MXPA00004813A - Apparatus for testing multi-terminal electronic components - Google Patents

Abstract

To facilitate the testing of small electronic components, an improved test probe and transport wheel (8) assembly are disclosed. The basic form of the probe features a fixed support body (84) onto which a movable base (78) is secured by at least one resilient structure. Secured to the movable base (78) are a number of leads (66) that may be moved through complementary tunnels in a fixed guide block (94) toward the side-located terminals of an electronic component to be tested. The transport wheel (8) assembly includes a wheel (8) that has a number of peripherally-located compartments for receiving the electronic components. Each of the compartments includes a metal base. Also disclosed is a metal roller (96) that is designed to press on an end of a component during testing. The metal base of each compartment and the metal roller (96) facilitate electrical connection to the component's end-located terminals by side-located leads from the test probe.

Description

APPARATUS TO TEST ELECTRONIC COMPONENTS OF MULTIPLE TERMINALS Field of the Invention The invention is in the field of test equipment. More particularly, the invention comprises an apparatus designed to facilitate the testing of small electronic components. A single transport wheel and press apparatus are taught for use in a machine designed to test electronic components. The wheel and the press apparatus are designed to allow the testing of terminals placed on the end and / or side of the components. A single test probe is also taught and can be used in a similar way on a machine designed to test electronic components. The probe includes a plurality of conductors secured at one end to a movable base, elastically secured. The conductors extend through a stationary guide block that precisely guides the ends of the conductors towards the terminals placed on the side of the component to be tested and / or towards portions of the wheel and pressing apparatus.

Background of the Invention As electronic devices have become more common, the number of small electronic components requiring proof has dramatically increased. In response to this need, automated equipment capable of testing large quantities of electronic components at excessively high speeds has become commonplace. For example, there is equipment of this type capable of processing 50,000 electronic components per hour. In the testing of electronic components, certain problems are commonly experienced and often exacerbated by decreases in the size of the component to be tested. These problems have imposed significant limits on the maximum rate of component processing that can be achieved by prior art testing devices. One problem is with the internal transport mechanism of the test apparatus. The more high volume test moves the components to be tested from a feeding or loading station to a test station and then to a sorting station. The transport mechanism must not only be able to move the components in a highly precise and controlled manner, but must also be durable, relatively low cost and allow the test apparatus to achieve electrical contact with the terminals placed on the side and / or at the end of the component. This combination of attributes, in an optimal form, is not found in the prior art. A second problem is that many components have terminals located on the closely spaced side that need to be contacted simultaneously. This requires that the test probe have closely spaced conductors that are aligned with the terminals placed on the component side. The probe drivers must also be capable of fast and accurate movement. Additionally, the pressure applied by each conductor to a terminal of a component being tested must be controlled precisely since the pressure must be sufficient to obtain good contact while not being of a magnitude that causes scraping or other damage to the terminal. or the driver. The precise positioning and control necessary of the probe leads have been extremely difficult, if not impossible, to achieve in the prior art, and have severely limited the operation in prior art devices.

SUMMARY OF THE INVENTION The invention is a single transport wheel and a single test probe which are preferably used in a test apparatus for transporting and testing small electronic components such as Integrated Passive Components (IPCs). Examples of IPCs are pads that have dispositions of capacitor, inductor and varistor. The electronic components of these types typically vary in size from 1 mm to 3 mm in length by 0.5 mm to 1.5 mm in width or thickness and have terminals placed on end and / or on the side. The transport wheel has a large number of component receiving compartments (or recesses), slot-like, positioned peripherally, whereby each compartment is sized to receive only one of the electronic components that need to be transported. In the preferred use manner, a machine employing the transport wheel uses the wheel to carry each component of a loading station, to a test station, and then to a sorting area. In the classification area, the components are classified according to the results determined in the test station. At the bottom of each compartment on the transport wheel is a metal insert on which one end of the component rests during transport. The insert not only increases the durability of the wheel by providing a metal contact surface, but when the wheel is transporting electronic components that have terminals placed on the end, the insertion towards an electrical contact with a terminal placed at the bottom of the component . The exposed outer ends of the insert then provide metal areas placed on the side of the wheel that can be brought into contact with the test probe placed on the side of the test station so as to electrically connect a terminal placed at the bottom of the component to a test instrument. In the preferred embodiment, the transport wheel is used in a machine that has a specially designed test station. The test station includes a metal contact roller that rolls along the perimeter of the wheel, and whenever the roller passes over one of the compartments, the roller will press down on the upper or outer end of any electronic component that It is placed inside the compartment. When the roller presses down on the component, it improves contact between the terminal placed on the bottom of the component and the metal insert of the wheel.

