LU42986A1 - - Google Patents
Info
- Publication number
- LU42986A1 LU42986A1 LU42986DA LU42986A1 LU 42986 A1 LU42986 A1 LU 42986A1 LU 42986D A LU42986D A LU 42986DA LU 42986 A1 LU42986 A1 LU 42986A1
- Authority
- LU
- Luxembourg
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
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- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21B—MANUFACTURE OF IRON OR STEEL
- C21B7/00—Blast furnaces
- C21B7/04—Blast furnaces with special refractories
- C21B7/06—Linings for furnaces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Electromagnetism (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
LU42986 | 1963-01-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
LU42986A1 true LU42986A1 (xx) | 1964-07-08 |
Family
ID=19723259
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
LU42986D LU42986A1 (xx) | 1963-01-08 | 1963-01-08 |
Country Status (3)
Country | Link |
---|---|
BE (1) | BE640101A (xx) |
LU (1) | LU42986A1 (xx) |
NL (1) | NL302992A (xx) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0060069A1 (en) * | 1981-03-02 | 1982-09-15 | Kabushiki Kaisha Kobe Seiko Sho | A probe and a system for detecting wear of refractory wall |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5896429A (en) * | 1997-09-15 | 1999-04-20 | Massachusetts Institute Of Technology | Method for measurement of blast furnace liner thickness |
-
0
- NL NL302992D patent/NL302992A/xx unknown
-
1963
- 1963-01-08 LU LU42986D patent/LU42986A1/xx unknown
- 1963-11-18 BE BE640101A patent/BE640101A/fr unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0060069A1 (en) * | 1981-03-02 | 1982-09-15 | Kabushiki Kaisha Kobe Seiko Sho | A probe and a system for detecting wear of refractory wall |
Also Published As
Publication number | Publication date |
---|---|
BE640101A (xx) | 1964-03-16 |
NL302992A (xx) |