MD3897F1 - Process for measuring the section of an insulated wire in the casting process - Google Patents
Process for measuring the section of an insulated wire in the casting processInfo
- Publication number
- MD3897F1 MD3897F1 MDA20070269A MD20070269A MD3897F1 MD 3897 F1 MD3897 F1 MD 3897F1 MD A20070269 A MDA20070269 A MD A20070269A MD 20070269 A MD20070269 A MD 20070269A MD 3897 F1 MD3897 F1 MD 3897F1
- Authority
- MD
- Moldova
- Prior art keywords
- microfire
- coil
- molded
- standard
- section
- Prior art date
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
Inventia se refera la tehnica de masurare si poate fi utilizata la turnarea firelor conductoare sau semiconductoare in izolatie. Procedeul de masurare a sectiunii unui fir conductor in izolatie in procesul de turnare, de exemplu, a unui microfir conductor in izolatie de sticla, consta in extinderea acestuia dintr-o preforma de metal introdusa intr-un tub din material izolator in stare de suspensie cu un camp electromagnetic de frecventa inalta si bobinarea microfirului turnat pe o carcasa metalica, formand o bobina cu microfir turnat. Masurarea sectiunii microfirului se efectueaza prin compensarea rezistentei echivalente electrice Zx a bobinei cu microfir turnat cu o rezistenta echivalenta electrica Z0 a unei bobine cu microfir etalon, care se conecteaza in paralel la intrarea diferentiala a unui amplificator operational si in serie cu o ramura in serie formata din portiunea de microfir masurat si bobina cu microfir turnat. Aceasta ramura este conectata la intrarea neinversoare a amplificatorului operational. Circuitul in serie format din bobina cu microfir etalon si ramura in serie formata din portiunea de microfir masurat si bobina cu microfir turnat se uneste la o sursa de curent sinusoidal de valoare impusa, unde curentul i(t) de la sursa, trecand prin circuitul in serie, formeaza caderi de tensiuni Ux=Zxi(t) pe bobina cu microfir turnat, U0=Z0i(t) pe bobina cu microfir etalon si Ur=i(t)rl pe portiunea de microfir masurat. Tensiunea U0 se defazeaza la Pi prin amplificatorul operational si se repeta dupa valoare la iesirea lui, unde se insumeaza cu suma de tensiuni Ux+Ur, formand tensiunea sumara masurata US=-U0+Ur+Ux=i(t)[-Z0+rl+Zx], care atunci cand Zx=Z0, i(t)=const si l=const este egala cu i(t)rl, care este proportionala cu rezistenta r si invers proportionala cu sectiunea de microfir etalon Ur ~ S0-1.The invention relates to the measurement technique and can be used for casting conductive or semiconductor wires in isolation. The process of measuring the section of a conductive wire in isolation in the casting process, for example, of a conductive microfire in glass insulation, consists in its extension from a metal preform inserted into a tube of insulating material in suspension state with a high frequency electromagnetic field and the winding of the molded microfire on a metal housing, forming a molded microfire coil. The measurement of the microfire section is performed by compensating the electrical equivalent resistance Zx of the coil with microfire cast with an electrical equivalent resistance Z0 of a coil with standard microfire, which is connected in parallel to the differential input of an operational amplifier and in series with a branch in series formed. from the measured microfire portion and the molded microfire coil. This branch is connected to the non-inverting input of the operational amplifier. The serial circuit consisting of the standard microfire coil and the serial branch consisting of the measured microfire portion and the molded microfire coil is joined to a sinusoidal current of imposed value, where the current i (t) from the source, passing through the circuit in series, it forms voltage drops Ux = Zxi (t) on the coil with molded microfire, U0 = Z0i (t) on the coil with standard microfire and Ur = i (t) rl on the measured microfire portion. The voltage U0 is shifted to Pi by the operational amplifier and is repeated by value at its output, where it is summed with the sum of voltages Ux + Ur, forming the measured voltage US = -U0 + Ur + Ux = i (t) [- Z0 + rl + Zx], which when Zx = Z0, i (t) = const and l = const is equal to i (t) rl, which is proportional to the resistance r and inversely proportional to the standard microfire section Ur ~ S0-1 .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
