MX2018000709A - Unidades principal y remota de fase coherente de un analizador de redes. - Google Patents
Unidades principal y remota de fase coherente de un analizador de redes.Info
- Publication number
- MX2018000709A MX2018000709A MX2018000709A MX2018000709A MX2018000709A MX 2018000709 A MX2018000709 A MX 2018000709A MX 2018000709 A MX2018000709 A MX 2018000709A MX 2018000709 A MX2018000709 A MX 2018000709A MX 2018000709 A MX2018000709 A MX 2018000709A
- Authority
- MX
- Mexico
- Prior art keywords
- signal data
- device under
- under test
- signals
- test
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
- G01R31/086—Locating faults in cables, transmission lines, or networks according to type of conductors in power transmission or distribution networks, i.e. with interconnected conductors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
- G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
- G01R31/3191—Calibration
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Tests Of Electronic Circuits (AREA)
- Data Exchanges In Wide-Area Networks (AREA)
Abstract
Un analizador de redes incluye una unidad principal y una unidad remota físicamente separada. En al menos una configuración, la unidad principal genera y transmite señales de prueba a través de un dispositivo bajo prueba a la unidad remota. Los circuitos de referencia de la unidad principal usan señales procedentes de un oscilador local y de un reloj de muestreo del ADC analógico-digital para producir datos de señal de referencia representativos de las señales de prueba transmitidas al dispositivo bajo prueba. El sistema de circuitos de recepción de la unidad remota produce datos de señal recibida representativos de las señales de prueba recibidas desde el dispositivo bajo prueba, con el uso de las mismas señales procedentes del oscilador local y del reloj de muestreo del ADC que usa el sistema de circuitos de referencia para producir los datos de señal de referencia. La comparación de los datos de señal recibida con los datos de señal de referencia indica parámetros del dispositivo bajo prueba, que incluyen la atenuación y el desplazamiento de fase en las señales de prueba que provoca el dispositivo bajo prueba.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762447302P | 2017-01-17 | 2017-01-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
MX2018000709A true MX2018000709A (es) | 2018-11-09 |
Family
ID=62840720
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2018000709A MX2018000709A (es) | 2017-01-17 | 2018-01-17 | Unidades principal y remota de fase coherente de un analizador de redes. |
Country Status (3)
Country | Link |
---|---|
US (1) | US10534027B2 (es) |
CN (1) | CN108333469B (es) |
MX (1) | MX2018000709A (es) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11041894B2 (en) | 2017-08-18 | 2021-06-22 | Rohde & Schwarz Gmbh & Co. Kg | Vector network analyzer with digital interface |
CN111141992B (zh) * | 2019-10-12 | 2022-01-18 | 国网湖北省电力有限公司荆门供电公司 | 利用ftu遥信和遥测数据的自适应分层区段定位方法 |
US11644505B2 (en) | 2021-01-21 | 2023-05-09 | National Instruments Ireland Resources Limited | Measurement system for characterizing a device under test |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100486972B1 (ko) * | 2002-07-09 | 2005-05-03 | 신용준 | 시간-주파수 영역 반사파 처리 방법 |
US7894354B2 (en) * | 2002-10-04 | 2011-02-22 | Jds Uniphase Corporation | System and method to monitor RTP streams using RTCP SR/RR packet information |
EP2345890A3 (en) * | 2003-10-24 | 2012-10-03 | Troxler Electronic Laboratories, Inc. | Pavement material microwave density measurement methods and apparatuses |
CN101858940B (zh) * | 2009-04-07 | 2012-09-19 | 中茂电子(深圳)有限公司 | 输出阻抗测量方法及装置 |
US8165030B2 (en) * | 2009-04-30 | 2012-04-24 | Avaya Inc. | System and method for monitoring a network communication at multiple network layers |
CN101701988B (zh) * | 2009-11-12 | 2012-01-04 | 中国电子科技集团公司第四十一研究所 | 一体化便携式多通道相位相干信号分析仪 |
WO2012033769A1 (en) * | 2010-09-06 | 2012-03-15 | Psiber Data Pte. Ltd. | System and apparatus for testing cable |
-
2018
- 2018-01-16 US US15/872,544 patent/US10534027B2/en active Active
- 2018-01-17 MX MX2018000709A patent/MX2018000709A/es unknown
- 2018-01-17 CN CN201810044309.9A patent/CN108333469B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN108333469A (zh) | 2018-07-27 |
CN108333469B (zh) | 2022-04-26 |
US20180203050A1 (en) | 2018-07-19 |
US10534027B2 (en) | 2020-01-14 |
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