MX9100590A - Sistema de interferometria de efecto muare - Google Patents

Sistema de interferometria de efecto muare

Info

Publication number
MX9100590A
MX9100590A MX9100590A MX9100590A MX9100590A MX 9100590 A MX9100590 A MX 9100590A MX 9100590 A MX9100590 A MX 9100590A MX 9100590 A MX9100590 A MX 9100590A MX 9100590 A MX9100590 A MX 9100590A
Authority
MX
Mexico
Prior art keywords
muare
effect
interferometry system
interferometry
muare effect
Prior art date
Application number
MX9100590A
Other languages
English (en)
Inventor
Albert John Boehnlein
Original Assignee
Ind Technology Inst
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ind Technology Inst filed Critical Ind Technology Inst
Publication of MX9100590A publication Critical patent/MX9100590A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
MX9100590A 1990-08-08 1991-08-08 Sistema de interferometria de efecto muare MX9100590A (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/564,104 US5069548A (en) 1990-08-08 1990-08-08 Field shift moire system

Publications (1)

Publication Number Publication Date
MX9100590A true MX9100590A (es) 1992-04-01

Family

ID=24253169

Family Applications (1)

Application Number Title Priority Date Filing Date
MX9100590A MX9100590A (es) 1990-08-08 1991-08-08 Sistema de interferometria de efecto muare

Country Status (4)

Country Link
US (1) US5069548A (es)
EP (1) EP0470816A1 (es)
CA (1) CA2048358A1 (es)
MX (1) MX9100590A (es)

