KR960038421A - Magnetic insertion part inspection device of circuit board - Google Patents

Magnetic insertion part inspection device of circuit board Download PDF

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Publication number
KR960038421A
KR960038421A KR1019950010533A KR19950010533A KR960038421A KR 960038421 A KR960038421 A KR 960038421A KR 1019950010533 A KR1019950010533 A KR 1019950010533A KR 19950010533 A KR19950010533 A KR 19950010533A KR 960038421 A KR960038421 A KR 960038421A
Authority
KR
South Korea
Prior art keywords
pin
inspection device
test
circuit board
uninserted
Prior art date
Application number
KR1019950010533A
Other languages
Korean (ko)
Other versions
KR0154233B1 (en
Inventor
박기원
Original Assignee
배순훈
대우전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 배순훈, 대우전자 주식회사 filed Critical 배순훈
Priority to KR1019950010533A priority Critical patent/KR0154233B1/en
Publication of KR960038421A publication Critical patent/KR960038421A/en
Application granted granted Critical
Publication of KR0154233B1 publication Critical patent/KR0154233B1/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

본 발명은 회로기판(PCB)에 전자부품 즉 침(chip)들을 삽입되어 있는지의 여부를 검사는 미삽 부품검사장치에 관한 것으로서, 상, 하픽스쳐를 실린더에 의해 상하작동시키도록 하여 지지봉(2-1)으로 회전기판(5)의 상부를 지지하고 검사핀(3-1)을 부품(6)의 리드선(6-1)에 접촉시켜 부품(6)의 미삽여부를 검사하도록 된 것에 있어서, 상픽스쳐(11) 하측 외주연에 복수개의 투명지지판(12)을 하향 입설시킨 것과 하픽스쳐(20)에는 스프링(34)으로 탄발되어지는 측정핀(33)을 갖는 검사핀(30)을 상향으로 장착하여서 된것인바, 종래의 리드선과 검사핀의 접촉 방식에 의한 전기방식을 베제하고 측정핀이 리드삽입공을 통과하는지의 연주에 따라 미삽 여부를 감지하고 또 각 검사핀에 의해 미삽 부품의 종류와 위치를 즉시도 확인할 수 있어 오판정의 소지를 현저히 줄여 줌으로써 신뢰성을 향상시킬 수 있고 또 짧은 시간에 측정검사를 실시할 수 있어 작업능률도 크게 향상시킬 수 있다.The present invention relates to an uninserted component inspection device for inspecting whether an electronic component, ie, chips, is inserted into a circuit board (PCB). The support rod (2-) is operated by vertically operating upper and lower fixtures by a cylinder. 1), the upper part of the rotary substrate 5 is supported, and the test pin 3-1 is brought into contact with the lead wire 6-1 of the part 6 to inspect the non-insertion of the part 6. The plurality of transparent support plates 12 are placed downward on the outer periphery of the fixture 11 and the test pins 30 having the measuring pins 33 that are shot with springs 34 are mounted upwardly on the lower fixtures 20. As a result, the electric method by the contact method between the conventional lead wire and the inspection pin is eliminated, and whether the measurement pin passes through the lead insertion hole or not is detected, and the type and position of the uninserted component are determined by each inspection pin. Can be checked immediately, significantly reducing the risk of misjudgment As possible to improve the reliability and can also it is possible to conduct a test measurement in a short time it is greatly improved working efficiency.

Description

회로기판의 자삽부품 미삽 검사장치Magnetic insertion part inspection device of circuit board

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제2도는 본 발명에 따른 미삽 검사장치의 일예시도, 제3도는 본 발명에 따른 이삽 검사장치의 작동관계 설명도.Figure 2 is an example of an uninserted inspection device according to the present invention, Figure 3 is a diagram illustrating the operation relationship of the inspection device according to the invention.

