MX2016003585A - Low-dose radiographic inspection system. - Google Patents

Low-dose radiographic inspection system.

Info

Publication number
MX2016003585A
MX2016003585A MX2016003585A MX2016003585A MX2016003585A MX 2016003585 A MX2016003585 A MX 2016003585A MX 2016003585 A MX2016003585 A MX 2016003585A MX 2016003585 A MX2016003585 A MX 2016003585A MX 2016003585 A MX2016003585 A MX 2016003585A
Authority
MX
Mexico
Prior art keywords
electron beam
pulse
inspection system
magnetic elements
low
Prior art date
Application number
MX2016003585A
Other languages
Spanish (es)
Other versions
MX364668B (en
Inventor
Bendahan Joseph
Strellis Dan
Gozani Tsahi
King Michael
Franco Edward
Johannes Gerhardus Langeveld Willem
R Alfonso Krystal
Original Assignee
Rapiscan Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rapiscan Systems Inc filed Critical Rapiscan Systems Inc
Publication of MX2016003585A publication Critical patent/MX2016003585A/en
Publication of MX364668B publication Critical patent/MX364668B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/086—Target geometry

Landscapes

  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

An inspection system for scanning cargo and vehicles is described which employs an X- ray source that includes an electron beam generator, for generating an electron beam; an accelerator for accelerating said electron beam in a first direction; and, a first set of magnetic elements for transporting said electron beam into a magnetic field created by a second set of magnetic elements, wherein the magnetic field created by said second set of magnetic elements causes said electron beam to strike a target such that the target substantially only generates X- rays focused toward a high density section in the scanned object, which is estimated in a second pulse using image data captured by a detector array in a first pulse. The electron beam direction is optimized by said X-ray source during said second pulse to focus X-rays towards said high density section based on said image data in said first pulse.
MX2016003585A 2013-09-19 2014-09-19 Low-dose radiographic inspection system. MX364668B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361880159P 2013-09-19 2013-09-19
PCT/US2014/056652 WO2015105541A1 (en) 2013-09-19 2014-09-19 Low-dose radiographic inspection system

Publications (2)

Publication Number Publication Date
MX2016003585A true MX2016003585A (en) 2016-09-13
MX364668B MX364668B (en) 2019-05-03

Family

ID=53524236

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2016003585A MX364668B (en) 2013-09-19 2014-09-19 Low-dose radiographic inspection system.

Country Status (2)

Country Link
MX (1) MX364668B (en)
WO (1) WO2015105541A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2014268284A1 (en) * 2014-11-30 2016-06-16 Southern Innovation International Pty Ltd Method and apparatus for material identification
CN106024560B (en) * 2016-07-22 2017-07-18 中国工程物理研究院电子工程研究所 A kind of ray tube
CN111694046B (en) * 2020-07-24 2022-06-07 中国工程物理研究院核物理与化学研究所 Single-energy gamma device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4639928B2 (en) * 2005-04-26 2011-02-23 三菱電機株式会社 Electromagnetic wave generator
US7839979B2 (en) * 2006-10-13 2010-11-23 Koninklijke Philips Electronics N.V. Electron optical apparatus, X-ray emitting device and method of producing an electron beam
US7639785B2 (en) * 2007-02-21 2009-12-29 L-3 Communications Corporation Compact scanned electron-beam x-ray source

Also Published As

Publication number Publication date
MX364668B (en) 2019-05-03
WO2015105541A1 (en) 2015-07-16

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