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US5636025A (en) * 1992-04-23 1997-06-03 Medar, Inc. System for optically measuring the surface contour of a part using more fringe techniques
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US5646733A (en) * 1996-01-29 1997-07-08 Medar, Inc. Scanning phase measuring method and system for an object at a vision station
US5779965A (en) * 1996-02-20 1998-07-14 Kimberly-Clark Worldwide, Inc. Double nip embossing
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AU6464698A (en) 1997-03-21 1998-10-20 Kimberly-Clark Worldwide, Inc. Dual-zoned absorbent webs
US5990377A (en) * 1997-03-21 1999-11-23 Kimberly-Clark Worldwide, Inc. Dual-zoned absorbent webs
US5944273A (en) * 1997-07-03 1999-08-31 Kimberly-Clark Worldwide, Inc. Parent roll for tissue paper
US6438272B1 (en) 1997-12-31 2002-08-20 The Research Foundation Of State University Of Ny Method and apparatus for three dimensional surface contouring using a digital video projection system
US6497801B1 (en) 1998-07-10 2002-12-24 Semitool Inc Electroplating apparatus with segmented anode array
US7020537B2 (en) 1999-04-13 2006-03-28 Semitool, Inc. Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece
US7189318B2 (en) 1999-04-13 2007-03-13 Semitool, Inc. Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece
US6916412B2 (en) 1999-04-13 2005-07-12 Semitool, Inc. Adaptable electrochemical processing chamber
US6788210B1 (en) 1999-09-16 2004-09-07 The Research Foundation Of State University Of New York Method and apparatus for three dimensional surface contouring and ranging using a digital video projection system
US6268923B1 (en) 1999-10-07 2001-07-31 Integral Vision, Inc. Optical method and system for measuring three-dimensional surface topography of an object having a surface contour
US6593705B1 (en) 2000-01-07 2003-07-15 Cyberoptics Corporation Rapid-firing flashlamp discharge circuit
JP2003527582A (ja) 2000-01-07 2003-09-16 サイバーオプティクス コーポレーション テレセントリック・プロジェクタを有する位相プロフィル測定システム
US6549647B1 (en) 2000-01-07 2003-04-15 Cyberoptics Corporation Inspection system with vibration resistant video capture
US6639685B1 (en) 2000-02-25 2003-10-28 General Motors Corporation Image processing method using phase-shifted fringe patterns and curve fitting
KR100965955B1 (ko) 2000-11-14 2010-06-24 킴벌리-클라크 월드와이드, 인크. 개선된 다층 티슈 제품
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US6746570B2 (en) 2001-11-02 2004-06-08 Kimberly-Clark Worldwide, Inc. Absorbent tissue products having visually discernable background texture
US6790314B2 (en) 2001-11-02 2004-09-14 Kimberly-Clark Worldwide, Inc. Fabric for use in the manufacture of tissue products having visually discernable background texture regions bordered by curvilinear decorative elements and method thereof
US6787000B2 (en) 2001-11-02 2004-09-07 Kimberly-Clark Worldwide, Inc. Fabric comprising nonwoven elements for use in the manufacture of tissue products having visually discernable background texture regions bordered by curvilinear decorative elements and method thereof
US6821385B2 (en) 2001-11-02 2004-11-23 Kimberly-Clark Worldwide, Inc. Method of manufacture of tissue products having visually discernable background texture regions bordered by curvilinear decorative elements using fabrics comprising nonwoven elements
US6749719B2 (en) 2001-11-02 2004-06-15 Kimberly-Clark Worldwide, Inc. Method of manufacture tissue products having visually discernable background texture regions bordered by curvilinear decorative elements
US7799968B2 (en) 2001-12-21 2010-09-21 Kimberly-Clark Worldwide, Inc. Sponge-like pad comprising paper layers and method of manufacture
US6649025B2 (en) 2001-12-31 2003-11-18 Kimberly-Clark Worldwide, Inc. Multiple ply paper wiping product having a soft side and a textured side
US7994079B2 (en) 2002-12-17 2011-08-09 Kimberly-Clark Worldwide, Inc. Meltblown scrubbing product
US6875315B2 (en) 2002-12-19 2005-04-05 Kimberly-Clark Worldwide, Inc. Non-woven through air dryer and transfer fabrics for tissue making
US6878238B2 (en) * 2002-12-19 2005-04-12 Kimberly-Clark Worldwide, Inc. Non-woven through air dryer and transfer fabrics for tissue making
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US7303650B2 (en) * 2003-12-31 2007-12-04 Kimberly-Clark Worldwide, Inc. Splittable cloth like tissue webs
US7557932B2 (en) * 2005-04-19 2009-07-07 Texas Instruments Incorporated Characterization of micromirror array devices using interferometers
US20060232784A1 (en) * 2005-04-19 2006-10-19 Regis Grasser Interferometers of high resolutions
US7630085B2 (en) * 2005-04-19 2009-12-08 Texas Instruments Incorporated Interferometers of high resolutions
US7489408B2 (en) * 2005-11-15 2009-02-10 General Electric Company Optical edge break gage
US7499830B2 (en) * 2005-11-15 2009-03-03 General Electric Company Computer-implemented techniques and system for characterizing geometric parameters of an edge break in a machined part
WO2008086016A1 (en) * 2007-01-10 2008-07-17 Cyberoptics Corporation Inspection system
US8059280B2 (en) 2008-01-31 2011-11-15 Cyberoptics Corporation Method for three-dimensional imaging using multi-phase structured light
US7812968B2 (en) * 2008-03-05 2010-10-12 Ge Inspection Technologies, Lp Fringe projection system and method for a probe using a coherent fiber bundle
US7969583B2 (en) * 2008-03-05 2011-06-28 General Electric Company System and method to determine an object distance from a reference point to a point on the object surface
US8422030B2 (en) * 2008-03-05 2013-04-16 General Electric Company Fringe projection system with intensity modulating by columns of a plurality of grating elements
US7821649B2 (en) 2008-03-05 2010-10-26 Ge Inspection Technologies, Lp Fringe projection system and method for a probe suitable for phase-shift analysis
US8107083B2 (en) * 2008-03-05 2012-01-31 General Electric Company System aspects for a probe system that utilizes structured-light
FR2960059B1 (fr) * 2010-05-11 2012-12-28 Visuol Technologies Installation de controle de la qualite d'une surface d'un objet
US8786300B2 (en) * 2012-02-07 2014-07-22 General Electric Company Probe assembly and methods for use in inspecting a component
TWI464369B (zh) * 2012-02-29 2014-12-11 Univ Feng Chia And a method and a method for detecting three-dimensional surface profile and optical grade surface roughness at the same time
US10126252B2 (en) 2013-04-29 2018-11-13 Cyberoptics Corporation Enhanced illumination control for three-dimensional imaging
KR101613829B1 (ko) * 2014-05-08 2016-04-20 조춘식 미분 모아레를 이용한 3차원 형상 측정방법 및 장치
CN106840036B (zh) * 2016-12-30 2019-10-01 浙江四点灵机器人股份有限公司 一种适用于快速三维形貌测量的二元结构光优化方法
CN109767490B (zh) * 2019-03-05 2023-07-18 盎锐（上海）信息科技有限公司 用于投影光栅建模的影像分析系统及方法

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US4212073A (en) * 1978-12-13 1980-07-08 Balasubramanian N Method and system for surface contouring
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US4564295A (en) * 1983-03-07 1986-01-14 New York Institute Of Technology Apparatus and method for projection moire topography
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US4794550A (en) * 1986-10-15 1988-12-27 Eastman Kodak Company Extended-range moire contouring

Also Published As

Publication number Publication date
EP0470816A1 (en) 1992-02-12
CA2048358A1 (en) 1992-02-09
US5069548A (en) 1991-12-03

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