Additionally, the metal roller will contact the terminal placed on the top of the component, and thus allow electrical contact with the terminal through the body of the metal roller. The probe assembly of the invention includes multiple test leads that are accurately placed and controlled. When used in a test machine employing a transport wheel, the probe will preferably have identical left-right portions with the conductors of each portion placed on each side of the transport wheel. The probe is mounted on a support structure and each set of conductors is secured to an elastically supported movable base. A force application device, preferably controlled by a computer, is used to apply pressure to the base to cause controlled movement of the associated conductors. Each set of assemblies extends through a stationary guide block that precisely guides the conductors to the terminals of the component to be tested. When used with the transport wheel and the metallic contact roller described above, the probe may include additional conductors that are guided to contact one or both sides of the metal insert of the wheel and one or both sides of the contact roller . In this way, the probe can make electrical contact with both of the terminals placed on the end of the component. The probe assembly is compact, low in weight, requires little maintenance, is self-adjusting in view of the computer control of the movement of the force application device, and is not excessively expensive to manufacture. In addition, the design of the probe allows the drivers to move quickly and are spaced extremely narrowly.

BRIEF DESCRIPTION OF THE DRAWING Figure 1 is a front view of an electronic component testing and classification apparatus having a transport wheel and test probe in accordance with the invention. Figure 2 is a top view of the apparatus shown in Figure 1. Figure 3 is a front view of an electronic component placed in one of the compartments of the transport wheel at a point just before entering the test station. Figure 4 is a rear view of the transport wheel. Figure 5 shows a first step in the manufacture of the crown portion of the transport wheel. Figure 6 shows a second step in the manufacture of the crown portion of the transport wheel. Figure 7 shows a third step in the manufacture of the crown portion of the transport wheel. Figure 8 shows a final step in the manufacture of a crown portion of the transport wheel. Figure 9 provides a detailed side view of a test probe according to the invention. The probe is shown in a position where the probe leads have not yet extended into contact with an electronic component for testing. Figure 10 shows the probe of Figure 9 at a point where the probe leads have been extended to make contact with an electronic component for testing.

Detailed Description of the Drawings Referring now to the drawings in greater detail, where similar reference characters refer to equal parts in all the various figures, an apparatus for testing and sorting small electronic components is shown by number 1. Figure 1 provides a front view of the apparatus 1. The apparatus includes a feeding station 2, a test station 4, a sorting station 6 and a transport wheel 8. In practice, each of the stations and the transport wheel are all combined into a single cabinet type unit (the cabinet not shown). The feeding station 2 includes a funnel-like hopper 10 into which the small electronic components 12 (also referred to herein as "parts") are poured in bulk quantities. Small electronic components will typically be Integrated Passive Components (IPCs) such as capacitors, varistors and inducers of tablet. The hopper is emptied into a transfer apparatus 14 which includes a vibration unit (not shown) which facilitates the separation of the parts and their movement along the ramp 16. The ramp is emptied into a spout 18 which is designed for retaining a relatively small number of the parts 12. Once in the dispenser, the parts can exit therefrom through an outlet formed by an opening 20 (note figure 2) in its bottom portion. The spout includes a sweeper wheel 22 that functions to prevent the parts from escaping from the end of the spout and also helps maintain the parts toward the left side portion of the spout. As each part 12 leaves the spout 18, it is received directly into a complementary-sized two-sided compartment 24, placed on the crown of the transport wheel 8. An illustration of a part loaded towards the crown of the transport wheel is provided in Figure 3. It should be noted that the part includes terminals 26 positioned on the side and terminals 28 positioned at the end. Figure 4 provides a rear view of the transport wheel 8. The wheel includes a metal hub 30 and a circular portion in the shape of a crown member 32. The crown member is preferably approximately 30.48 to 45.72 centimeters in diameter and is removable from the metal hub through the use of conventional fasteners, such as screws or bolts 34. The crown member 32 is preferably made of a plastic material rigid and non-conductive. All compartments 24 are positioned in the crown member and create peripheral openings in the outer edge of the member. As will be described shortly, the base of each compartment includes a metal insert 36. With the removable crown member 32 of the hub 30, a user can separate a crown member and replace it with another crown member having compartments 24 differently sized to fit a different size of electronic component. The hub 30 has a pulley 38 fixed to its rear surface and connected by the belt 40 (shown in Figure 1) to an electric motor 42. The electric motor is responsible for causing the rotation of the wheel. Figures 5-8 provide detailed views showing how the crown member 32 is fabricated. Figure 5 shows a portion of the crown member when the member is at an early stage in its manufacture. At this point, the crown member is in the shape of a simple ring. If a cross-section were taken through the portion shown in Figure 5, it would be seen that the portion has a rectangular cross-section which preferably has dimensions of about 6 mm wide by about 15 mm high. Figure 6 shows the same portion of the crown member as shown in Figures 5 and 6.

