NL1037616C2 - Measuring system used for measuring the thickness and location of contact wires. - Google Patents

Measuring system used for measuring the thickness and location of contact wires. Download PDF

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Publication number
NL1037616C2
NL1037616C2 NL1037616A NL1037616A NL1037616C2 NL 1037616 C2 NL1037616 C2 NL 1037616C2 NL 1037616 A NL1037616 A NL 1037616A NL 1037616 A NL1037616 A NL 1037616A NL 1037616 C2 NL1037616 C2 NL 1037616C2
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NL
Netherlands
Prior art keywords
sensor
optical path
measuring
axis
light
Prior art date
Application number
NL1037616A
Other languages
Dutch (nl)
Inventor
Folker Draaisma
Vargas Raul Cruz
Original Assignee
Folker Draaisma
Vargas Raul Cruz
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Folker Draaisma, Vargas Raul Cruz filed Critical Folker Draaisma
Priority to NL1037616A priority Critical patent/NL1037616C2/en
Application granted granted Critical
Publication of NL1037616C2 publication Critical patent/NL1037616C2/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/08Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

Title: Measuring system used for measuring the thickness and location of contact wires
Field of the invention 5 The invention refers to a system for measuring or monitoring the size in one dimension (y) of at least one object located within an area extending along a second dimension (x) , the system comprising a sensor. The system may - not exclusively - be used for monitoring the thickness (height) and location of contact 10 wires of trains etc.
There are some problems to solve when looking for a system as indicated above: 15 - Preferably, several objects lying behind each other (spread over the x-axis) have to be measured individually; - Preferably, a near by and a far off object (or an object moving along the x-axis) has to be projected to the sensor 20 with the same magnification, so that their projections to the sensor reflect their real sizes (in the direction of the y-axis) without any need for scaling; - Preferably, the projection of the object to the sensor is 25 sharp at any position of the object on the x-axis; - Preferably, if the objects to be measured are illuminated, solely light which is reflected by the objects must be detected, excluding light which is reflected by e.g. the 30 object's background.
1037616 2
Summary of the invention
The present invention aims to fill the needs as outlined above. According to the invention a system is presented for measuring or monitoring the size in one direction (y) of at least one 5 object located at or moving along a predetermined straight line (x), using optical transfer means and a sensor which is sensitive for light which is reflected by said at least one object, comprises one or any combination of next provisions: 10 - To provide that a near by and a far off object (or an object moving along the x-axis) will be projected to the sensor always having the same magnification, so that their projections to the sensor reflect their real sizes (in the direction of the y-axis) without any need for scaling, it 15 is preferred that optical path between the sensor and the object is a telecentric optical path. Such a telecentric optical path is defined as a path, comprising one or more lenses and/or mirrors, causing that the chief rays for all points across the object or image are collimated. For 20 example, telecentricity occurs when the chief rays are parallel to the optical axis, in object and/or image space. Another way of describing telecentricity is to state that the entrance pupil and/or exit pupil of the system is located at infinity.
25 - To be capable to detect several objects lying behind each other (spread over the x-axis) individually it is preferred that the optical path between the object (or objects) and the sensor is provided such that, in the plane through the 30 x-axis, the y-axis and the sensor, the (collimated) chief rays between the object and the sensor extend under an angle to the y-axis which is substantially unequal to zero: in other words, the chief rays from the object diverge from the x-axis.
3 - To provide that the projection of the object to the sensor is sharp at any position of the object on the x-axis, it is preferred to apply the "Scheimpflug"-principle. The 5 Scheimpflug principle is a geometric rule that describes the orientation of the plane of focus of an optical system (such as a camera) when the lens plane is not parallel to the image plane. It is commonly applied to the use of camera movements on a view camera. The principle is named 10 after Austrian army captain Theodor Scheimpflug, who used it in devising a systematic method and apparatus for correcting perspective distortion in aerial photographs (GB Patent No. 1196 and GB Patent No. 1139).
15 - It may be preferred that the object the height of which has to be measured, is illuminated by a source of visible or invisible (e.g. infrared or ultraviolet) light. To achieve that solely the light reflected by the object(s) is detected by the sensor, excluding light which may reflected 20 by e.g. the object's background or environment, the illumination is transferred via an optical path exclusively lying within a first plane, while the reflected light is transferred via an path which exclusively lies within a second plane, where both planes are placed such that their 25 intersection line coincides with said predetermined straight line (x) at which said at least one object is located or moving along.
