KR970001693B1 - Preparation process of phase shift optical mask - Google Patents
Preparation process of phase shift optical maskInfo
- Publication number
- KR970001693B1 KR970001693B1 KR94021647A KR19940021647A KR970001693B1 KR 970001693 B1 KR970001693 B1 KR 970001693B1 KR 94021647 A KR94021647 A KR 94021647A KR 19940021647 A KR19940021647 A KR 19940021647A KR 970001693 B1 KR970001693 B1 KR 970001693B1
- Authority
- KR
- South Korea
- Prior art keywords
- phase shift
- preparation process
- optical mask
- shift optical
- mask
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/36—Masks having proximity correction features; Preparation thereof, e.g. optical proximity correction [OPC] design processes
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/26—Phase shift masks [PSM]; PSM blanks; Preparation thereof
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP29535088A JP2710967B2 (en) | 1988-11-22 | 1988-11-22 | Manufacturing method of integrated circuit device |
KR1019890016931A KR960006817B1 (en) | 1988-11-22 | 1989-11-21 | Mask for manufacturing semiconductor device and the method of manufacture thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
KR970001693B1 true KR970001693B1 (en) | 1997-02-13 |
Family
ID=26560220
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019920018201A KR960006818B1 (en) | 1988-11-22 | 1992-10-05 | Method of manufacturing photomask |
KR1019920018202A KR960006819B1 (en) | 1988-11-22 | 1992-10-05 | Method of manufacturing i.c. devices and photomask using them |
KR94021647A KR970001693B1 (en) | 1988-11-22 | 1994-08-30 | Preparation process of phase shift optical mask |
Family Applications Before (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019920018201A KR960006818B1 (en) | 1988-11-22 | 1992-10-05 | Method of manufacturing photomask |
KR1019920018202A KR960006819B1 (en) | 1988-11-22 | 1992-10-05 | Method of manufacturing i.c. devices and photomask using them |
Country Status (1)
Country | Link |
---|---|
KR (3) | KR960006818B1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7026081B2 (en) * | 2001-09-28 | 2006-04-11 | Asml Masktools B.V. | Optical proximity correction method utilizing phase-edges as sub-resolution assist features |
-
1992
- 1992-10-05 KR KR1019920018201A patent/KR960006818B1/en not_active IP Right Cessation
- 1992-10-05 KR KR1019920018202A patent/KR960006819B1/en not_active IP Right Cessation
-
1994
- 1994-08-30 KR KR94021647A patent/KR970001693B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR960006819B1 (en) | 1996-05-23 |
KR960006818B1 (en) | 1996-05-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A107 | Divisional application of patent | ||
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20110617 Year of fee payment: 15 |
|
EXPY | Expiration of term |