MY159481A - Polishing composition - Google Patents

Polishing composition

Info

Publication number
MY159481A
MY159481A MYPI2012003494A MYPI2012003494A MY159481A MY 159481 A MY159481 A MY 159481A MY PI2012003494 A MYPI2012003494 A MY PI2012003494A MY PI2012003494 A MYPI2012003494 A MY PI2012003494A MY 159481 A MY159481 A MY 159481A
Authority
MY
Malaysia
Prior art keywords
electrolyte
polishing composition
salt
acid
polishing
Prior art date
Application number
MYPI2012003494A
Inventor
Rika Tanaka
Original Assignee
Nitta Haas Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitta Haas Inc filed Critical Nitta Haas Inc
Publication of MY159481A publication Critical patent/MY159481A/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • C09K3/1454Abrasive powders, suspensions and pastes for polishing
    • C09K3/1463Aqueous liquid suspensions
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C19/00Surface treatment of glass, not in the form of fibres or filaments, by mechanical means
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • C09G1/02Polishing compositions containing abrasives or grinding agents
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105After-treatment
    • H01L21/31051Planarisation of the insulating layers
    • H01L21/31053Planarisation of the insulating layers involving a dielectric removal step

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

A POLISHING COMPOSITION THAT IS CAPABLE OF ATTAINING A HIGH SiOx (0 < x ≤ 2) POLISHING RATE IS PROVIDED. THE POLISHING COMPOSITION CONTAINS COLLOIDAL SILICA AND AN ADDITIVE COMPOSED OF AN ELECTROLYTE OR A SALT OF THE ELECTROLYTE THAT RELEASES HYDROGEN IONS IN AN AQUEOUS SOLUTION. THE ELECTROLYTE IS COMPOSED OF SULFURIC ACID, PYROPHOSPHORIC ACID, PHOSPHORIC ACID, OR THE LIKE, AND THE SALT OF THE ELECTROLYTE IS COMPOSED OF AMMONIUM SULFATE OR THE LIKE. NO SUITABLE
MYPI2012003494A 2010-02-03 2011-01-28 Polishing composition MY159481A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010022411 2010-02-03

Publications (1)

Publication Number Publication Date
MY159481A true MY159481A (en) 2017-01-13

Family

ID=44355330

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2012003494A MY159481A (en) 2010-02-03 2011-01-28 Polishing composition

Country Status (5)

Country Link
JP (1) JP5132820B2 (en)
CN (1) CN102741370B (en)
MY (1) MY159481A (en)
TW (1) TWI537368B (en)
WO (1) WO2011096331A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103484024B (en) * 2013-09-13 2014-10-15 上海新安纳电子科技有限公司 Chemico-mechanical polishing liquid for silicon dioxide dielectric materials and preparing method thereof
JP6373029B2 (en) * 2014-03-27 2018-08-15 株式会社フジミインコーポレーテッド Polishing composition
JP7330668B2 (en) * 2018-03-08 2023-08-22 株式会社フジミインコーポレーテッド Surface treatment composition, method for producing surface treatment composition, method for surface treatment, and method for production of semiconductor substrate
JP7409918B2 (en) * 2020-03-13 2024-01-09 株式会社フジミインコーポレーテッド Polishing composition, method for producing polishing composition, polishing method, and method for producing semiconductor substrate

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101371853B1 (en) * 2005-01-05 2014-03-07 니타 하스 인코포레이티드 Polishing slurry
JP2007012679A (en) * 2005-06-28 2007-01-18 Asahi Glass Co Ltd Abrasive and manufacturing method of semiconductor integrated circuit device
JP2008124377A (en) * 2006-11-15 2008-05-29 Jsr Corp Aqueous dispersant for chemical-mechanical polishing, chemical-mechanical polishing method, and kit for preparing aqueous dispersant for chemical-mechanical polishing
JP2009164188A (en) * 2007-12-28 2009-07-23 Fujimi Inc Polishing composition

Also Published As

Publication number Publication date
TWI537368B (en) 2016-06-11
JP5132820B2 (en) 2013-01-30
JPWO2011096331A1 (en) 2013-06-10
CN102741370A (en) 2012-10-17
WO2011096331A1 (en) 2011-08-11
CN102741370B (en) 2015-10-14
TW201137099A (en) 2011-11-01

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