MY187303A - Ic handler - Google Patents
Ic handlerInfo
- Publication number
- MY187303A MY187303A MYPI2016702028A MYPI2016702028A MY187303A MY 187303 A MY187303 A MY 187303A MY PI2016702028 A MYPI2016702028 A MY PI2016702028A MY PI2016702028 A MYPI2016702028 A MY PI2016702028A MY 187303 A MY187303 A MY 187303A
- Authority
- MY
- Malaysia
- Prior art keywords
- contact head
- power
- movable arm
- ports
- supply
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
An IC handler (4) of the present invention is provided with: a contact head (7), which holds a plurality of IC devices, and which presses the IC devices to a plurality of sockets (3); and a movable arm (6) that moves the contact head (7). The movable arm (6) has power supply ports (VO, HO) that are connected to supply sources (VS, HS) of power for generating operations of the contact head (7), and the contact head (7) has a plurality of operating sections (70) that operate with the power, and a supporting section (71), which supports the operating sections (70), and which is removably attached to the movable arm (6). The supporting section (71) of the contact head (7) has: connecting ports (VC, HC) that are removably connected to the supply ports (VO, HO); and supply paths (71a, 71d) for supplying the power to the operating sections (70) from the connecting ports (VC, HC) connected to the supply ports (VO, HO). (Figure 4)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2013/082485 WO2015083240A1 (en) | 2013-12-03 | 2013-12-03 | Ic handler |
Publications (1)
Publication Number | Publication Date |
---|---|
MY187303A true MY187303A (en) | 2021-09-20 |
Family
ID=53273037
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MYPI2016702028A MY187303A (en) | 2013-12-03 | 2013-12-03 | Ic handler |
Country Status (6)
Country | Link |
---|---|
US (1) | US10473715B2 (en) |
JP (1) | JP6462586B2 (en) |
KR (1) | KR102069113B1 (en) |
CN (1) | CN105992955B (en) |
MY (1) | MY187303A (en) |
WO (1) | WO2015083240A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB201212629D0 (en) | 2012-07-16 | 2012-08-29 | Prec Engineering Technologies Ltd | A machine tool |
TWI761752B (en) * | 2020-01-15 | 2022-04-21 | 鴻勁精密股份有限公司 | The crimping mechanism for electronic component and the application thereof in the crimping device and in the testing classification equipment |
JP2022021241A (en) * | 2020-07-21 | 2022-02-02 | 株式会社アドバンテスト | Electronic component handling device and electronic component testing device |
TWI748577B (en) * | 2020-07-24 | 2021-12-01 | 鴻勁精密股份有限公司 | Detection unit for connecting apparatus and handler having the same |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3225227B2 (en) * | 1998-07-15 | 2001-11-05 | 株式会社しなのエレクトロニクス | IC test handler |
KR100709827B1 (en) * | 1999-01-13 | 2007-04-23 | 인테스트 아이피 코포레이션 | Test Head Manipulator |
US6888343B1 (en) * | 1999-01-13 | 2005-05-03 | Intest Ip Corporation | Test head manipulator |
US7409611B2 (en) * | 2003-06-27 | 2008-08-05 | Texas Instruments Incorporated | Wrapper instruction/data register controls from test access or wrapper ports |
DE112006000019T5 (en) | 2006-02-13 | 2008-07-24 | Advantest Corp. | Contact plunger, contact arm and tester for electronic components |
JP5202297B2 (en) * | 2006-03-02 | 2013-06-05 | 株式会社アドバンテスト | Moving device and electronic component testing device |
US20090018963A1 (en) * | 2007-07-10 | 2009-01-15 | Motorola, Inc. | System and method to re-sell digital content with advertisement |
JP5255403B2 (en) | 2008-10-30 | 2013-08-07 | 日本無線株式会社 | How to create a service plan |
JPWO2011007419A1 (en) * | 2009-07-14 | 2012-12-20 | 株式会社アドバンテスト | Electronic component pressing device, electronic component testing device, and interface device |
JP5375528B2 (en) * | 2009-10-30 | 2013-12-25 | セイコーエプソン株式会社 | Electronic component inspection equipment |
JP5942459B2 (en) * | 2012-02-14 | 2016-06-29 | セイコーエプソン株式会社 | Handler and parts inspection device |
MY190245A (en) * | 2013-12-03 | 2022-04-08 | Happyjapan Inc | Ic handler |
-
2013
- 2013-12-03 KR KR1020167016900A patent/KR102069113B1/en active IP Right Grant
- 2013-12-03 US US15/101,389 patent/US10473715B2/en active Active
- 2013-12-03 JP JP2015551319A patent/JP6462586B2/en active Active
- 2013-12-03 CN CN201380081369.3A patent/CN105992955B/en active Active
- 2013-12-03 MY MYPI2016702028A patent/MY187303A/en unknown
- 2013-12-03 WO PCT/JP2013/082485 patent/WO2015083240A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
KR102069113B1 (en) | 2020-01-22 |
CN105992955B (en) | 2019-06-18 |
US10473715B2 (en) | 2019-11-12 |
JP6462586B2 (en) | 2019-01-30 |
KR20160093033A (en) | 2016-08-05 |
WO2015083240A1 (en) | 2015-06-11 |
CN105992955A (en) | 2016-10-05 |
JPWO2015083240A1 (en) | 2017-03-16 |
US20160370424A1 (en) | 2016-12-22 |
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