected by the object(s) is detected by the sensor, excluding light which may reflected 20 by e.g. the object's background or environment, the illumination is transferred via an optical path exclusively lying within a first plane, while the reflected light is transferred via an path which exclusively lies within a second plane, where both planes are placed such that their 25 intersection line coincides with said predetermined straight line (x) at which said at least one object is located or moving along.
Below a not restrictive, illustrated exemplary embodiment of the 30 invention will be discussed.
4
Exemplary Embodiment
Figure 1 shows schematically an exemplary embodiment of a preferred system according to the invention.
Figure 2 shows schematically the application of the 5 configuration shown in figure 1 for measuring the thickness of contact wires of trains etc.
In figure 1 a system is presented for measuring or monitoring the size s in one direction y of at least one object 1 located 10 at any position of or moving along a predetermined straight line x, using optical transfer means and a sensor 2 which is sensitive for light which is reflected by object 1. Figure 1 shows schematically the preferred provisions as outlined above.
15 To provide that a near by object 1 and a far off object 1' (or an object 1 moving along the x-axis) will be projected to the sensor 2 always having the same magnification, so that their projections to the sensor 2 reflect their real sizes (in the direction of the y-axis) without any need for scaling (e.g. in 20 additional processing means), in figure 1 the optical path between the sensor 2 and the object 1 is a telecentric optical path. Such a telecentric optical path is defined as a path, comprising one or more lenses and/or mirrors, causing that the chief rays for all points across the object or image are 25 collimated. As can be seen in figure 1, the telecentricity is achieved by providing, by means of the curved shape of a mirror 4 and/or the features of an objective 5, that the chief rays 6 are parallel to each other and the optical axis 7.
30 To be capable to detect several objects (e.g. 1 and 1') lying behind each other (spread over the x-axis) individually in figure 1 the optical path between the objects 1, 1' and the sensor 2 is provided such that, in the (detection) plane 3 through the x-axis, the y-axis and the sensor 2, the 5 (collimated) chief rays 6 between the objects 1, 1' and the sensor extend under angles a, a' to the x-axis which angles a, a' are substantially unequal to zero: in other words, the chief rays from the object diverge under an angle (viz. angels a, a') 5 from the x-axis.
To provide that the projection of the object 1 to the sensor 2 is sharp at any position of the object on the x-axis, the "Scheimpflug"-principle has been applied in the configuration of 10 figure 1: the detection plane of sensor 2 is not perpendicular to the optical axis 7.
In figure 1 the objects 1, 1' the height of which has to be measured, is illuminated by a source of visible or invisible 15 (e.g. infrared or ultraviolet) light, formed by a laser 8. To achieve that solely the light reflected by the object(s) is detected by the sensor, thereby excluding light which may reflected by e.g. the object's background or environment, the illumination is transferred via an optical path 9, provided by 20 the laser 8 and on optical slit 10, exclusively lying within an illumination plane 11. The reflected light - reflected by the illuminated object (s) 1, 1' - is transferred via a path which exclusively lies within a detection plane 3: stated more precisely, only reflections which are transferred via the 25 (narrow) optical path lying within plane 3, will be detected by sensor 2. Both planes 3 and 11 are placed such that their intersection line coincides with the straight line x at which the objects 1, 1' are located or moving along.
30 By the configuration shown in figure 1 all aims of this invention are met: - Several objects 1, 1' lying behind each other can be measured individually; 6 - Nearby and far-off objects 1, 1' are projected to the sensor with the same magnification; - The projections of the objects 1, 1' to the sensor are sharp at any position of the objects on the x-axis; 5 - Solely light which is reflected by the (illuminated) objects is detected, excluding any other light.
Figure 2 shows schematically a device for measuring the thickness of contact wires of trains etc., based on the 10 configuration as outlined in figure 1. In figure 2 the diameter of contact wires 12, 12' can be measured using the same configuration as outlined in figure 1. The complete configuration shown in figure 2 may - in the form of a well constructed and well accommodated measuring device - be mounted 15 underneath a measuring pantograph 13, mounted on an measuring rail vehicle. The (double) contact wires 12 are supported and guided by the pantograph 13, keeping the wires in any position along the x-axis.
20 As an example the contact wires 12 may have a square cross- section. The size Y, which is measured via the sensor 2, has a vertical component (the wire's height) and a horizontal component (the wire's width). When using rectangular or square wires, the wire wear manifests itself by a decrease of the 25 height, which will influence directly the value of Y. When using wires having e.g. a more or less round cross-section, the value of Y may not very much, but the war mainly will influence the horizontal component: wear will flatten the underside of the wire, resulting in an increase of the horizontal surface, which 30 - due to color and/or luminance differences compared with the remaining of the detected image.
The diameters of both contact wires 12, 12' - lying side by side (spread over the x-axis) - can be measured simultaneously due to 7 the fact that the rays 6 from both objects diverge under an angle (a, a') from the x-axis, as has been explained in the preceding.
1037616
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL1037616A NL1037616C2 (en) | 2010-01-08 | 2010-01-08 | Measuring system used for measuring the thickness and location of contact wires. |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL1037616 | 2010-01-08 | ||
NL1037616A NL1037616C2 (en) | 2010-01-08 | 2010-01-08 | Measuring system used for measuring the thickness and location of contact wires. |
Publications (1)
Publication Number | Publication Date |
---|---|
NL1037616C2 true NL1037616C2 (en) | 2011-07-11 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL1037616A NL1037616C2 (en) | 2010-01-08 | 2010-01-08 | Measuring system used for measuring the thickness and location of contact wires. |
Country Status (1)
Country | Link |
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NL (1) | NL1037616C2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL1040756A (en) * | 2014-04-07 | 2016-01-13 | Folkert Draaisma Ir | Instrument to measure the thickness and position of contact wires. |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009002172A1 (en) * | 2007-06-25 | 2008-12-31 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Measuring system |
-
2010
- 2010-01-08 NL NL1037616A patent/NL1037616C2/en not_active IP Right Cessation
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009002172A1 (en) * | 2007-06-25 | 2008-12-31 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Measuring system |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL1040756A (en) * | 2014-04-07 | 2016-01-13 | Folkert Draaisma Ir | Instrument to measure the thickness and position of contact wires. |
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V1 | Lapsed because of non-payment of the annual fee |
Effective date: 20130801 |