Below a not restrictive, illustrated exemplary embodiment of the 30 invention will be discussed.
4
Exemplary Embodiment
Figure 1 shows schematically an exemplary embodiment of a preferred system according to the invention.
Figure 2 shows schematically the application of the 5 configuration shown in figure 1 for measuring the thickness of contact wires of trains etc.
In figure 1 a system is presented for measuring or monitoring the size s in one direction y of at least one object 1 located 10 at any position of or moving along a predetermined straight line x, using optical transfer means and a sensor 2 which is sensitive for light which is reflected by object 1. Figure 1 shows schematically the preferred provisions as outlined above.
15 To provide that a near by object 1 and a far off object 1' (or an object 1 moving along the x-axis) will be projected to the sensor 2 always having the same magnification, so that their projections to the sensor 2 reflect their real sizes (in the direction of the y-axis) without any need for scaling (e.g. in 20 additional processing means), in figure 1 the optical path between the sensor 2 and the object 1 is a telecentric optical path. Such a telecentric optical path is defined as a path, comprising one or more lenses and/or mirrors, causing that the chief rays for all points across the object or image are 25 collimated. As can be seen in figure 1, the telecentricity is achieved by providing, by means of the curved shape of a mirror 4 and/or the features of an objective 5, that the chief rays 6 are parallel to each other and the optical axis 7.
30 To be capable to detect several objects (e.g. 1 and 1') lying behind each other (spread over the x-axis) individually in figure 1 the optical path between the objects 1, 1' and the sensor 2 is provided such that, in the (detection) plane 3 through the x-axis, the y-axis and the sensor 2, the 5 (collimated) chief rays 6 between the objects 1, 1' and the sensor extend under angles a, a' to the x-axis which angles a, a' are substantially unequal to zero: in other words, the chief rays from the object diverge under an angle (viz. angels a, a') 5 from the x-axis.
To provide that the projection of the object 1 to the sensor 2 is sharp at any position of the object on the x-axis, the "Scheimpflug"-principle has been applied in the configuration of 10 figure 1: the detection plane of sensor 2 is not perpendicular to the optical axis 7.
In figure 1 the objects 1, 1' the height of which has to be measured, is illuminated by a source of visible or invisible 15 (e.g. infrared or ultraviolet) light, formed by a laser 8. To achieve that solely the light reflected by the object(s) is detected by the sensor, thereby excluding light which may reflected by e.g. the object's background or environment, the illumination is transferred via an optical path 9, provided by 20 the laser 8 and on optical slit 10, exclusively lying within an illumination plane 11. The reflected light - reflected by the illuminated object (s) 1, 1' - is transferred via a path which exclusively lies within a detection plane 3: stated more precisely, only reflections which are transferred via the 25 (narrow) optical path lying within plane 3, will be detected by sensor 2. Both planes 3 and 11 are placed such that their intersection line coincides with the straight line x at which the objects 1, 1' are located or moving along.
30 By the configuration shown in figure 1 all aims of this invention are met: - Several objects 1, 1' lying behind each other can be measured individually; 6 - Nearby and far-off objects 1, 1' are projected to the sensor with the same magnification; - The projections of the objects 1, 1' to the sensor are sharp at any position of the objects on the x-axis; 5 - Solely light which is reflected by the (illuminated) objects is detected, excluding any other light.
Figure 2 shows schematically a device for measuring the thickness of contact wires of trains etc., based on the 10 configuration as outlined in figure 1. In figure 2 the diameter of contact wires 12, 12' can be measured using the same configuration as outlined in figure 1. The complete configuration shown in figure 2 may - in the form of a well constructed and well accommodated measuring device - be mounted 15 underneath a measuring pantograph 13, mounted on an measuring rail vehicle. The (double) contact wires 12 are supported and guided by the pantograph 13, keeping the wires in any position along the x-axis.
20 As an example the contact wires 12 may have a square cross- section. The size Y, which is measured via the sensor 2, has a vertical component (the wire's height) and a horizontal component (the wire's width). When using rectangular or square wires, the wire wear manifests itself by a decrease of the 25 height, which will influence directly the value of Y. When using wires having e.g. a more or less round cross-section, the value of Y may not very much, but the war mainly will influence the horizontal component: wear will flatten the underside of the wire, resulting in an increase of the horizontal surface, which 30 - due to color and/or luminance differences compared with the remaining of the detected image.
The diameters of both contact wires 12, 12' - lying side by side (spread over the x-axis) - can be measured simultaneously due to 7 the fact that the rays 6 from both objects diverge under an angle (a, a') from the x-axis, as has been explained in the preceding.
1037616

