MY135978A - Polishing pad, conditioner and method for polishing the same - Google Patents
Polishing pad, conditioner and method for polishing the sameInfo
- Publication number
- MY135978A MY135978A MYPI20035022A MYPI20035022A MY135978A MY 135978 A MY135978 A MY 135978A MY PI20035022 A MYPI20035022 A MY PI20035022A MY PI20035022 A MYPI20035022 A MY PI20035022A MY 135978 A MY135978 A MY 135978A
- Authority
- MY
- Malaysia
- Prior art keywords
- polishing
- conditioner
- polishing pad
- same
- pad
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title abstract 7
- 238000000034 method Methods 0.000 title abstract 2
- 230000003750 conditioning effect Effects 0.000 abstract 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
THE PRESENT INVENTION RELATES TO A POLISHING PAD FOR PERFORMING EFFECTIVE POLISHING AND CONDITIONING IN A CHEMICAL MECHANICAL POLISHING (HEREINAFTER REFERRED TO AS 'CMP'), A CONDITIONER SUITABLE FOR THE POLISHING PAD, AND A CMP PROCESS USING THE POLISHING PAD AND THE CONDITIONER.(FIG 2)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20020085855 | 2002-12-28 | ||
KR1020030095949A KR100666726B1 (en) | 2002-12-28 | 2003-12-24 | CMP Process Conditioner and methods for polishing using the same |
Publications (1)
Publication Number | Publication Date |
---|---|
MY135978A true MY135978A (en) | 2008-07-31 |
Family
ID=32677805
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MYPI20035022A MY135978A (en) | 2002-12-28 | 2003-12-29 | Polishing pad, conditioner and method for polishing the same |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR100666726B1 (en) |
AU (1) | AU2003289525A1 (en) |
MY (1) | MY135978A (en) |
WO (1) | WO2004059715A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007521980A (en) | 2004-02-17 | 2007-08-09 | エスケーシー カンパニー リミテッド | Polishing pad base pad and multilayer pad including the same |
CN115594823A (en) * | 2022-10-12 | 2023-01-13 | 中环领先半导体材料有限公司(Cn) | Novel formula of notch polishing pad |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4591980B2 (en) * | 2000-02-22 | 2010-12-01 | 東洋ゴム工業株式会社 | Polishing pad and manufacturing method thereof |
JP2001246552A (en) * | 2000-03-02 | 2001-09-11 | Jsr Corp | Abrasive pad |
KR100770852B1 (en) * | 2000-05-27 | 2007-10-26 | 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스 인코포레이티드 | Grooved polishing pads for chemical mechanical planarization |
CN100496896C (en) * | 2000-12-01 | 2009-06-10 | 东洋橡膠工业株式会社 | Polishing pad |
-
2003
- 2003-12-24 KR KR1020030095949A patent/KR100666726B1/en active IP Right Grant
- 2003-12-24 AU AU2003289525A patent/AU2003289525A1/en not_active Abandoned
- 2003-12-24 WO PCT/KR2003/002830 patent/WO2004059715A1/en not_active Application Discontinuation
- 2003-12-29 MY MYPI20035022A patent/MY135978A/en unknown
Also Published As
Publication number | Publication date |
---|---|
KR100666726B1 (en) | 2007-01-09 |
KR20040060754A (en) | 2004-07-06 |
AU2003289525A1 (en) | 2004-07-22 |
WO2004059715A1 (en) | 2004-07-15 |
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