MX359718B - Sistemas y metodos para mejorar la fidelidad del espectro optico en elementos informaticos integrados. - Google Patents
Sistemas y metodos para mejorar la fidelidad del espectro optico en elementos informaticos integrados.Info
- Publication number
- MX359718B MX359718B MX2016006627A MX2016006627A MX359718B MX 359718 B MX359718 B MX 359718B MX 2016006627 A MX2016006627 A MX 2016006627A MX 2016006627 A MX2016006627 A MX 2016006627A MX 359718 B MX359718 B MX 359718B
- Authority
- MX
- Mexico
- Prior art keywords
- optical spectrum
- systems
- methods
- integrated computational
- fidelity
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 8
- 238000001228 spectrum Methods 0.000 title abstract 8
- 238000000034 method Methods 0.000 title abstract 5
- 238000011065 in-situ storage Methods 0.000 abstract 2
- 238000004519 manufacturing process Methods 0.000 abstract 2
- 239000000470 constituent Substances 0.000 abstract 1
- 239000012530 fluid Substances 0.000 abstract 1
- 239000000126 substance Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
- C23C14/545—Controlling the film thickness or evaporation rate using measurement on deposited material
- C23C14/547—Controlling the film thickness or evaporation rate using measurement on deposited material using optical methods
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/28—Vacuum evaporation by wave energy or particle radiation
- C23C14/30—Vacuum evaporation by wave energy or particle radiation by electron bombardment
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- E—FIXED CONSTRUCTIONS
- E21—EARTH OR ROCK DRILLING; MINING
- E21B—EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
- E21B49/00—Testing the nature of borehole walls; Formation testing; Methods or apparatus for obtaining samples of soil or well fluids, specially adapted to earth drilling or wells
- E21B49/08—Obtaining fluid samples or testing fluids, in boreholes or wells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0683—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating measurement during deposition or removal of the layer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/26—Oils; Viscous liquids; Paints; Inks
- G01N33/28—Oils, i.e. hydrocarbon liquids
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/281—Interference filters designed for the infrared light
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/285—Interference filters comprising deposited thin solid films
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N2021/4126—Index of thin films
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Optics & Photonics (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Mining & Mineral Resources (AREA)
- Geology (AREA)
- Medicinal Chemistry (AREA)
- Food Science & Technology (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- General Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Toxicology (AREA)
- Environmental & Geological Engineering (AREA)
- Fluid Mechanics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Mathematical Physics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Lasers (AREA)
Abstract
Se describen sistemas y métodos para mejorar la fidelidad del espectro óptico de un elemento informático integrado fabricado en un sustrato. El elemento informático integrado está configurado para, al finalizar, procesar un espectro óptico que representa un constituyente químico de un fluido de producción de un pozo. Los sistemas y métodos miden in situ un grosor, un índice complejo de refracción, o ambos de una película formada durante la fabricación para generar un espectro óptico previsto. El espectro óptico previsto se compara con un espectro óptico objetivo. Las revisiones a un diseño del elemento informático integrado se llevan a cabo in situ para mejorar la fidelidad del espectro óptico respecto al espectro óptico objetivo. Se presentan otros sistemas y métodos.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2013/077569 WO2015099671A1 (en) | 2013-12-23 | 2013-12-23 | Systems and methods to improve optical spectrum fidelity in integrated computational elements |
Publications (2)
Publication Number | Publication Date |
---|---|
