NL1002280A1 - Verbeterde verbindingsklem met wiggen voor geïntegreerde schakelingen. - Google Patents

Verbeterde verbindingsklem met wiggen voor geïntegreerde schakelingen.

Info

Publication number
NL1002280A1
NL1002280A1 NL1002280A NL1002280A NL1002280A1 NL 1002280 A1 NL1002280 A1 NL 1002280A1 NL 1002280 A NL1002280 A NL 1002280A NL 1002280 A NL1002280 A NL 1002280A NL 1002280 A1 NL1002280 A1 NL 1002280A1
Authority
NL
Netherlands
Prior art keywords
wedges
connection terminal
integrated circuits
improved connection
improved
Prior art date
Application number
NL1002280A
Other languages
English (en)
Other versions
NL1002280C2 (nl
Inventor
Robert Hayes Wardwell
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of NL1002280A1 publication Critical patent/NL1002280A1/nl
Application granted granted Critical
Publication of NL1002280C2 publication Critical patent/NL1002280C2/nl

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R31/00—Coupling parts supported only by co-operation with counterpart
    • H01R31/06—Intermediate parts for linking two coupling parts, e.g. adapter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425—Test clips, e.g. for IC's
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
    • H01R4/28—Clamped connections, spring connections
    • H01R4/50—Clamped connections, spring connections utilising a cam, wedge, cone or ball also combined with a screw
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S439/00—Electrical connectors
    • Y10S439/912—Electrical connectors with testing means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Connecting Device With Holders (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
NL1002280A 1995-02-17 1996-02-08 Verbeterde verbindingsklem met wiggen voor geïntegreerde schakelingen. NL1002280C2 (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/390,194 US5507652A (en) 1995-02-17 1995-02-17 Wedge connector for integrated circuits
US39019495 1995-02-17

Publications (2)

Publication Number Publication Date
NL1002280A1 true NL1002280A1 (nl) 1996-08-22
NL1002280C2 NL1002280C2 (nl) 1998-04-22

Family

ID=23541490

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1002280A NL1002280C2 (nl) 1995-02-17 1996-02-08 Verbeterde verbindingsklem met wiggen voor geïntegreerde schakelingen.

Country Status (5)

Country Link
US (1) US5507652A (nl)
JP (1) JP3907731B2 (nl)
DE (1) DE19605630C2 (nl)
FR (1) FR2730862B1 (nl)
NL (1) NL1002280C2 (nl)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5923177A (en) * 1997-03-27 1999-07-13 Hewlett-Packard Company Portable wedge probe for perusing signals on the pins of an IC
US6411112B1 (en) * 1998-02-19 2002-06-25 International Business Machines Corporation Off-axis contact tip and dense packing design for a fine pitch probe
US6518780B1 (en) * 2000-07-31 2003-02-11 Lecroy Corporation Electrical test probe wedge tip
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
DE202004021093U1 (de) 2003-12-24 2006-09-28 Cascade Microtech, Inc., Beaverton Aktiver Halbleiterscheibenmessfühler
DE202005021435U1 (de) 2004-09-13 2008-02-28 Cascade Microtech, Inc., Beaverton Doppelseitige Prüfaufbauten
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
JP5584032B2 (ja) * 2010-07-12 2014-09-03 株式会社エンプラス 電気部品用ソケット
US9244099B2 (en) 2011-05-09 2016-01-26 Cascade Microtech, Inc. Probe head assemblies, components thereof, test systems including the same, and methods of operating the same

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1244572A (en) * 1969-05-23 1971-09-02 M E L Equipment Co Ltd Electrical probe
US5015946A (en) * 1990-02-26 1991-05-14 Tektronix, Inc. High density probe
US5314342A (en) * 1992-09-09 1994-05-24 Hewlett-Packard Company Universal probe adapter
US5345364A (en) * 1993-08-18 1994-09-06 Minnesota Mining And Manufacturing Company Edge-connecting printed circuit board
US5391082A (en) * 1993-10-26 1995-02-21 Airhart; Durwood Conductive wedges for interdigitating with adjacent legs of an IC or the like
US5463324A (en) * 1993-10-26 1995-10-31 Hewlett-Packard Company Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like
US5701086A (en) * 1993-10-26 1997-12-23 Hewlett-Packard Company Connecting test equipment to adjacent legs of an IC or the like by interdigitating conductive wedges with the legs

Also Published As

Publication number Publication date
FR2730862B1 (fr) 1999-01-29
DE19605630A1 (de) 1996-08-29
DE19605630C2 (de) 2000-03-09
JPH08292232A (ja) 1996-11-05
FR2730862A1 (fr) 1996-08-23
NL1002280C2 (nl) 1998-04-22
US5507652A (en) 1996-04-16
JP3907731B2 (ja) 2007-04-18

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Legal Events

Date Code Title Description
AD1A A request for search or an international type search has been filed
PD2B A search report has been drawn up
SD Assignments of patents

Owner name: AGILENT TECHNOLOGIES, INC A DELAWARE COMPANY

Owner name: HEWLETT-PACKARD COMPANY (A DELAWARE CORPORATION)

VD1 Lapsed due to non-payment of the annual fee

Effective date: 20030901