KR970022220A - Surface roughness measuring device of workpiece - Google Patents

Surface roughness measuring device of workpiece Download PDF

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Publication number
KR970022220A
KR970022220A KR1019950037111A KR19950037111A KR970022220A KR 970022220 A KR970022220 A KR 970022220A KR 1019950037111 A KR1019950037111 A KR 1019950037111A KR 19950037111 A KR19950037111 A KR 19950037111A KR 970022220 A KR970022220 A KR 970022220A
Authority
KR
South Korea
Prior art keywords
light
surface roughness
workpiece
lens
control means
Prior art date
Application number
KR1019950037111A
Other languages
Korean (ko)
Other versions
KR100187825B1 (en
Inventor
이군석
홍성욱
Original Assignee
송재복
한화기계 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 송재복, 한화기계 주식회사 filed Critical 송재복
Priority to KR1019950037111A priority Critical patent/KR100187825B1/en
Publication of KR970022220A publication Critical patent/KR970022220A/en
Application granted granted Critical
Publication of KR100187825B1 publication Critical patent/KR100187825B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

Abstract

본 발명은 공작물의 표면 거칠기 측정 장치에 관한 것으로, 표면 거칠기 검출 수단을 광원, 제1렌즈, 빔스플리터, 제2렌즈, 제3렌즈, 제1수광 트랜지스터 및 제2수광 트랜지스터로 구성함으로써 공작물의 표면의 거칠기를 측정할 경우 공작물의 표면에 흠집을 내는 것을 방지할 수 있음과 동시에 연속적이고 빠르게 공작물의 표면의 거칠기를 측정할 수 있는 매우 뛰어난 효과가 있다.The present invention relates to an apparatus for measuring the surface roughness of a workpiece, wherein the surface roughness detecting means comprises a light source, a first lens, a beam splitter, a second lens, a third lens, a first light receiving transistor, and a second light receiving transistor. When measuring the roughness of, it is possible to prevent the surface of the workpiece from being scratched, and at the same time, it is very effective to measure the surface roughness of the workpiece continuously and quickly.

Description

공작물의 표면 거칠기 측정 장치Surface roughness measuring device of workpiece

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 본 발명의 일실시예에 의한 공작물의 표면 거칠기 측정 장치의 단면도,1 is a cross-sectional view of the surface roughness measuring apparatus of the workpiece according to an embodiment of the present invention,

제2도는 본 발명의 일실시예에 의한 공작물의 표면 거칠기 측정 장치의 제어 회로 블록도,2 is a control circuit block diagram of a surface roughness measuring apparatus of a workpiece according to an embodiment of the present invention;

제3도는 본 발명의 일실시예에 의한 공작물의 표면 거칠기 측정 장치의 제어 방법을 나타낸 플로우차트,3 is a flowchart showing a method of controlling a surface roughness measuring apparatus of a workpiece according to an embodiment of the present invention;

제4도는 본 발명의 일실시예에 의한 공작물의 표면 거칠기 측정 장치에 있어서, 공작물의 표면 거칠기와 광속비의 관계를 나타낸 그래프.4 is a graph showing the relationship between the surface roughness of the workpiece and the light beam ratio in the apparatus for measuring the surface roughness of the workpiece according to an embodiment of the present invention.

Claims (2)

공작물의 표면 거칠기 측정 장치에 있어서, 제어 수단과, 상기 제어 수단에 사용자의 조작 명령을 입력하는 조작 수단과, 상기 제어수단에 공작물의 표면 거칠기를 입력하도록 상기 공작물의 표면 거칠기를 검출하는 표면 거칠기 검출 수단과, 상기 제어 수단으로부터 표시 신호를 받아서 공작물의 표면 거칠기를 표시하는 표시 수단으로 이루어진 것을 특징으로 하는 공작물의 표면 거칠기 측정 장치.An apparatus for measuring the surface roughness of a workpiece, the apparatus comprising: a control means, an operation means for inputting a user's operation command to the control means, and a surface roughness detection for detecting the surface roughness of the workpiece so as to input the surface roughness of the workpiece to the control means. And a display means for receiving the display signal from the control means and displaying the surface roughness of the workpiece. 제1항에 있어서, 상기 표면 거칠기 검출 수단은 상기 공작물의 표면을 향해 빗을 발산하는 광원과, 상기 공작물로부터 산란된 빛을 평행한 빗으로 변환하는 제1렌즈와, 상기 제1렌즈를 통과한 빛을 두방향으로 분할하는 빔 스플리터와, 상기 빔 스플리터에서 일방향으로 분한된 빛을 받아서 빛을 집중시키는 제2렌즈와, 상기 빔 스플리터에서 타방향으로 분할된 빛을 받아서 빛을 집중시키는 제3렌즈와, 상기 제2렌즈에서의 광속(LUMINOUS FLUX)을 나타내는 턴온 시간을 상기 제어 수단으로 출력하도록 상기 제2렌즈에 의해 집중된 빛을 받아서 턴온하는 제1수광 트랜지스터와, 상기 제3렌즈에서의 광속을 나타내는 턴온 시간을 상기 제어 수단으로 출력하도록 상기 제3렌즈에 의해 집중된 빛을 받아서 턴온하는 제2수광 트랜지스터로 이루어진 것을 특징으로 하는 공작물의 표면 거칠기 측정 장치.The surface roughness detecting means according to claim 1, wherein the surface roughness detecting means comprises: a light source that emits a comb toward the surface of the workpiece, a first lens that converts light scattered from the workpiece into a parallel comb, and light passing through the first lens. A beam splitter for splitting light into two directions, a second lens for focusing light by receiving light split in one direction from the beam splitter, and a third lens for focusing light by receiving light split in another direction from the beam splitter; And a first light receiving transistor configured to receive and turn on the light focused by the second lens to output a turn-on time indicating the light flux LUMINOUS FLUX in the second lens to the control means, and indicate a light flux in the third lens. And a second light receiving transistor configured to receive light concentrated by the third lens and to turn on the output time to the control means. Is a device for measuring the surface roughness of a workpiece. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950037111A 1995-10-25 1995-10-25 Surface roughness testing apparatus of work KR100187825B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950037111A KR100187825B1 (en) 1995-10-25 1995-10-25 Surface roughness testing apparatus of work

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950037111A KR100187825B1 (en) 1995-10-25 1995-10-25 Surface roughness testing apparatus of work

Publications (2)

Publication Number Publication Date
KR970022220A true KR970022220A (en) 1997-05-28
KR100187825B1 KR100187825B1 (en) 1999-06-01

Family

ID=19431297

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950037111A KR100187825B1 (en) 1995-10-25 1995-10-25 Surface roughness testing apparatus of work

Country Status (1)

Country Link
KR (1) KR100187825B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010088463A (en) * 2001-07-12 2001-09-28 곽재섭 On-line measuring technology of surface roughness by acoustic emission signal

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010088463A (en) * 2001-07-12 2001-09-28 곽재섭 On-line measuring technology of surface roughness by acoustic emission signal

Also Published As

Publication number Publication date
KR100187825B1 (en) 1999-06-01

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