However, the upper portion 46 of the crown member has been machined to have a thickness of slightly less than 2.5 mm. The machined upper portion extends approximately 6 mm from the top of the crown member to a point at or near the center of the metal inserts / adjustment screws 36. A plurality of holes 48 can also be drilled towards the crown member at this time to allow connection of the crown member to the hub 32 with fasteners 34. Figure 8 shows the same portion of the crown member as shown in the three previous figures . In the last machining step, a plurality of cuts 50 is made in the upper portion 46 of the crown member. These cuts are centered in, and extend partially through, the adjustment screws and form the compartments 24. The width of each cut is slightly greater than the width or thickness of an electronic component that will be received in the resulting compartment 24. Once the cuts have been made, a through hole or narrow tunnel 52 is drilled towards the center of the metal insert and continued down until it extends completely through the crown member. The through hole 52 allows a vacuum to be applied to the bottom of each compartment 24 from a conventional vacuum apparatus (not shown) through an adapter 54 shown in Figures 1, 2, 9 and 10. Vacuum application to the compartment 24 serves the purpose of helping to hold a part 12 in the compartment as the wheel rotates. It should also be noted in Figure 8 that the side portions 56 of the metal insert / adjustment screw are positioned on the sides of the crown member and are exposed just below the associated compartment 24. As a result, the side portions 56 are easily accessible from the sides of the wheel. As noted above, Figure 3 shows an electronic component 12 placed in one of the compartments 24 of the wheel, Figure 3 shows the part 12 just before the part enters the test station 4. It is at the test station that the conductors of a test probe are placed temporarily in contact, either directly or indirectly, with the terminals of component 12. The various portions of the test station are detailed in figures 9 to 11. The test station includes a test probe 60 having portions 62 and 64 on the right and left sides. Each portion includes a plurality of conductors 66. While each of the side portions is shown to have five conductors, a greater or lesser number of conductors may be employed in each of the lateral portions. It should be noted that in some cases, the probe 60 may include only one of the portions 62 or 64. Each conductor 66 is made of a conductive material, is regularly rigid and may be in the form of an inexpensive wire or pin. The external end 68 of each conductor is preferably flat and is adapted to contact a terminal of a part to be tested. The opposite end 70 of each conductor is electrically connected to a flexible wire 72 which itself is connected to a test instrument 74, such as an oscilloscope, logic analyzer, emulator or other well-known diagnostic or testing apparatus. A clamp 76, or other conventional fastener or fastening method, is employed to secure the end portion 70 of each conductor to a movable base 78. It should be noted that the upper and lower conductors 66 are shown having an arched shape in the base while the other conductors are shown straight. The bending of the rear portion of the upper and lower conductors increases the space available for anchoring the conductors, while at the same time allowing a narrow spacing of the conductors as they extend outward from the base. The curved portion of each of the upper and lower conductors is restricted in position by the posts 79 extending upwardly from the surface of the base 78. Depending on the availability of space, the probe can be manufactured with all conductors being straight or, if space availability is severely limited, more conductors could have the rear portions arcuately configured in the same way as the upper and lower conductors shown and secure in position with additional posts 79. Each of the bases 78 is movably secured to a relatively non-movable support body in the form of base plate 80. The plate is secured by fasteners 82 to a fixed structure such as the stationary frame 84 of the machine. The structure used to movably fix each base to the plate 80 allows an elastic movement of the base. In the preferred embodiment, the fixing structure is in the form of two thin metal leaf springs 86. Even when two leaf springs are shown, a single spring or a number of springs greater than two can be used alternatively. It should also be noted that while the use of leaf springs is shown, other equivalent elastic structures, such as other types of springs, including coil springs, or even an elastic material such as rubber, may alternatively be employed. In addition, a damper apparatus (not shown) such as a hydraulic cylinder or soft cushion member may be employed adjacent to the rest position of one or both bases to dampen any undesired oscillation of the base or bases. Placed adjacent to each base 78 and non-movably secured to the base plate 80 is a force application device 88. 1 device 88 is shown having a piston 90 which is capable of applying pressure to the side of the movable base 78 and in this way causing the base to move towards the wheel 8. 1 actuation of the device 88 is through wires 91 and preference is caused by the test instrument 74 or by a computer (not shown) that may be included with or separate from the test device. In the preferred embodiment, the device 88 is electrically activated and may be in the form of a linear actuator, solenoid or other device, or combination of devices or elements, capable of applying a force to the base 78 elements, capable of applying a force to the base 78 movable. As an alternative embodiment that is not shown, the force application device can be mechanically operated and moved in steps with the movement of the wheel 8. Also in the preferred embodiment, the distance in which the piston 90 moves is also controlled by the test instrument / computer. This allows the probe to adjust automatically, whereby the test instrument / computer can change the distance that the conductors move through the force application device 88 to compensate for changes due to wear of the conductors or portions 12 dimensioned in a different way From the base 78, each conductor 66 extends through the through hole or tunnel 92 in a guide block 94. The guide block includes a plurality of through holes 92, with an intermediate portion of each conductor positioned within one of the through bores. In the preferred embodiment, the length of each through hole is two or more times greater than its diameter. This improves the steering guidance provided to each driver by the through holes. Each guide block 94 is fixedly secured to the base plate 80 of the probe and spaced from the base 78 nearby. Since the guide blocks are fixed, they do not move when the bases 78 are moved. It should be noted that even though all the conductors are shown extending through the guide block, this is not required. In an alternative mode that is not shown, some of the conductors may derive the guide block. Placed in line with the perimeter of the crown member 32 is located a presser that includes a contact roller 96. The roller is made of an electrically conductive metal material and is rotatable on an axis 97 which is secured to the base plate 80 (or alternatively to the machine frame) through spring supports 98. The spring supports are preferably conventional in design and may resemble pogo pins used in prior art testing devices. The supports 98 are variable in length and include springs that continually deflect or drive the supports to their maximum length. As the wheel rotates, the spring supports continuously drive the roller towards the crown member 32 whereby the roller rolls, and at the same time, presses on the perimeter of the crown member. Figure 3 shows the roller contacting the end of one of the tooth-shaped portions 99 of the crown member. As the wheel continues to rotate from the position shown in Figure 3, the roller rolls out of the tooth-like portion 99 of the crown member and toward the outer end of the component 12. Once the roller is fully pressing on component 12, the part is ready for testing and is in the position shown in figure 9, The downward force exerted by the roller on the component 12 pushed the component strongly against the surface of the metal insert 36 and in this way ensures good contact between terminal 28 located at the bottom of the component and the metal insert. In addition, the roller pressing down on the component 12 creates good contact between the terminal 28 positioned on the top of the component and the surface of the roller. This allows the conductors 66 of the probe to make electrical contact with the terminal 28 located on top of the component by pressing against one or both sides of the roller. In the figures, the conductors are shown making contact with both sides of the roller. In operation, when a part 12 is brought to the test station to be tested and placed properly between the right and left portions of the probe, an electrical signal is sent by the control computer to both of the application devices 88 of force. Each device 88 will then apply pressure to the side of the adjacent movable base 78 and cause the base to move toward the wheel 8. In the preferred embodiment, the bases will only move a short distance, such as 1 mm (the distances shown are exaggerated). in the figures). As the bases move towards the part to be tested, the conductors fixed to the bases move through the through holes in the guide blocks and in this way they are pointed precisely so that their ends can be adjusted. make precise contact with the side terminals of the part to be tested, as well as to the exposed external side portions 56 of the metal insert 36 placed at the base of each compartment 24 and the sides of the metal roll 96. Figure 10 shows the point where the force application devices 88 have caused a predetermined amount of movement of the bases 78 and the ends 68 of the conductors to contact the terminals of the part, as well as the side portions 56 of the metal insert and the sides of the metal roller 96. You can then start the part test.