MDA20070269A MD3897G2 (en) | 2007-10-08 | 2007-10-08 | Process for measuring the section of an insulated wire in the casting process |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
MDA20070269A MD3897G2 (en) | 2007-10-08 | 2007-10-08 | Process for measuring the section of an insulated wire in the casting process |
Publications (2)
Publication Number | Publication Date |
---|---|
MD3897F1 true MD3897F1 (en) | 2009-04-30 |
MD3897G2 MD3897G2 (en) | 2010-05-31 |
Family
ID=40901729
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MDA20070269A MD3897G2 (en) | 2007-10-08 | 2007-10-08 | Process for measuring the section of an insulated wire in the casting process |
Country Status (1)
Country | Link |
---|---|
MD (1) | MD3897G2 (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
MD3961G2 (en) * | 2008-01-09 | 2010-04-30 | Технический университет Молдовы | Device for measuring the linear resistance of the glass-insulated wire in the casting process |
MD3985G2 (en) * | 2007-10-08 | 2010-06-30 | Технический университет Молдовы | Installation for manufacturing of glass-insulated microwire |
MD173Z (en) * | 2008-07-25 | 2010-10-31 | Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы | Process for the manufacture of bifilar microwire |
MD280Z (en) * | 2009-12-22 | 2011-04-30 | Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы | Process for manufacture of Te microwire in glass insulation |
MD4092C1 (en) * | 2009-09-24 | 2011-08-31 | Технический университет Молдовы | Microwire casting installation |
MD4100C1 (en) * | 2009-09-24 | 2011-09-30 | Технический университет Молдовы | Method for manufacturing a resistor from a conductor |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
MD690Z (en) * | 2012-09-10 | 2014-09-30 | Технический университет Молдовы | Method for measuring the cross-section of a wire in the casting process |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU365738A1 (en) * | 1970-01-12 | 1973-01-08 | DEVICE FOR CONTROLLING OF RUNNING RESISTANCE OF THE MICROPRODUCT IN GLASS INSULATION IN THE PROCESS OF CASTING | |
MD2249G2 (en) * | 2003-02-11 | 2004-02-29 | Технический университет Молдовы | Device for measuring the resistance of the elements from the isolated condcutor in the winding process |
MD2645G2 (en) * | 2004-07-16 | 2005-08-31 | Технический университет Молдовы | Device for measuring the linear resistance of the insulated wire |
MD3216G2 (en) * | 2006-03-21 | 2007-07-31 | Технический университет Молдовы | Device for measuring the linear resistance of the insulated wire |
-
2007
- 2007-10-08 MD MDA20070269A patent/MD3897G2/en not_active IP Right Cessation
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
MD3985G2 (en) * | 2007-10-08 | 2010-06-30 | Технический университет Молдовы | Installation for manufacturing of glass-insulated microwire |
MD3961G2 (en) * | 2008-01-09 | 2010-04-30 | Технический университет Молдовы | Device for measuring the linear resistance of the glass-insulated wire in the casting process |
MD173Z (en) * | 2008-07-25 | 2010-10-31 | Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы | Process for the manufacture of bifilar microwire |
MD4092C1 (en) * | 2009-09-24 | 2011-08-31 | Технический университет Молдовы | Microwire casting installation |
MD4100C1 (en) * | 2009-09-24 | 2011-09-30 | Технический университет Молдовы | Method for manufacturing a resistor from a conductor |
MD280Z (en) * | 2009-12-22 | 2011-04-30 | Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы | Process for manufacture of Te microwire in glass insulation |
Also Published As
Publication number | Publication date |
---|---|
MD3897G2 (en) | 2010-05-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG4A | Patent for invention issued | ||
KA4A | Patent for invention lapsed due to non-payment of fees (with right of restoration) | ||
MM4A | Patent for invention definitely lapsed due to non-payment of fees |