LU92516B1 - Infrared imager non-uniformity correction with bad pixel detection and correction - Google Patents
Infrared imager non-uniformity correction with bad pixel detection and correctionInfo
- Publication number
- LU92516B1 LU92516B1 LU92516A LU92516A LU92516B1 LU 92516 B1 LU92516 B1 LU 92516B1 LU 92516 A LU92516 A LU 92516A LU 92516 A LU92516 A LU 92516A LU 92516 B1 LU92516 B1 LU 92516B1
- Authority
- LU
- Luxembourg
- Prior art keywords
- correction
- infrared imager
- pixel detection
- bad pixel
- uniformity
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
- H04N25/683—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects by defect estimation performed on the scene signal, e.g. real time or on the fly detection
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/33—Transforming infrared radiation
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Studio Devices (AREA)
- Image Processing (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
LU92516A LU92516B1 (en) | 2014-08-11 | 2014-08-11 | Infrared imager non-uniformity correction with bad pixel detection and correction |
CN201580042843.0A CN106797421B (zh) | 2014-08-11 | 2015-08-11 | 一种摄像机系统 |
PCT/EP2015/068452 WO2016023899A1 (fr) | 2014-08-11 | 2015-08-11 | Correction de non-uniformité d'imageur infrarouge avec une détection et une correction de mauvais pixel |
DE112015003722.5T DE112015003722T5 (de) | 2014-08-11 | 2015-08-11 | Infrarotbildgeber-Ungleichmässigkeitskorrektur mit Erfassung und Korrektur Fehlerhafter Pixel |
US15/503,085 US11050958B2 (en) | 2014-08-11 | 2015-08-11 | Infrared imager non-uniformity correction with bad pixel detection and correction |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
LU92516A LU92516B1 (en) | 2014-08-11 | 2014-08-11 | Infrared imager non-uniformity correction with bad pixel detection and correction |
Publications (1)
Publication Number | Publication Date |
---|---|
LU92516B1 true LU92516B1 (en) | 2016-02-12 |
Family
ID=51453795
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
LU92516A LU92516B1 (en) | 2014-08-11 | 2014-08-11 | Infrared imager non-uniformity correction with bad pixel detection and correction |
Country Status (5)
Country | Link |
---|---|
US (1) | US11050958B2 (fr) |
CN (1) | CN106797421B (fr) |
DE (1) | DE112015003722T5 (fr) |
LU (1) | LU92516B1 (fr) |
WO (1) | WO2016023899A1 (fr) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10113837B2 (en) | 2015-11-03 | 2018-10-30 | N2 Imaging Systems, LLC | Non-contact optical connections for firearm accessories |
DE112018006861B4 (de) | 2018-02-16 | 2021-07-29 | Mitsubishi Electric Corporation | Unregelmäßigkeit-Detektionsvorrichtung und Unregelmäßigkeit-Detektionsverfahren |
CN108765306A (zh) * | 2018-04-17 | 2018-11-06 | 浙江华睿科技有限公司 | 一种图像坏点矫正方法、装置、电子设备及介质 |
US10753709B2 (en) | 2018-05-17 | 2020-08-25 | Sensors Unlimited, Inc. | Tactical rails, tactical rail systems, and firearm assemblies having tactical rails |
US10645348B2 (en) | 2018-07-07 | 2020-05-05 | Sensors Unlimited, Inc. | Data communication between image sensors and image displays |
US11079202B2 (en) | 2018-07-07 | 2021-08-03 | Sensors Unlimited, Inc. | Boresighting peripherals to digital weapon sights |
US10742913B2 (en) | 2018-08-08 | 2020-08-11 | N2 Imaging Systems, LLC | Shutterless calibration |
US10921578B2 (en) | 2018-09-07 | 2021-02-16 | Sensors Unlimited, Inc. | Eyecups for optics |
US11122698B2 (en) | 2018-11-06 | 2021-09-14 | N2 Imaging Systems, LLC | Low stress electronic board retainers and assemblies |
