MA65162A1 - Procédé de détection d'au moins un défaut sur un support, dispositif et programme informatique associés - Google Patents

Procédé de détection d'au moins un défaut sur un support, dispositif et programme informatique associés

Info

Publication number
MA65162A1
MA65162A1 MA65162A MA65162A MA65162A1 MA 65162 A1 MA65162 A1 MA 65162A1 MA 65162 A MA65162 A MA 65162A MA 65162 A MA65162 A MA 65162A MA 65162 A1 MA65162 A1 MA 65162A1
Authority
MA
Morocco
Prior art keywords
spectrum space
defect
detecting
area
image
Prior art date
Application number
MA65162A
Other languages
English (en)
Inventor
Pierre MAGRANGEAS
CHristian BRACICH
Wilson VELOZ PARRA
Stéphanie POTTECHER
Benoît BERTHELIER
Omar Chimère NDIAYE
Adrien BINET
Caroline SENAC
Nicolas Toussaint
Renard FERRET
Carlo Dri
Igor ZERJAL
Original Assignee
Aqc Industry
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aqc Industry filed Critical Aqc Industry
Publication of MA65162A1 publication Critical patent/MA65162A1/fr

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G01N21/8983—Irregularities in textured or patterned surfaces, e.g. textiles, wood for testing textile webs, i.e. woven material
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G06T3/40—Scaling of whole images or parts thereof, e.g. expanding or contracting
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/10—Image enhancement or restoration using non-spatial domain filtering
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/90—Dynamic range modification of images or parts thereof
    • G06T5/92—Dynamic range modification of images or parts thereof based on global image properties
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/70—Labelling scene content, e.g. deriving syntactic or semantic representations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8883—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20048—Transform domain processing
    • G06T2207/20056—Discrete and fast Fourier transform, [DFT, FFT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20076—Probabilistic image processing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30132—Masonry; Concrete
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30161—Wood; Lumber

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Textile Engineering (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Computational Linguistics (AREA)
  • Multimedia (AREA)
  • Wood Science & Technology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)

Abstract

L'invention concerne un procédé de détection d'au moins un défaut sur un support tel qu'un tissu ou une brique, le procédé consistant à : ▪ acquérir (ACQ) au moins une première image du support ; ▪ générer une seconde image qui correspond à l'espace de spectre 2D de la ou des premières images ; ▪ décaler au moins une plage de fréquences sélectionnée d'au moins une première zone de l'espace de spectre 2D vers une seconde zone de l'espace de spectre 2D ; ▪ filtrer au moins une plage de fréquences de l'espace de spectre 2D pour éliminer au moins un motif prédéfini du support ; ▪ décaler au moins une plage de fréquences sélectionnée d'une seconde zone du nouvel espace de spectre 2D vers une première zone du nouvel espace de spectre 2D ; ▪ inverser (RVRS) la transformation du domaine de fréquence du nouvel espace de spectre 2D pour obtenir une image finale.
MA65162A 2021-10-01 2022-09-29 Procédé de détection d'au moins un défaut sur un support, dispositif et programme informatique associés MA65162A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP21315194.7A EP4160524A1 (fr) 2021-10-01 2021-10-01 Procédé de détection d'au moins un défaut sur un support, dispositif et programme informatique associés
PCT/EP2022/077179 WO2023052537A1 (fr) 2021-10-01 2022-09-29 Procédé de détection d'au moins un défaut sur un support, dispositif et programme informatique associés

Publications (1)

Publication Number Publication Date
MA65162A1 true MA65162A1 (fr) 2024-08-30

Family

ID=78528846

Family Applications (1)

Application Number Title Priority Date Filing Date
MA65162A MA65162A1 (fr) 2021-10-01 2022-09-29 Procédé de détection d'au moins un défaut sur un support, dispositif et programme informatique associés

Country Status (5)

Country Link
US (1) US20250045905A1 (fr)
EP (2) EP4160524A1 (fr)
CN (1) CN118369685A (fr)
MA (1) MA65162A1 (fr)
WO (1) WO2023052537A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116309612B (zh) * 2023-05-25 2023-08-18 锋睿领创(珠海)科技有限公司 基于频率解耦监督的半导体硅晶圆检测方法、装置及介质
CN116862917B (zh) * 2023-09-05 2023-11-24 微山县振龙纺织品有限公司 一种纺织品表面质量检测方法及系统