Once the part 12 test has been completed, the pistons 90 of the force application devices 88 are retracted. The leaf springs 86 then cause the bases 78, and the conductors fixed to the bases, to return to their initial position shown in Figure 9. The wheel 8 will then turn and cause the roller 96 to roll out of the end of the part 12. The rotation of the wheel will continue until the next part 12 is brought to the test station. Eventually, the rotation of the wheel will take the tested part to the sorting station 6. The sorting station 6 is conventional in design and includes a block 100 which houses a series of electrically operated solenoid valves (not shown). Each valve is connected to a source of pressurized air through the hose 102, and when it is opened, it can direct pressurized air towards one of the compartments 24. Aligned with the compartments and the valves is a plurality of tubes 104, with each tube being specific to the position of one of the compartments 24 and extending to its own dedicated part receiving hopper 106. After a part 12 has been tested in the test station, its test results are stored temporarily by the test instrument. The test instrument is connected to the solenoid valves so that, based on the test results determined in the test station, when a part 12 reaches an appropriate position, it will be aligned with a particular one of the valves. The valve is opened by the test instrument and pressurized air is then directed from the valve to the compartment 24 which is adjacent to the valve. This forces the part 12 to be pushed into the adjacent tube 104 and then into the appropriate receiving hopper 106. Even though the probe 60 has been taught as used within the test station of the test and classification machine described herein, it should be noted that the probe can be used in any other type of machine or environment in which a probe is used. electric Similarly, the taught transport wheel 8 and / or the metal contact roller can be employed in electronic part testing devices other than that shown, and used with other types of test probes than shown. The embodiments described herein have been discussed with the purpose of familiarizing the reader with the novel aspects of the invention. Although the preferred embodiments of the invention have been shown and described, many changes, modifications and substitutions can be made by one having ordinary skill in the art without necessarily abandoning the spirit and scope of the invention as described in the following claims.