US10801813B2 (en) | 2018-11-07 | 2020-10-13 | N2 Imaging Systems, LLC | Adjustable-power data rail on a digital weapon sight |
US10796860B2 (en) | 2018-12-12 | 2020-10-06 | N2 Imaging Systems, LLC | Hermetically sealed over-molded button assembly |
US11143838B2 (en) | 2019-01-08 | 2021-10-12 | N2 Imaging Systems, LLC | Optical element retainers |
DE102019119929B4 (de) | 2019-07-23 | 2024-05-08 | Avl Software And Functions Gmbh | Verfahren zur Erfassung einer Fahrzeugumgebung |
CN117221747B (zh) * | 2023-11-09 | 2024-01-26 | 海豚乐智科技(成都)有限责任公司 | 一种基于sopc的单周期坏点补偿与非均匀校正方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030146975A1 (en) * | 2002-02-07 | 2003-08-07 | Shi-Chang Joung | Time variant defect correcting method and apparatus in infrared thermal imaging system |
US20040239782A1 (en) * | 2003-05-30 | 2004-12-02 | William Equitz | System and method for efficient improvement of image quality in cameras |
KR101213669B1 (ko) * | 2012-05-07 | 2013-01-10 | 삼성탈레스 주식회사 | 분할 영역을 이용한 적외선 영상 nuc 처리 장치 및 방법 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6747697B1 (en) * | 2000-07-12 | 2004-06-08 | Koninklijke Philips Electronics, N.V. | Method and apparatus for digital image defect correction and noise filtering |
US7684634B2 (en) * | 2006-08-29 | 2010-03-23 | Raytheon Company | System and method for adaptive non-uniformity compensation for a focal plane array |
FR2948521B1 (fr) * | 2009-07-21 | 2012-01-27 | Dxo Labs | Procede d'estimation d'un defaut d'un systeme de capture d'images et systemes associes |
US8259198B2 (en) * | 2009-10-20 | 2012-09-04 | Apple Inc. | System and method for detecting and correcting defective pixels in an image sensor |
IL212289A (en) * | 2011-04-13 | 2016-08-31 | Semi-Conductor Devices - An Elbit Systems - Rafael Partnership | Circuit and method for reading image signals |
JP2014017724A (ja) * | 2012-07-10 | 2014-01-30 | Sumitomo Electric Ind Ltd | 撮像装置 |
-
2014
- 2014-08-11 LU LU92516A patent/LU92516B1/xx active
-
2015
- 2015-08-11 WO PCT/EP2015/068452 patent/WO2016023899A1/fr active Application Filing
- 2015-08-11 CN CN201580042843.0A patent/CN106797421B/zh active Active
- 2015-08-11 US US15/503,085 patent/US11050958B2/en active Active
- 2015-08-11 DE DE112015003722.5T patent/DE112015003722T5/de not_active Withdrawn
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030146975A1 (en) * | 2002-02-07 | 2003-08-07 | Shi-Chang Joung | Time variant defect correcting method and apparatus in infrared thermal imaging system |
US20040239782A1 (en) * | 2003-05-30 | 2004-12-02 | William Equitz | System and method for efficient improvement of image quality in cameras |
KR101213669B1 (ko) * | 2012-05-07 | 2013-01-10 | 삼성탈레스 주식회사 | 분할 영역을 이용한 적외선 영상 nuc 처리 장치 및 방법 |
Non-Patent Citations (1)
Title |
---|
AZWITAMISI E MUDAU ET AL: "Non-uniformity correction and bad pixel replacement on LWIR and MWIR images", ELECTRONICS, COMMUNICATIONS AND PHOTONICS CONFERENCE (SIECPC), 2011 SAUDI INTERNATIONAL, IEEE, 24 April 2011 (2011-04-24), pages 1 - 5, XP031993246, ISBN: 978-1-4577-0068-2, DOI: 10.1109/SIECPC.2011.5876937 * |
Also Published As
Publication number | Publication date |
---|---|
CN106797421B (zh) | 2021-03-12 |
US11050958B2 (en) | 2021-06-29 |
DE112015003722T5 (de) | 2017-06-08 |
WO2016023899A1 (fr) | 2016-02-18 |
US20170237919A1 (en) | 2017-08-17 |
CN106797421A (zh) | 2017-05-31 |
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