KR970012043A - Shading Correction Method Using Average Value of Charge Coupled Device - Google Patents

Shading Correction Method Using Average Value of Charge Coupled Device Download PDF

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Publication number
KR970012043A
KR970012043A KR1019950026991A KR19950026991A KR970012043A KR 970012043 A KR970012043 A KR 970012043A KR 1019950026991 A KR1019950026991 A KR 1019950026991A KR 19950026991 A KR19950026991 A KR 19950026991A KR 970012043 A KR970012043 A KR 970012043A
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South Korea
Prior art keywords
white
value
contaminated
calculated
shedding
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KR1019950026991A
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Korean (ko)
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KR0161246B1 (en
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김석호
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우석형
주식회사 신도리코
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Priority to KR1019950026991A priority Critical patent/KR0161246B1/en
Publication of KR970012043A publication Critical patent/KR970012043A/en
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/46—Colour picture communication systems
    • H04N1/56—Processing of colour picture signals
    • H04N1/60—Colour correction or control
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G21/00—Arrangements not provided for by groups G03G13/00 - G03G19/00, e.g. cleaning, elimination of residual charge
    • G03G21/16—Mechanical means for facilitating the maintenance of the apparatus, e.g. modular arrangements
    • G03G21/1642—Mechanical means for facilitating the maintenance of the apparatus, e.g. modular arrangements for connecting the different parts of the apparatus
    • G03G21/1652—Electrical connection means

Abstract

본 발명은 화이트 레퍼런스 띠의 서로 다른 영역을 3번 스캐닝하여 평균값으로 화이트 쉐딩을 보정하는 방법에 관한 것으로, 소정수로 나뉘어진 레퍼런스 띠의 화이트 영역을 순차적으로 스캐닝하여 보정용 데이터 값을 얻되, 상기 각각의 화이트 영역 데이터 값이 화이트 한계값 이하인가를 판단하는 단계(21, 22); 상기 단계 후 화이트 한계값보다 적은값이 산출되면, 그때의 화이트 영역은 오염도었음을 판단하여 버리고, 다음 화이트 영역으로 계속 증가하여 스캐닝한 각각의 데이터값이 오염되었는지를 판단하되, 상기 각각의 화이트 영역이 화이트 한계값도다 적은 값으로 전부 산출되면, 그때의 화이트 영역은 쉐딩보정에 문제가 있음을 인지하는 단계(23 내지 25); 상기 스캐닝한 각 화이트 영역의 데이터값중 화이트 한계값보다 큰값이 산출되면, 오염되지 않았음을 인지하고, 계속하여 화이트 영역을 증가시키면서 오염이 않된 화이트 영역의 스캔 데이터값을 전하결합소자의 화소값에 더하여 저장하는 단계(26, 27); 상기 단계 수행 후 오염이 않된 화이트영역과 오염된 화이트영역을 더한 것이 소정수로 나눈 영역수보다 초과했는지를 판단하여 초과하였으면, 저장된 전하결합소자의 화소값을 오염이 않된 영역수로 나누어 평균값을 구하고, 초과하지 않았으면 나머지 화이트 영역을 계속하여 스캐닝하는 단계(28, 29); 및 상기 저장된 전하결합소자의 화소값을 오염이 않된 영역수로 나누어 산출한 평균값을 화이트 쉐딩값으로 저장하되, 이 값을 기준으로 쉐딩을 보정하는 단계(30)를 제공한다.The present invention relates to a method for correcting white shedding with an average value by scanning three different regions of a white reference strip three times. Determining (21, 22) whether the white region data value of is equal to or less than the white threshold; If the value less than the white limit value is calculated after the above step, it is determined that the white area at that time is contaminated and continues to increase to the next white area to determine whether each of the scanned data values is contaminated. Recognizing that the white region at that time has a problem in shedding correction if all of the white threshold values are calculated with a smaller value, then the steps 23 to 25; If a value larger than the white limit value is calculated among the data values of each of the scanned white regions, the controller recognizes that it is not contaminated, and continuously scans the scan data value of the uncontaminated white region while increasing the white region. In addition to storing (26, 27); After performing the above steps, it is determined whether the addition of the non-contaminated white region and the contaminated white region exceeds the number of divided regions by a predetermined number. Continuing scanning (28, 29) the remaining white area if not exceeded; And storing the average value calculated by dividing the stored pixel value of the charge coupled device by the number of uncontaminated regions as a white shedding value, and correcting shedding based on the value.

