KR970007382A - Probe station for chip protection - Google Patents

Probe station for chip protection Download PDF

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Publication number
KR970007382A
KR970007382A KR1019950021852A KR19950021852A KR970007382A KR 970007382 A KR970007382 A KR 970007382A KR 1019950021852 A KR1019950021852 A KR 1019950021852A KR 19950021852 A KR19950021852 A KR 19950021852A KR 970007382 A KR970007382 A KR 970007382A
Authority
KR
South Korea
Prior art keywords
chip
probe station
protection
tip holder
attached
Prior art date
Application number
KR1019950021852A
Other languages
Korean (ko)
Other versions
KR0152945B1 (en
Inventor
최준혁
Original Assignee
문정환
Lg 반도체 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 문정환, Lg 반도체 주식회사 filed Critical 문정환
Priority to KR1019950021852A priority Critical patent/KR0152945B1/en
Publication of KR970007382A publication Critical patent/KR970007382A/en
Application granted granted Critical
Publication of KR0152945B1 publication Critical patent/KR0152945B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

본 발명은 칩(chip) 보호용 프로우브 스테이션(probe station)에 관한 것으로, 팁 홀더와; 상기 팁 홀더의 일측에 부착된팁 및; 상기 팁 홀더와 외부 별도 계측기가 연결되는 연결선에 부착되며, 프로텍션 다이오드 D1 및 D2에 가변 가능한 두개의 개별 전원 Vmin 및 Vmax가 연결된 구조의 칩 보호장치로 이루어지도록 프로우브 스테이션을 구성시키므로써, 사용자의 부주의로 허용치 이상의 전압이 칩 상에 유입될 때나, 칩이 연결된 상태에서 전원을 온/오프 시킬 때, 또는 ESD가 발생하였을 경우에 있어서 야기되는 칩 내부의 접합부 파괴 현상을 막을 수 있을 뿐 아니라 다이오드가 발광 다이오드로 사용될 경우에는 사용자가 칩의 이상유무 상태를 보다 용이하게 인지할 수 있게 된다.The present invention relates to a chip protection probe station, comprising: a tip holder; A tip attached to one side of the tip holder; The probe station is attached to a connection line to which the tip holder and an external separate instrument are connected, and the probe station is configured to include a chip protector having a structure in which two separate power sources Vmin and Vmax are connected to the protection diodes D1 and D2. Inadvertent breakdown of the junction inside the chip caused by inadvertent overflow of the voltage on the chip, power on / off when the chip is connected, or ESD has occurred. When used as a light emitting diode, the user can more easily recognize the abnormal state of the chip.

Description

칩 보호용 프로우브 스테이션Probe station for chip protection

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 종래 기술에 따른 프로우브 스테이션 구조를 도시한 개략도, 제2도는 본 발명에 따른 프로우브 스테이션 구조를 도시한 개략도.1 is a schematic diagram showing a probe station structure according to the prior art, and FIG. 2 is a schematic diagram showing a probe station structure according to the present invention.

Claims (4)

팁 홀더와; 상기 팁 홀더의 일측에 부착된 팁 및; 상기 팁 홀더와 외부 별도 계측기가 연결되는 연결선에 부착되며, 프로텍션 다이오드 D1 및 D2에 가변 가능한 두개의 개별 전원 Vmin 및 Vmax가 연결된 구조의 칩 보호장치로 이루어진 것을 특징으로 하는 칩 보호용 프로우브 스테이션.With a tip holder; A tip attached to one side of the tip holder; The chip protection probe station is attached to a connection line connecting the tip holder and an external separate measuring instrument, the chip protection device of the structure is connected to two separate power sources Vmin and Vmax variable to the protection diodes D1 and D2. 제1항에 있어서, 상기 프로텍션 다이오드 D1 및 D2는 일반 접합 다이오드로 구성된 것을 특징으로 하는 칩 보호용 프로우브 스테이션.The probe station of claim 1, wherein the protection diodes D1 and D2 are formed of a general junction diode. 제1항에 있어서, 상기 프로텍션 다이오드 D1 및 D2는 발광 다이오드로 구성된 것을 특징으로 하는 칩보호용 프로우브 스테이션.The probe protection probe station as claimed in claim 1, wherein the protection diodes D1 and D2 comprise light emitting diodes. 제1항에 있어서, 개별 전원 Vmax 및 Vmin은 사용자가 임의로 조정할 수 있는 직류전원으로 구성된 것을 특징으로 하는 칩 보호용 프로우브 스테이션.The probe station of claim 1, wherein the individual power supplies Vmax and Vmin are configured by a DC power source that can be arbitrarily adjusted by a user. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950021852A 1995-07-24 1995-07-24 Probestation for chip damage protection KR0152945B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950021852A KR0152945B1 (en) 1995-07-24 1995-07-24 Probestation for chip damage protection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950021852A KR0152945B1 (en) 1995-07-24 1995-07-24 Probestation for chip damage protection

Publications (2)

Publication Number Publication Date
KR970007382A true KR970007382A (en) 1997-02-21
KR0152945B1 KR0152945B1 (en) 1998-12-15

Family

ID=19421385

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950021852A KR0152945B1 (en) 1995-07-24 1995-07-24 Probestation for chip damage protection

Country Status (1)

Country Link
KR (1) KR0152945B1 (en)

Also Published As

Publication number Publication date
KR0152945B1 (en) 1998-12-15

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