MX2016006627A MX2016006627A (es) | 2016-11-29 |
MX359718B true MX359718B (es) | 2018-10-08 |
Family
ID=53479346
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2016006627A MX359718B (es) | 2013-12-23 | 2013-12-23 | Sistemas y metodos para mejorar la fidelidad del espectro optico en elementos informaticos integrados. |
Country Status (4)
Country | Link |
---|---|
US (1) | US10774418B2 (es) |
EP (1) | EP3055645A4 (es) |
MX (1) | MX359718B (es) |
WO (1) | WO2015099671A1 (es) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015099706A1 (en) | 2013-12-24 | 2015-07-02 | Halliburton Energy Services, Inc. | Adjusting fabrication of integrated computational elements |
US10496776B2 (en) | 2013-12-24 | 2019-12-03 | Halliburton Energy Services, Inc. | Fabrication of critical layers of integrated computational elements |
WO2015163875A1 (en) * | 2014-04-24 | 2015-10-29 | Halliburton Energy Services, Inc. | Engineering the optical properties of an integrated computational element by ion implantation |
US10317337B2 (en) | 2016-05-27 | 2019-06-11 | Halliburton Energy Services, Inc. | Reverse design technique for optical processing elements |
CN109477211B (zh) * | 2016-07-13 | 2022-01-14 | 瑞士艾发科技 | 宽带光学监控 |
DE102019205217A1 (de) * | 2019-04-11 | 2020-10-15 | Robert Bosch Gmbh | Verfahren zum Aufbringen einer Filterschicht auf einen Kristallkörper |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5144498A (en) * | 1990-02-14 | 1992-09-01 | Hewlett-Packard Company | Variable wavelength light filter and sensor system |
US6503578B1 (en) * | 2000-05-05 | 2003-01-07 | National Science Council | Method for preparing ZnSe thin films by ion-assisted continuous wave CO2 laser deposition |
US7138156B1 (en) * | 2000-09-26 | 2006-11-21 | Myrick Michael L | Filter design algorithm for multi-variate optical computing |
US6587264B2 (en) * | 2001-01-18 | 2003-07-01 | Thermo Corion Corporation | Selectively tuned ultraviolet optical filters and methods of use thereof |
US6798499B2 (en) | 2001-07-18 | 2004-09-28 | Alps Electric Co., Ltd. | Method of forming optical thin films on substrate at high accuracy and apparatus therefor |
JP2004537750A (ja) * | 2001-08-02 | 2004-12-16 | アイギス セミコンダクター インコーポレイテッド | 同調可能な光学機器 |
WO2003034106A1 (fr) * | 2001-10-18 | 2003-04-24 | Bridgestone Corporation | Element optique et procede de production de cet element, filtre passe bande, filtre de coupure des ondes proche infrarouge et film anti-reflexion |
US7794798B2 (en) * | 2007-09-29 | 2010-09-14 | Tel Epion Inc. | Method for depositing films using gas cluster ion beam processing |
US7835005B2 (en) * | 2008-02-21 | 2010-11-16 | Thermo Fisher Scientific Inc. | Gas analyzer system |
US8918198B2 (en) | 2009-01-21 | 2014-12-23 | George Atanasoff | Methods and systems for control of a surface modification process |
SG192120A1 (en) | 2011-02-11 | 2013-08-30 | Halliburton Energy Serv Inc | Method for fabrication of a multivariate optical element |
US8879053B2 (en) | 2012-04-26 | 2014-11-04 | Halliburton Energy Services, Inc. | Devices having an integrated computational element and a proximal interferent monitor and methods for determining a characteristic of a sample therewith |
US8780352B2 (en) * | 2012-04-26 | 2014-07-15 | Halliburton Energy Services, Inc. | Methods and devices for optically determining a characteristic of a substance |
US8575541B1 (en) * | 2012-12-13 | 2013-11-05 | Halliburton Energy Services, Inc. | Systems and methods for real time monitoring and management of wellbore servicing fluids |
-
2013
- 2013-12-23 WO PCT/US2013/077569 patent/WO2015099671A1/en active Application Filing
- 2013-12-23 EP EP13897690.7A patent/EP3055645A4/en not_active Withdrawn
- 2013-12-23 US US14/440,504 patent/US10774418B2/en active Active
- 2013-12-23 MX MX2016006627A patent/MX359718B/es active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
EP3055645A1 (en) | 2016-08-17 |
MX2016006627A (es) | 2016-11-29 |
US20160289821A1 (en) | 2016-10-06 |
US10774418B2 (en) | 2020-09-15 |
WO2015099671A1 (en) | 2015-07-02 |
EP3055645A4 (en) | 2016-10-05 |
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Legal Events
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FG | Grant or registration |