NL1016473A1 - Device and method for adjusting a collimator. - Google Patents

Device and method for adjusting a collimator.

Info

Publication number
NL1016473A1
NL1016473A1 NL1016473A NL1016473A NL1016473A1 NL 1016473 A1 NL1016473 A1 NL 1016473A1 NL 1016473 A NL1016473 A NL 1016473A NL 1016473 A NL1016473 A NL 1016473A NL 1016473 A1 NL1016473 A1 NL 1016473A1
Authority
NL
Netherlands
Prior art keywords
collimator
adjusting
Prior art date
Application number
NL1016473A
Other languages
Dutch (nl)
Other versions
NL1016473C2 (en
Inventor
Martin Hartick
Frank Cordes
Original Assignee
Heimann Systems Gmbh & Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Heimann Systems Gmbh & Co filed Critical Heimann Systems Gmbh & Co
Publication of NL1016473A1 publication Critical patent/NL1016473A1/en
Application granted granted Critical
Publication of NL1016473C2 publication Critical patent/NL1016473C2/en

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
NL1016473A 1999-11-13 2000-10-24 Device and method for adjusting a collimator. NL1016473C2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE1999154661 DE19954661C2 (en) 1999-11-13 1999-11-13 Device and method for adjusting a collimator
DE19954661 1999-11-13

Publications (2)

Publication Number Publication Date
NL1016473A1 true NL1016473A1 (en) 2001-05-15
NL1016473C2 NL1016473C2 (en) 2004-06-18

Family

ID=7928936

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1016473A NL1016473C2 (en) 1999-11-13 2000-10-24 Device and method for adjusting a collimator.

Country Status (4)

Country Link
DE (1) DE19954661C2 (en)
FR (1) FR2801134B1 (en)
GB (1) GB2359717B (en)
NL (1) NL1016473C2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005011467B4 (en) * 2005-03-12 2008-02-28 Smiths Heimann Gmbh Adjustable focal length collimator, directed method and X-ray inspection system
GB0710579D0 (en) * 2007-06-02 2007-07-11 Univ Cranfield Detecion of x-ray scattering

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4203037A (en) * 1977-08-01 1980-05-13 University Of Pittsburgh Collimated radiation apparatus
DE3526015A1 (en) * 1985-07-20 1987-01-22 Philips Patentverwaltung METHOD FOR DETERMINING THE SPATIAL DISTRIBUTION OF THE SPREAD CROSS SECTIONS FOR ELASTICALLY SCREENED X-RAY RADIATION AND ARRANGEMENT FOR IMPLEMENTING THE METHOD
FR2612628B1 (en) * 1987-03-17 1993-09-10 Fondeur Bernard LASER INTERFEROMETRY MEASURING DEVICE
DE4130039A1 (en) * 1991-09-10 1993-03-11 Philips Patentverwaltung X=ray beam expander used in computer tomograph - has beam shaping aperture formed by confinement bodies
DE4137242A1 (en) * 1991-11-13 1993-05-19 Philips Patentverwaltung Spiral formed collimator for screening or X=ray radiation - having easy construction and giving improved spatial and angular resolution
JPH05215898A (en) * 1992-02-03 1993-08-27 Hitachi Ltd X-ray collimator
DE19510168C2 (en) * 1995-03-21 2001-09-13 Heimann Systems Gmbh & Co Method and device for determining crystalline and polycrystalline materials in an examination area
JP3635606B2 (en) * 1997-03-03 2005-04-06 株式会社リガク Collimator setting device
US5917880A (en) * 1997-05-29 1999-06-29 Eg&G Astrophysics X-ray inspection apparatus

Also Published As

Publication number Publication date
GB2359717B (en) 2003-10-08
FR2801134A1 (en) 2001-05-18
DE19954661C2 (en) 2001-12-06
NL1016473C2 (en) 2004-06-18
FR2801134B1 (en) 2005-03-11
GB2359717A (en) 2001-08-29
GB0027193D0 (en) 2000-12-27
DE19954661A1 (en) 2001-05-31

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Legal Events

Date Code Title Description
AD1A A request for search or an international type search has been filed
RD2N Patents in respect of which a decision has been taken or a report has been made (novelty report)

Effective date: 20040406

PD2B A search report has been drawn up
MK Patent expired because of reaching the maximum lifetime of a patent

Effective date: 20201023