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107341499A (zh) * 2017-05-26 2017-11-10 昆明理工大学 一种基于无监督分割和elm的织物缺陷检测和分类方法
CN109934802B (zh) * 2019-02-02 2021-06-22 浙江工业大学 一种基于傅里叶变换和图像形态学的布匹疵点检测方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12394033B2 (en) 2018-10-30 2025-08-19 University Of North Texas Reconfigurable fabric inspection system
CN111047655B (zh) 2020-01-10 2024-05-14 北京盛开互动科技有限公司 基于卷积神经网络的高清摄像机布料疵点检测方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107341499A (zh) * 2017-05-26 2017-11-10 昆明理工大学 一种基于无监督分割和elm的织物缺陷检测和分类方法
CN109934802B (zh) * 2019-02-02 2021-06-22 浙江工业大学 一种基于傅里叶变换和图像形态学的布匹疵点检测方法

Also Published As

Publication number Publication date
EP4160524A1 (fr) 2023-04-05
US20250045905A1 (en) 2025-02-06
WO2023052537A1 (fr) 2023-04-06
CN118369685A (zh) 2024-07-19
EP4409515A1 (fr) 2024-08-07

Similar Documents

Publication Publication Date Title
MA65162A1 (fr) Procédé de détection d'au moins un défaut sur un support, dispositif et programme informatique associés
ATE492797T1 (de) Verfahren und vorrichtung zum optischen inspizieren einer oberfläche eines gegenstands
ATE287126T1 (de) Verfahren zum entfernen einer flüssigkeit von einer oberfläche einer substrat
ATE513181T1 (de) Verfahren und vorrichtung zur durchführung optischer abbildung durch verwendung von frequenzbereichs-interferometrie
TW200705387A (en) Systems, methods, and apparatus for highband time warping
ATE331993T1 (de) Verfahren und vorrichtung zum optischen abtasten von objekten
WO2008025433A3 (fr) Procédé et dispositif de détermination à résolution locale de la phase et de l'amplitude d'un champ électromagnétique dans le plan d'image d'une représentation d'un objet
ATE262167T1 (de) Dynamischer ungleichmässiger takt für wiederabtastung und verarbeitung von maschinensignalen
DE502005005827D1 (de) System und verfahren zur weiterverarbeitung eines, vorzugsweise dynamisch, insbesondere zum zweck eisten profils eines festkörpers
ATE425452T1 (de) Verfahren und vorrichtung zur erkennung von sich wiederholenden mustern
DE502007001510D1 (de) Vorrichtung zur herstellung von textilien, vliesstoffen, spinnvliesen, papierwerkstoffen und/oder perforierten folien
US10948376B2 (en) Apparatus and method of detecting leak sound in plant equipment using time-frequency transformation
ATE486411T1 (de) Verfahren, vorrichtungen und systeme zum verarbeiten eines signals in gegenwart von schmalbandstörungen
TW200628758A (en) Method and system of inspecting mura-defect and method of fabricating photomask
ATE553407T1 (de) Vorrichtung und verfahren zum erzeugen eines bildes eines objektes
DE502004008139D1 (de) Verfahren zum Betrieb eines Laser-Scanning-Mikroskops, wobei Bilder einer Probe verglichen und aus dem Ergebnis Steuersignale abgeleitet werden
DE602006013768D1 (de) Verfahren zur Reinigung von Ätzkammern mit Schleif-Suspension
DE60216570D1 (de) Verfahren zum nachweis von alzheimer-krankheit
JP2009074825A (ja) 欠陥検査方法および欠陥検査装置
DE602006013666D1 (de) Verfahren und vorrichtung zum automatischen erstellung einer abspielliste durch segmentweisen merkmalsvergleich
ATE521719T1 (de) Verfahren zur behandlung biegsamer laminarer oberflächen
DE50202590D1 (de) Verfahren zur überwachung eines brennvorganges
TW200630604A (en) Method and apparatus for inspection of optical component
ATE236416T1 (de) Verfahren und vorrichtung zur archivierung und übertragung von bilddaten
DE60310108D1 (de) Verfahren und vorrichtung zum automatischen entfernen optischer artefakte beim scannen