KR970007363A - Specific level (LEVEL) voltage automatic regulator of waveform test regulator - Google Patents
Specific level (LEVEL) voltage automatic regulator of waveform test regulator Download PDFInfo
- Publication number
- KR970007363A KR970007363A KR1019950022506A KR19950022506A KR970007363A KR 970007363 A KR970007363 A KR 970007363A KR 1019950022506 A KR1019950022506 A KR 1019950022506A KR 19950022506 A KR19950022506 A KR 19950022506A KR 970007363 A KR970007363 A KR 970007363A
- Authority
- KR
- South Korea
- Prior art keywords
- signal
- computer
- unit
- control
- input
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/08—Circuits for altering the measuring range
- G01R15/09—Autoranging circuits
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Control Of Electric Motors In General (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
Abstract
컴퓨터의 제어에 의해 피측정체 조정점의 디지탈값 중에서 잡음값을 제거한 평균전압을 기준으로 계산하여 모터 구동에 의해 자동 조정하여 파형 검사 조정기의 신뢰성을 향상시키기 위한 파형 검사 조정기의 특정 레벨(LEVEL) 전압 자동 조정장치에 관한 것으로, 하지그(41)를 통해 피측정체(10)에 직류전원을 인가하는 전원부(20)와 패턴신호를 공급하는 신호발생부(30)와 상기 피측정체(10)의 조정점(11) 데이타를 화면에 표시하는 오실로스코프(13)가 구비된 통상의 파형 검사 조정기 전압 조정장치에 있어서, 키보드(120)조작에 의해 설정하고자 하는 데이타 입력을 받아들여 제어 프로그램에 따라 주변장치를 초기화 하고 입력되는 데이타를 연산하여 모니터(110)에 출력하는 컴퓨터(100)와, 컴퓨터(100)의 제어명령에 의해 전원부(20)와 신호발생부(30)를 제어하는 GPIB제어부(90)와, 상기 컴퓨터(100) 제어명령에 의해 디지탈신호를 출력하여 신호절환부(60)와 입력이득제어부(61)를 제어하는 DI/O제어부(80)와, 상기 DI/O제어부(80) 제어에 의해 하지그(41)를 통해 추출되는 피측정체(10) 조정점(11)의 출력신호를 절환하는 신호절환부(60)와, 상기 신호절환부(60)에서 절환된 신호의 이득을 제어하여 아날로그신호를 출력하는 입력이득제어부(61)와, 상기 신호발생부(30)와 입력이득제어부(61)에서 입력되는 아날로그신호를 디지탈신호로 변환하여 컴퓨터(100)에 입력하는 A/D변환부(62)와, 상기 컴퓨터(100)의 제어명령에 의해 상지그(40)에 부착되어 피측정체(10)의 조정점(11)을 조정하기 위해 회전되는 모터(71)를 구동시키는 모터제어부(70)를 구비한 것이다.The specific level of the waveform inspection regulator for improving the reliability of the waveform inspection regulator by calculating the value based on the average voltage from which the noise value is removed among the digital values of the measurement target point under computer control and automatically adjusting it by the motor drive. A voltage automatic adjustment device, comprising: a power supply unit 20 for applying direct current power to an object under test 10 via a hag 41, a signal generator 30 for supplying a pattern signal, and the object to be measured 10; In the conventional waveform inspection regulator voltage regulator equipped with an oscilloscope (13) displaying data of the adjustment point (11) on the screen, the data input to be set by the operation of the keyboard 120 is accepted and according to the control program. The power supply unit 20 and the signal generating unit 30 are controlled by the computer 100 that initializes the peripheral device and calculates and outputs the input data to the monitor 110 and the control command of the computer 100. A GPIB controller 90, a DI / O controller 80 for controlling a signal switching unit 60 and an input gain controller 61 by outputting a digital signal by the computer 100 control command, and the DI / O A signal switching unit 60 for switching the output signal of the adjustment point 11 of the measurement target object 10 extracted through the hag 41 by the control of the control unit 80, and switching in the signal switching unit 60; An input gain control unit 61 for controlling the gain of the received signal and outputting an analog signal, and converting the analog signal inputted from the signal generator 30 and the input gain control unit 61 into a digital signal to the computer 100; A motor that is attached to the upper jig 40 by an input A / D conversion unit 62 and a control command of the computer 100 and rotated to adjust the adjustment point 11 of the object under test 10 ( A motor control unit 70 for driving 71 is provided.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제1도는 종래의 파형 검사 조정기에 적용되는 수작업에 의한 전압 조정장치를 보인 구성 블럭도, 제2도는 본 발명에 따른 파형 검사 조정기의 특정 레벨 전압 자동 조정장치를 보인 구성 블럭도, 제3도는 제2도에 따른 동작 순서도.FIG. 1 is a block diagram showing a manual voltage adjusting device applied to a conventional waveform check regulator, FIG. 2 is a block diagram showing a specific level voltage automatic adjusting device of a waveform check regulator according to the present invention, and FIG. Flow chart according to 2 degrees.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950022506A KR0177220B1 (en) | 1995-07-27 | 1995-07-27 | Automatic adjustment device for specific level of waveform inspection regulator |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950022506A KR0177220B1 (en) | 1995-07-27 | 1995-07-27 | Automatic adjustment device for specific level of waveform inspection regulator |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970007363A true KR970007363A (en) | 1997-02-21 |
KR0177220B1 KR0177220B1 (en) | 1999-04-01 |
Family
ID=19421800
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950022506A KR0177220B1 (en) | 1995-07-27 | 1995-07-27 | Automatic adjustment device for specific level of waveform inspection regulator |
Country Status (1)
Country | Link |
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KR (1) | KR0177220B1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100446852B1 (en) * | 1997-04-30 | 2004-11-03 | 현대 이미지퀘스트(주) | Voltage regulating apparatus including voltage detection unit, control unit, and regulating voltage output unit |
CN105868064A (en) * | 2016-04-15 | 2016-08-17 | 浪潮电子信息产业股份有限公司 | Method for automatically testing memory power supply of server |
-
1995
- 1995-07-27 KR KR1019950022506A patent/KR0177220B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0177220B1 (en) | 1999-04-01 |
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