KR960038421A - Magnetic insertion part inspection device of circuit board - Google Patents
Magnetic insertion part inspection device of circuit board Download PDFInfo
- Publication number
- KR960038421A KR960038421A KR1019950010533A KR19950010533A KR960038421A KR 960038421 A KR960038421 A KR 960038421A KR 1019950010533 A KR1019950010533 A KR 1019950010533A KR 19950010533 A KR19950010533 A KR 19950010533A KR 960038421 A KR960038421 A KR 960038421A
- Authority
- KR
- South Korea
- Prior art keywords
- pin
- inspection device
- test
- circuit board
- uninserted
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
본 발명은 회로기판(PCB)에 전자부품 즉 침(chip)들을 삽입되어 있는지의 여부를 검사는 미삽 부품검사장치에 관한 것으로서, 상, 하픽스쳐를 실린더에 의해 상하작동시키도록 하여 지지봉(2-1)으로 회전기판(5)의 상부를 지지하고 검사핀(3-1)을 부품(6)의 리드선(6-1)에 접촉시켜 부품(6)의 미삽여부를 검사하도록 된 것에 있어서, 상픽스쳐(11) 하측 외주연에 복수개의 투명지지판(12)을 하향 입설시킨 것과 하픽스쳐(20)에는 스프링(34)으로 탄발되어지는 측정핀(33)을 갖는 검사핀(30)을 상향으로 장착하여서 된것인바, 종래의 리드선과 검사핀의 접촉 방식에 의한 전기방식을 베제하고 측정핀이 리드삽입공을 통과하는지의 연주에 따라 미삽 여부를 감지하고 또 각 검사핀에 의해 미삽 부품의 종류와 위치를 즉시도 확인할 수 있어 오판정의 소지를 현저히 줄여 줌으로써 신뢰성을 향상시킬 수 있고 또 짧은 시간에 측정검사를 실시할 수 있어 작업능률도 크게 향상시킬 수 있다.The present invention relates to an uninserted component inspection device for inspecting whether an electronic component, ie, chips, is inserted into a circuit board (PCB). The support rod (2-) is operated by vertically operating upper and lower fixtures by a cylinder. 1), the upper part of the rotary substrate 5 is supported, and the test pin 3-1 is brought into contact with the lead wire 6-1 of the part 6 to inspect the non-insertion of the part 6. The plurality of transparent support plates 12 are placed downward on the outer periphery of the fixture 11 and the test pins 30 having the measuring pins 33 that are shot with springs 34 are mounted upwardly on the lower fixtures 20. As a result, the electric method by the contact method between the conventional lead wire and the inspection pin is eliminated, and whether the measurement pin passes through the lead insertion hole or not is detected, and the type and position of the uninserted component are determined by each inspection pin. Can be checked immediately, significantly reducing the risk of misjudgment As possible to improve the reliability and can also it is possible to conduct a test measurement in a short time it is greatly improved working efficiency.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.
제2도는 본 발명에 따른 미삽 검사장치의 일예시도, 제3도는 본 발명에 따른 이삽 검사장치의 작동관계 설명도.Figure 2 is an example of an uninserted inspection device according to the present invention, Figure 3 is a diagram illustrating the operation relationship of the inspection device according to the invention.
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950010533A KR0154233B1 (en) | 1995-04-29 | 1995-04-29 | The detecting apparatus for miss-inserting components on pcb at auto-inserting process |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950010533A KR0154233B1 (en) | 1995-04-29 | 1995-04-29 | The detecting apparatus for miss-inserting components on pcb at auto-inserting process |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960038421A true KR960038421A (en) | 1996-11-21 |
KR0154233B1 KR0154233B1 (en) | 1998-12-15 |
Family
ID=19413418
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950010533A KR0154233B1 (en) | 1995-04-29 | 1995-04-29 | The detecting apparatus for miss-inserting components on pcb at auto-inserting process |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0154233B1 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100850751B1 (en) * | 2007-04-27 | 2008-08-06 | 김영종 | Apparatus for inspecting formation of ecu housing for vehicles |
CN109360535A (en) * | 2018-12-04 | 2019-02-19 | 深圳市华星光电技术有限公司 | The oblique cutting protection system of display driver circuit and oblique cutting guard method |
KR102272707B1 (en) * | 2019-11-19 | 2021-07-05 | 주식회사 화승알앤에이 | Apparatus for inspecting O-ring |
-
1995
- 1995-04-29 KR KR1019950010533A patent/KR0154233B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0154233B1 (en) | 1998-12-15 |
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E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20010629 Year of fee payment: 4 |
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LAPS | Lapse due to unpaid annual fee |