Claims (22)

1. - A probe designed to be used in the testing of electronic components, wherein the probe can be operatively connected as a test instrument, the probe comprising: a support body; a base movably secured to the support body; a plurality of electrically conductive elongated conductors secured to the base and operatively connected to a test instrument, and wherein at least one of the conductors has an end portion adapted to contact a terminal of an electronic component to be tested.; a guide block secured to the support body and having at least one through hole, wherein at least one of the conductors extends through and is movable within at least one through hole; and a force application device that is capable of causing the movement of the base, wherein when an electronic component is placed in a predetermined position relative to the guide block, an actuator will cause the force application device to move the base and in this way it causes the conductors secured to the base to move towards the component, and the at least one through hole will guide an associated one of the conductors towards a terminal of the electronic component.

2. The probe according to claim 1, wherein the base is secured to the support body by an elastic structure.

3. The probe according to claim 2, wherein the elastic structure is in the form of at least one leaf spring.

4. The probe according to claim 1, wherein the guide block has a plurality of through-bores, wherein each of the conductors extends through a different one of the through-bores.

5. The probe according to claim 1, wherein the force application device is in the form of an electrically operated solenoid.

6. The probe according to claim 1, wherein the actuator is in the form of a computer.

7. The probe according to claim 1, further comprising: a second base movably secured to the support body; a plurality of electrically conductive elongated conductors secured to the second base and operatively connected to the test instrument, and wherein at least one of the conductors has an end portion adapted to contact a terminal of an electronic component to be tested.; a second guide block secured to the support body and having at least one through hole, wherein at least one of the conductors secured to the second base extends through and is movable within the at least one through hole; and a force application device which, when an electronic component is placed at a predetermined position relative to the second guide block, will be actuated by an actuator and will cause movement of the second base so that the conductors secured to the second base move towards the electronic component.

8. A transport wheel adapted for use in a device for testing electronic components, wherein the transport wheel functions to carry the electronic components from a feeding station where the components are loaded to the transport wheel, and then to a test station wherein the components are tested, the wheel comprising: a circular portion made of a non-conductive material, wherein the circular portion includes a plurality of compartments that are each sized to receive an electronic component to be tested; and a plurality of metal members, wherein each metal member forms a base portion of each compartment and is capable of contacting a terminal end of an electronic component when the component is placed in a compartment on the metal member, wherein each of the metal members includes at least one side portion that is accessible from a point exterior to a first side of the circular portion.

9. The transport wheel according to claim 8, wherein the metal member is secured to the circular portion by a plurality of wires placed in the central portion of the member.