Description

전하결합소자의 평균값을 이용한 쉐딩 보정방법Shading Correction Method Using Average Value of Charge Coupled Device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제3도는 본 발명에 의한 전하결합소자의 평균값을 이용한 쉐딩 보정방법의 일실시예를 나타낸 처리흐름도.3 is a flow chart showing an embodiment of the shedding correction method using the average value of the charge coupled device according to the present invention.

Claims (1)

전하결합소자의 평균값을 이용한 쉐딩 보정방법에 있어서, 소정수로 나뉘어진 레퍼런스 띠의 화이트 영역을 순차적으로 스캐닝하여 보정용 데이타 값을 얻되, 상기 각각의 화이트 영역 데이타 값이 화이트 한계값 이하인가를 판단하는 단계(21, 22); 상기 단계 후 화이트 한계값보다 적은값이 산출되면, 그때의 화이트 영역은 오염되었음을 판단하여 버리고, 다음 화이트 영역으로 계속 증가하여 스캐닝한 각각의 데이터값이 오염되었는지를 판단하되, 상기 각각의 화이트 영역이 화이트 한계값보다 적은 값으로 전부 산출되면, 그때의 화이트 영역은 쉐딩보정에 문제가 있음을 인지하는 단계(23 내지 25); 상기 스캐닝한 각 화이트 영역의 데이터값중 화이트 한계값보다 큰값이 산출되면, 오염되지 않았음을 인지하고, 계속하여 화이트 영역을 증가시키면서 오염이 않된 화이트 영역의 스캔 데이터값을 전하결합소자의 화소값에 더하여 저장하는 단계(26, 27); 상기 단계 수행 후 오염이 않된 화이트영역과 오염된 화이트영역을 더한 것이 소정수로 나눈 영역수보다 초과했는지를 판단하여 초과하였으면, 저장된 전하결합소자의 화소값을 오염이 않된 영역수로 나누어 평균값을 구하고, 초과하지 않았으면 나머지 화이트 영역을 계속하여 스캐닝하는 단계(28, 29); 및 상기 저장된 전하결합소자의 화소값을 오염이 않된 영역수로 나누어 산출한 평균값을 화이트 쉐딩값으로 저장하되, 이 값을 기준으로 쉐딩을 보정하는 단계(30)를 포함한는 것을 특징으로 하는 전하결합소자의 평균값을 이용한 쉐딩 보정방법.In the shedding correction method using the average value of the charge coupling device, the white area of the reference band divided by a predetermined number is sequentially scanned to obtain a correction data value, and to determine whether each white area data value is less than or equal to the white limit value. Steps 21 and 22; If the value less than the white limit value is calculated after the above step, it is determined that the white area at that time is contaminated, and it continues to increase to the next white area to determine whether each of the scanned data values is contaminated. Recognizing that the white area at that time is problematic for shedding correction once it is calculated as a value less than the white limit value (23 to 25); If a value larger than the white limit value is calculated among the data values of each of the scanned white regions, the controller recognizes that it is not contaminated, and continuously scans the scan data value of the uncontaminated white region while increasing the white region. In addition to storing (26, 27); After performing the above steps, it is determined whether the addition of the non-contaminated white region and the contaminated white region exceeds the number of divided regions by a predetermined number, and then the average value is obtained by dividing the pixel value of the stored charge coupling device by the number of uncontaminated regions. Continuing scanning (28, 29) the remaining white area if not exceeded; And storing the average value calculated by dividing the pixel value of the stored charge coupling device by the number of uncontaminated regions as a white shedding value, and correcting the shedding based on the value (30). Shading correction method using the average value of. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950026991A 1995-08-28 1995-08-28 Correct shedding method by using average of charge coupled device KR0161246B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950026991A KR0161246B1 (en) 1995-08-28 1995-08-28 Correct shedding method by using average of charge coupled device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950026991A KR0161246B1 (en) 1995-08-28 1995-08-28 Correct shedding method by using average of charge coupled device

Publications (2)

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KR970012043A true KR970012043A (en) 1997-03-29
KR0161246B1 KR0161246B1 (en) 1999-03-20

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