KR970007134U - Memory device with self-test function - Google Patents

Memory device with self-test function

Info

Publication number
KR970007134U
KR970007134U KR2019950017298U KR19950017298U KR970007134U KR 970007134 U KR970007134 U KR 970007134U KR 2019950017298 U KR2019950017298 U KR 2019950017298U KR 19950017298 U KR19950017298 U KR 19950017298U KR 970007134 U KR970007134 U KR 970007134U
Authority
KR
South Korea
Prior art keywords
self
memory device
test function
test
function
Prior art date
Application number
KR2019950017298U
Other languages
Korean (ko)
Other versions
KR0129918Y1 (en
Inventor
심재철
Original Assignee
엘지반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체주식회사 filed Critical 엘지반도체주식회사
Priority to KR2019950017298U priority Critical patent/KR0129918Y1/en
Publication of KR970007134U publication Critical patent/KR970007134U/en
Application granted granted Critical
Publication of KR0129918Y1 publication Critical patent/KR0129918Y1/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/20—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits using counters or linear-feedback shift registers [LFSR]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/1201—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising I/O circuitry
KR2019950017298U 1995-07-13 1995-07-13 Memory apparatus having self test function KR0129918Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950017298U KR0129918Y1 (en) 1995-07-13 1995-07-13 Memory apparatus having self test function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950017298U KR0129918Y1 (en) 1995-07-13 1995-07-13 Memory apparatus having self test function

Publications (2)

Publication Number Publication Date
KR970007134U true KR970007134U (en) 1997-02-21
KR0129918Y1 KR0129918Y1 (en) 1999-02-01

Family

ID=19418179

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950017298U KR0129918Y1 (en) 1995-07-13 1995-07-13 Memory apparatus having self test function

Country Status (1)

Country Link
KR (1) KR0129918Y1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100594294B1 (en) * 2004-09-21 2006-06-30 삼성전자주식회사 A memory device and a method for data training

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100825776B1 (en) * 2006-08-28 2008-04-28 삼성전자주식회사 Memory device and test method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100594294B1 (en) * 2004-09-21 2006-06-30 삼성전자주식회사 A memory device and a method for data training

Also Published As

Publication number Publication date
KR0129918Y1 (en) 1999-02-01

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