10. The transport wheel according to claim 8, wherein each of the compartments is capable of being connected to a vacuum source through a through hole that extends through the metal member associated with the compartment and continues through the non-conductive material of the circular portion.

11. A method for manufacturing a transport wheel adapted to be used in a device for testing electronic components, wherein the transport wheel functions to carry the electronic components from a feeding station where the components are loaded to the transport wheel , to a test station where the components are tested, the method comprising: fabricating a circular member of a non-conductive material; making a plurality of through holes in the circular member, wherein the through holes are evenly spaced around the circular member; placing each of a plurality of metal members toward each of a plurality of through holes; machining a perimeter portion of the circular member to reduce a thickness dimension of the perimeter portion; and, making a plurality of slots uniformly spaced in the perimeter portion, wherein the slots are positioned whereby one of the metal members forms a base portion of each slot.

12. The method according to claim 11, wherein the metal member is positioned so that it is accessible from at least one side of the circular member.

13. The method according to claim 11, wherein each of the metal members has external threads and wherein the insertion of each metal member toward the circular member is achieved by rotating the metal member so that its threads engage a inner surface of the associated through hole in the circular member.

14. The method according to claim 11, wherein after making the slots, a through hole is drilled through each of the metal members and is continued through the non-conductive material of the circular member.

15. A device for testing electronic components, the device comprising: a feeding station adapted to receive bulk quantities of electronic components and then dispatch the components through an outlet; a transport wheel, the transport wheel having a plurality of compartments peripherally placed, spaced apart, adapted to receive electronic components from the outlet of the feeding station, wherein each compartment is open on two opposite sides and where a portion base of each compartment includes a metal area capable of contacting a terminal placed at the end of an electronic component when the component is placed in the compartment, wherein the metal area includes a portion exposed on at least one side of the wheel; a test station including a probe having a plurality of movable conductors, wherein the conductors are capable of contacting a plurality of terminals placed on the side of an electronic component when the component is placed in a compartment of the transport wheel near the probe; a test apparatus operatively connected to the probe of the test station; and, wherein when an electronic component is placed in one of the compartments of the transport wheel, it can be transported from the feeding station to the test station.

16. The device according to claim 15, wherein the probe includes: a support body; a base movably secured to the support body; the plurality of movable conductors, wherein each conductor is elongated, made of an electrically conductive material, and is secured to the base and operatively connected to the test apparatus, and wherein at least one of the conductors has an end portion adapted to make contact with a terminal of an electronic component that is to be tested; a guide block secured to the support body and having a plurality of through-bores through which a plurality of the conductors extend and are movable therein; and a force application device capable of causing the movement of the base when an electronic component is placed in a predetermined position relative to the guide block, wherein the movement of the base causes a corresponding movement of the insured conductors to the base , and wherein a plurality of the conductors are guided in their movement by the through holes in the guide block.

17. The device according to claim 16, wherein an elastic structure connects the base of the probe to the support body of the probe.

18. The device according to claim 15, further comprising a pressing apparatus, wherein when an electronic component is placed in the test station with a lower end of the component placed on the metal area of the compartment, the pressing apparatus works to press down on an upper end of the component.

19. The device according to claim 18, wherein the pressing apparatus includes a roller that rolls along a peripheral portion of the transport wheel, and wherein the roller is secured to the device by at least one member of the transport wheel. spring support that deflects the roller towards the peripheral portion of the transport wheel.

20. The device according to claim 19, wherein the roller is made of an electrically conductive metallic material.

21. The device according to claim 20, wherein the probe includes conductors that are placed whereby when an electronic component is in the test station and placed for testing, at least one conductor from the probe will make contact with the probe. metallic area of the compartment in which the component is placed, and at least one other conductor of the probe will contact one side of the roller.

22. The device according to claim 21, wherein the probe includes: a support body; a base movably secured to the support body; the plurality of movable conductors, wherein each conductor is elongated, is made of an electrically conductive material, and is secured to the base and operatively connected to the test apparatus, and wherein at least one of the conductors has an adapted end portion. to make contact with a terminal of an electronic component to be tested; a guide block secured to the support body and having a plurality of through-bores through which a plurality of the conductors extend and are movable therein; and a force application device capable of causing the movement of the base when an electronic component is placed in a predetermined position relative to the guide block, wherein the movement of the base causes a corresponding movement of the insured conductors to the base , and wherein a plurality of the conductors are guided in their movement by the through holes in the guide block.