MX384348B - Unidades principal y remota de fase coherente de un analizador de redes. - Google Patents

Unidades principal y remota de fase coherente de un analizador de redes.

Info

Publication number
MX384348B
MX384348B MX2018000709A MX2018000709A MX384348B MX 384348 B MX384348 B MX 384348B MX 2018000709 A MX2018000709 A MX 2018000709A MX 2018000709 A MX2018000709 A MX 2018000709A MX 384348 B MX384348 B MX 384348B
Authority
MX
Mexico
Prior art keywords
signal data
device under
under test
signals
test
Prior art date
Application number
MX2018000709A
Other languages
English (en)
Other versions
MX2018000709A (es
Inventor
Jeffrey S Bottman
Theodore J Brillhart
William F Winston
Original Assignee
Fluke Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fluke Corp filed Critical Fluke Corp
Publication of MX2018000709A publication Critical patent/MX2018000709A/es
Publication of MX384348B publication Critical patent/MX384348B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
    • G01R31/086—Locating faults in cables, transmission lines, or networks according to type of conductors in power transmission or distribution networks, i.e. with interconnected conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Data Exchanges In Wide-Area Networks (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

Un analizador de redes incluye una unidad principal y una unidad remota físicamente separada. En al menos una configuración, la unidad principal genera y transmite señales de prueba a través de un dispositivo bajo prueba a la unidad remota. Los circuitos de referencia de la unidad principal usan señales procedentes de un oscilador local y de un reloj de muestreo del ADC analógico-digital para producir datos de señal de referencia representativos de las señales de prueba transmitidas al dispositivo bajo prueba. El sistema de circuitos de recepción de la unidad remota produce datos de señal recibida representativos de las señales de prueba recibidas desde el dispositivo bajo prueba, con el uso de las mismas señales procedentes del oscilador local y del reloj de muestreo del ADC que usa el sistema de circuitos de referencia para producir los datos de señal de referencia. La comparación de los datos de señal recibida con los datos de señal de referencia indica parámetros del dispositivo bajo prueba, que incluyen la atenuación y el desplazamiento de fase en las señales de prueba que provoca el dispositivo bajo prueba.
MX2018000709A 2017-01-17 2018-01-17 Unidades principal y remota de fase coherente de un analizador de redes. MX384348B (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201762447302P 2017-01-17 2017-01-17

Publications (2)

Publication Number Publication Date
MX2018000709A MX2018000709A (es) 2018-11-09
MX384348B true MX384348B (es) 2025-03-14

Family

ID=62840720

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2018000709A MX384348B (es) 2017-01-17 2018-01-17 Unidades principal y remota de fase coherente de un analizador de redes.

Country Status (3)

Country Link
US (1) US10534027B2 (es)
CN (1) CN108333469B (es)
MX (1) MX384348B (es)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11041894B2 (en) 2017-08-18 2021-06-22 Rohde & Schwarz Gmbh & Co. Kg Vector network analyzer with digital interface
CN111141992B (zh) * 2019-10-12 2022-01-18 国网湖北省电力有限公司荆门供电公司 利用ftu遥信和遥测数据的自适应分层区段定位方法
CN112763888A (zh) * 2019-11-04 2021-05-07 中兴通讯股份有限公司 链路的检测方法及装置、电子设备、计算机可读介质
EP4281791B1 (en) 2021-01-21 2025-02-26 National Instruments Ireland Resources, Ltd. Measurement system for characterizing a device under test
CN116183973B (zh) * 2022-12-29 2025-10-17 中电科思仪科技股份有限公司 一种微波集成电路散射参数快速测试评估电路及评估方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100486972B1 (ko) * 2002-07-09 2005-05-03 신용준 시간-주파수 영역 반사파 처리 방법
US7894354B2 (en) * 2002-10-04 2011-02-22 Jds Uniphase Corporation System and method to monitor RTP streams using RTCP SR/RR packet information
US7239150B2 (en) * 2003-10-24 2007-07-03 Troxler Electronic Laboratories, Inc. Pavement material microwave density measurement methods and apparatuses
CN101858940B (zh) * 2009-04-07 2012-09-19 中茂电子(深圳)有限公司 输出阻抗测量方法及装置
US8165030B2 (en) * 2009-04-30 2012-04-24 Avaya Inc. System and method for monitoring a network communication at multiple network layers
CN101701988B (zh) * 2009-11-12 2012-01-04 中国电子科技集团公司第四十一研究所 一体化便携式多通道相位相干信号分析仪
WO2012033769A1 (en) * 2010-09-06 2012-03-15 Psiber Data Pte. Ltd. System and apparatus for testing cable

Also Published As

Publication number Publication date
CN108333469B (zh) 2022-04-26
CN108333469A (zh) 2018-07-27
US20180203050A1 (en) 2018-07-19
US10534027B2 (en) 2020-01-14
MX2018000709A (es) 2018-11-09

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