MY124576A - Integrated circuit inspection mechanism - Google Patents

Integrated circuit inspection mechanism

Info

Publication number
MY124576A
MY124576A MYPI9802747A MY124576A MY 124576 A MY124576 A MY 124576A MY PI9802747 A MYPI9802747 A MY PI9802747A MY 124576 A MY124576 A MY 124576A
Authority
MY
Malaysia
Prior art keywords
integrated circuit
inspecting
tray
inspection mechanism
circuit inspection
Prior art date
Application number
Inventor
Hsien-Yei Chen
Wen-Ming Wu
Chih-Ming Chen
Jeff C F Liu
Original Assignee
Ind Tech Res Inst
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ind Tech Res Inst filed Critical Ind Tech Res Inst
Publication of MY124576A publication Critical patent/MY124576A/en

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

AN INTEGRATED CIRCUIT INSPECTION MECHANISM IS PROVIDED FOR INSPECTING A PLURALITY OF INTEGRATED CIRCUITS LOADED IN A TRAY MOVED FROM A LOADING AREA OF THE INTEGRATED CIRCUIT INSPECTING MECHANISM TO AN UNLOADING AREA OF THE INTEGRATED CIRCUIT INSPECTION MECHANISM. THE MECHANISM INCLUDES A TRAY- TRANSPORTING DEVICE FOR TRANSPORTING THE TRAY FROM THE LOADING AREA TO THE UNLOADING AREA OF THE INTEGRATED CIRCUIT INSPECTION MECHANISM, AN INSPECTING DEVICE FOR INSPECTING EACH INTEGRATED CIRCUIT TO GENERATE AN INSPECTING SIGNAL, AN IC PICKING-AND- PLACING DEVICE FOR MOVING THE INTEGRATED CIRCUIT TO BE INSPECTED FROM THE TRAY TO THE INSPECTING DEVICE, AND THEN MOVING THE INSPECTED INTEGRATED CIRCUIT FROM THE INSPECTING DEVICE BACK TO THE TRAY, AND A SORTING DEVICE FOR REMOVING A REJECTED INTEGRATED CIRCUIT FROM THE TRAY ACCORDING TO THE INSPECTING SIGNAL.(FIG. 3)
MYPI9802747 1998-03-06 1998-06-18 Integrated circuit inspection mechanism MY124576A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW087203223U TW359416U (en) 1998-03-06 1998-03-06 Testing device for testing integrated circuit chip

Publications (1)

Publication Number Publication Date
MY124576A true MY124576A (en) 2006-06-30

Family

ID=47264491

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI9802747 MY124576A (en) 1998-03-06 1998-06-18 Integrated circuit inspection mechanism

Country Status (2)

Country Link
MY (1) MY124576A (en)
TW (1) TW359416U (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115684015A (en) * 2022-11-01 2023-02-03 江苏芯缘半导体有限公司 Chip appearance detection mechanism

Also Published As

Publication number Publication date
TW359416U (en) 1999-05-21

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