Claims (4)

상, 하픽스쳐를 실린더에 의해 상하작동시키도록 하여 지지봉(2-1)으로 회전기판(5)의 상부로 지지하고 검사핀(3-1)을 부품(6)의 리드선(601)에 접촉시켜 부품(6)의 미삽여부를 검사하도록 된 것에 있어서, 상픽스쳐(11) 하측외주연에 복수개의 투명지지판(12)을 하향 입설시킨 것과 하핏스쳐(20)에는 스프링(34)으로 탄발되어지는 측정핀(33)을 갖는 검사핀(30)을 상향으로 장착하여서된 것을 특징으로 하는 회로기판의 자삽부품 미삽 검사장치.The upper and lower fixtures are operated up and down by a cylinder, and are supported by the support rod 2-1 to the upper portion of the rotating substrate 5, and the test pins 3-1 are brought into contact with the lead wires 601 of the parts 6. In order to inspect the non-insertion of the component 6, the plurality of transparent support plates 12 are placed downward in the lower outer periphery of the upper fixture 11, and the measurement is applied to the lower fitting 20 with springs 34. The magnetic insertion part uninserted inspection device of a circuit board, characterized in that the mounting pin 30 having a pin (33) upward. 제1항에 있어서, 검사핀(30)은 내부가 공간부로 되고 전방에 유통공(32)을 갖는 하우징(31)에 스프링(34)으로 탄발되는 측정핀(33)을 구바하여서 된 것을 특징으로 하는 회로기판의 자삽부품 미삽 검사장치The method of claim 1, wherein the test pin 30 is characterized in that the measuring pin 33 which is shot with the spring 34 in the housing 31 having a space inside and the flow hole 32 in front of the bar 31, characterized in that Uninserted inspection device 제1항에 있어서, 상픽스쳐(11)를 지지하는 양측의 지지대(15)에는 광센서(16)를 동일 수평선상에 장착하여 검사핀(30)의 측정ㅍㄴ(33)을 감지하도록 된 것을 특징으로 하는 회로기관의 자삽부품 미삽 검사장치.The method of claim 1, wherein the support 15 on both sides supporting the upper fixture 11 is mounted on the same horizontal line to detect the measuring pin 33 of the test pin 30 by mounting the optical sensor 16 on the same horizontal line. Uninserted inspection device for self-inserted parts of a circuit engine. 제2항에 있어서, 섬사핀(30)의 하우징(31)에 센서(35)를 구비하여 측정핀(33)의 삽입 여부를 감지하도록 된 것을 특징으로 하는 것을 특징으로 하는 회로기판의 자삽부품 미삽 검사장치.The magnetic insertion part of the circuit board of claim 2, wherein the sensor 35 is provided in the housing 31 of the thread pin 30 to detect whether the measuring pin 33 is inserted. Inspection device.
KR1019950010533A 1995-04-29 1995-04-29 The detecting apparatus for miss-inserting components on pcb at auto-inserting process KR0154233B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950010533A KR0154233B1 (en) 1995-04-29 1995-04-29 The detecting apparatus for miss-inserting components on pcb at auto-inserting process

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950010533A KR0154233B1 (en) 1995-04-29 1995-04-29 The detecting apparatus for miss-inserting components on pcb at auto-inserting process

Publications (2)

Publication Number Publication Date
KR960038421A true KR960038421A (en) 1996-11-21
KR0154233B1 KR0154233B1 (en) 1998-12-15

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950010533A KR0154233B1 (en) 1995-04-29 1995-04-29 The detecting apparatus for miss-inserting components on pcb at auto-inserting process

Country Status (1)

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KR (1) KR0154233B1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100850751B1 (en) * 2007-04-27 2008-08-06 김영종 Apparatus for inspecting formation of ecu housing for vehicles
CN109360535A (en) * 2018-12-04 2019-02-19 深圳市华星光电技术有限公司 The oblique cutting protection system of display driver circuit and oblique cutting guard method
KR102272707B1 (en) * 2019-11-19 2021-07-05 주식회사 화승알앤에이 Apparatus for inspecting O-ring

Also Published As

Publication number Publication date
KR0154233B1 (en) 1998-12-15

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