KR970012732A - Delay circuit of semiconductor device - Google Patents

Delay circuit of semiconductor device Download PDF

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Publication number
KR970012732A
KR970012732A KR1019950025871A KR19950025871A KR970012732A KR 970012732 A KR970012732 A KR 970012732A KR 1019950025871 A KR1019950025871 A KR 1019950025871A KR 19950025871 A KR19950025871 A KR 19950025871A KR 970012732 A KR970012732 A KR 970012732A
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KR
South Korea
Prior art keywords
reference voltage
ground
power supply
transistor
signal
Prior art date
Application number
KR1019950025871A
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Korean (ko)
Inventor
하임철
Original Assignee
김주용
현대전자산업 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김주용, 현대전자산업 주식회사 filed Critical 김주용
Priority to KR1019950025871A priority Critical patent/KR970012732A/en
Publication of KR970012732A publication Critical patent/KR970012732A/en

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Abstract

본 발명은 반도체 소자의 지연회로에 관한 것으로서, 기준전압 발생회로를 사용하여 전원전압 및 온도변화에 따른 전류량의 변화를 보상하므로써 소자의 동작범위를 크게할 수 있고, 소자의 특성이 안정화 시킬 수 있는 지연회로에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a delay circuit of a semiconductor device, and by using a reference voltage generator circuit, by compensating for a change in the amount of current due to a change in power supply voltage and temperature, the operating range of the device can be increased and the characteristics of the device can be stabilized. It relates to a delay circuit.

Description

반도체 소자의 지연회로Delay circuit of semiconductor device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제2도는 본 발명에 따른 반도체 소자의 지연회로도.2 is a delay circuit diagram of a semiconductor device according to the present invention.

Claims (3)

기준전압 발생회로를 사용하는 반도체 소자의 지연회로에 있어서, 전원 및 접지간에 접속되며, 지연신호 및 다수의 기준전압신호를 입력으로 하는 제1지연수단과, 상기 전원 및 접지간에 접속되며, 상기 제1지연수단의 출력신호 및 상기 다수의 기준전압신호를 입력으로 하는 제2지연수단과, 상기 전원 및 접지간에 접속되며, 상기 제2지연수단의 출력신호 및 상기 다수의 기준전압신호를 입력으로 하는 제3지연수단과, 상기 전원 및 접지간에 접속되며, 상기 제3지연수단의 출력신호및 상기 다수의 기준전압신호를 입력으로 하는 제4지연수단으로 구성되는 것을 특징으로 하는 반도체 소자의 지연회로.A delay circuit of a semiconductor element using a reference voltage generator circuit, the delay circuit of which is connected between a power supply and a ground, and is connected between the first delay means for inputting a delay signal and a plurality of reference voltage signals, and between the power supply and the ground. A second delay means for inputting the output signal of the first delay means and the plurality of reference voltage signals, and the power supply and the ground, and receiving the output signal of the second delay means and the plurality of reference voltage signals as inputs. And a fourth delay means connected to a third delay means, the power supply and the ground, and the fourth delay means for inputting an output signal of the third delay means and the plurality of reference voltage signals. 제1항에 있어서, 상기 제1지연수단은 전원 및 접지간에 지연신호를 입력으로 하는 트랜지스터와, 기준전압신호를 입력으로 하는 NMOS 트랜지스터 및 기준전압신호를 입력으로 하는 PMOS 트랜지스터가 직렬로 접속되고, 노드(K1) 및 노드(K2)간에 접속되는 저항과, 상기 노드(K1) 및 접지간에 접속되는 캐피시터와, 상기 노드(K2) 및 접지간에 접속되는 캐패시터로 구성되는 것을 특징으로 하는 반도체 소자의 지연회로.2. The first delay means comprises: a transistor connected as a delay signal between a power supply and a ground, an NMOS transistor as a reference voltage signal and a PMOS transistor as a reference voltage signal in series, A delay of a semiconductor device comprising a resistor connected between a node K1 and a node K2, a capacitor connected between the node K1 and a ground, and a capacitor connected between the node K2 and a ground. Circuit. 제1항에 있어서, 상기 기준전압 발생회로는 전원 및 기준전압 출력단자간에 직렬로 접속되는 다수의 트랜지스터와, 상기 기준전압 출력단자 및 접지간에 접속되는 상기 기준전압 신호를 입력으로 하는 트랜지스터와, 상기 전원 및 기준전압 출력단자간에 병렬접속되는 트랜지스터 및 인에이블신호를 입력으로 하는 트랜지스터와, 상기 기준전압 출력단자 및 접지간에 상기 기준전압신호를 입력으로 하는 트랜지스터, 상기 전원을 입력으로 하는 트랜지시트 및 상기 인에이블신호를 입력으로 하는 트랜지스터가 직렬로 접속되는 것을 특징으로 하는 반도체 소자의 지연회로.2. The circuit of claim 1, wherein the reference voltage generating circuit includes a plurality of transistors connected in series between a power supply and a reference voltage output terminal, a transistor configured as an input of the reference voltage signal connected between the reference voltage output terminal and ground; A transistor for inputting a transistor and an enable signal connected in parallel between a power supply and a reference voltage output terminal; a transistor for inputting the reference voltage signal between the reference voltage output terminal and ground; a transistor sheet for inputting the power supply; And a transistor for inputting the enable signal is connected in series. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950025871A 1995-08-22 1995-08-22 Delay circuit of semiconductor device KR970012732A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950025871A KR970012732A (en) 1995-08-22 1995-08-22 Delay circuit of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950025871A KR970012732A (en) 1995-08-22 1995-08-22 Delay circuit of semiconductor device

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KR970012732A true KR970012732A (en) 1997-03-29

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KR1019950025871A KR970012732A (en) 1995-08-22 1995-08-22 Delay circuit of semiconductor device

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100587590B1 (en) * 1999-08-18 2006-06-08 매그나칩 반도체 유한회사 Preventing port circuit for electro-magnetic interference
KR101301260B1 (en) * 2011-11-29 2013-09-03 (주)태진기술 Soft start circuit
KR20160078273A (en) * 2014-12-24 2016-07-04 에스아이아이 세미컨덕터 가부시키가이샤 Overheat detection circuit and semiconductor device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100587590B1 (en) * 1999-08-18 2006-06-08 매그나칩 반도체 유한회사 Preventing port circuit for electro-magnetic interference
KR101301260B1 (en) * 2011-11-29 2013-09-03 (주)태진기술 Soft start circuit
KR20160078273A (en) * 2014-12-24 2016-07-04 에스아이아이 세미컨덕터 가부시키가이샤 Overheat detection circuit and semiconductor device

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