Claims (5)

1. Systeem voor het meten of controleren van de afmeting in één richting (y) van ten minste één object (1,1') gelegen 5 op of verplaatst langs een vooraf bepaalde rechte lijn (x), het systeem bestaande uit een beeldsensor (2) alsmede een lichtbron (8) voor de verlichting van ten minste een deel van ten minste één object (1,1') op een wijze die erin voorziet dat het licht van de lichtbron wordt overgedragen 10 via een eerste optische pad uitsluitend liggend in een eerste vlak (11), terwijl het licht dat wordt gereflecteerd door ten minste één object (1,1') wordt overgedragen via een tweede optische pad uitsluitend liggend in een tweede vlak (3), waarbij beide vlakken (3, 11) worden geplaatst 15 zodanig dat de gemeenschappelijke lijn van beide vlakken samenvalt met de vooraf bepaalde rechte lijn (x) waarop tenminste één object zich bevindt of zich langs verplaatst.A system for measuring or checking the unidirectional dimension (y) of at least one object (1,1 ') located on or displaced along a predetermined straight line (x), the system consisting of an image sensor ( 2) as well as a light source (8) for illuminating at least a part of at least one object (1,1 ') in a manner that provides that the light is transmitted from the light source via a first optical path lying exclusively in a first plane (11), while the light reflected from at least one object (1,1 ') is transmitted via a second optical path lying exclusively in a second plane (3), both planes (3, 11) being positioned so that the common line of both planes coincides with the predetermined straight line (x) on which at least one object is located or moves along. 2. Systeem volgens conclusie 1, waarbij het tweede optische pad, tussen de sensor (2) en ten minste één object (1,1'), 20 een telecentrisch optisch pad is.2. System as claimed in claim 1, wherein the second optical path, between the sensor (2) and at least one object (1,1 '), is a telecentric optical path. 3. Systeem volgens conclusie 1, waarbij het tweede optische pad, tussen de sensor (2) en ten minste één object (1,1'), zodanig is dat de optische as van het pad vanaf ten minste één object (1,1') afwijkt van de eerder genoemde vooraf 25 bepaalde rechte lijn (x).The system of claim 1, wherein the second optical path, between the sensor (2) and at least one object (1,1 '), is such that the optical axis of the path from at least one object (1,1') ) deviates from the aforementioned predetermined straight line (x). 4. Systeem volgens conclusie 1, waarbij de oriëntatie van het lichtgevoelige vlak van de sensor (2) in de richting van het optische pad in overeenstemming is met de "Scheimpflug"-regel.The system of claim 1, wherein the orientation of the photosensitive face of the sensor (2) in the direction of the optical path is in accordance with the "Scheimpflug" rule. 5. Systeem voor het meten van de dikte van de rijdraad (12) van treinen enz. Volgens ten minste één van de conclusies 1 - 4, waarin deze rijdraden worden geleid door een stroomafnemer (13) en de relevante systeemcomponenten zijn samen gebouwd en gemonteerd onder de stroomafnemer. 1037616A system for measuring the thickness of the contact wire (12) of trains, etc. According to at least one of claims 1 to 4, wherein said contact wires are guided by a pantograph (13) and the relevant system components are built and assembled together under the pantograph. 1037616
NL1037616A 2010-01-08 2010-01-08 Measuring system used for measuring the thickness and location of contact wires. NL1037616C2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
NL1037616A NL1037616C2 (en) 2010-01-08 2010-01-08 Measuring system used for measuring the thickness and location of contact wires.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL1037616 2010-01-08
NL1037616A NL1037616C2 (en) 2010-01-08 2010-01-08 Measuring system used for measuring the thickness and location of contact wires.

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NL1037616C2 true NL1037616C2 (en) 2011-07-11

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1040756A (en) * 2014-04-07 2016-01-13 Folkert Draaisma Ir Instrument to measure the thickness and position of contact wires.

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009002172A1 (en) * 2007-06-25 2008-12-31 Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno Measuring system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009002172A1 (en) * 2007-06-25 2008-12-31 Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno Measuring system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1040756A (en) * 2014-04-07 2016-01-13 Folkert Draaisma Ir Instrument to measure the thickness and position of contact wires.

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