KR960024345A - Trace Chlorine Ion Type and X-Ray Analysis Method in Solution Using Filter Method - Google Patents

Trace Chlorine Ion Type and X-Ray Analysis Method in Solution Using Filter Method Download PDF

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Publication number
KR960024345A
KR960024345A KR1019940040298A KR19940040298A KR960024345A KR 960024345 A KR960024345 A KR 960024345A KR 1019940040298 A KR1019940040298 A KR 1019940040298A KR 19940040298 A KR19940040298 A KR 19940040298A KR 960024345 A KR960024345 A KR 960024345A
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KR
South Korea
Prior art keywords
aglα
solution
chlorine ion
clkα
ray analysis
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KR1019940040298A
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Korean (ko)
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KR0158562B1 (en
Inventor
소재춘
김정호
Original Assignee
김만제
포항종합제철 주식회사
신창식
재단법인 산업과학기술연구소
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Priority to KR1019940040298A priority Critical patent/KR0158562B1/en
Publication of KR960024345A publication Critical patent/KR960024345A/en
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Publication of KR0158562B1 publication Critical patent/KR0158562B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

여지법을 이용한 용액중 미량 염소이온 형광 X-선 분석방법에 있어서, ClKα와 AgLα강도를 동시에 측정하여 AgLα의 강도를 내부표준으로 사용하여 표준용액을 이용하여 염소이온의 농도 대 ClKα/AgLα 강도와의 검량곡선을 작성한 후, 분석하고자 하는 시료용액의 ClKα/AgLα을 측정한 후 앞서 작성된 검량곡선을 이용하여 염소이온을 정량분석한다.In the trace chlorine ion fluorescence X-ray analysis method using the excitation method, ClKα and AgLα intensities were measured simultaneously, and the concentration of chlorine ion versus ClKα / AgLα intensity After preparing the calibration curve of, measure the ClKα / AgLα of the sample solution to be analyzed and quantitatively analyze chlorine ions using the calibration curve previously prepared.

Description

여지법을 이용한 용액중의 미량 염소이온 형과 X-선 분석방법Trace Chlorine Ion Type and X-ray Analysis in Solution Using Filter Method

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 기존의 여지법에 의한 시료조제과정을 나타낸 공정도.1 is a process chart showing a sample preparation process according to the existing filter method.

Claims (1)

여지법을 이용하여 형광 X-선 분석법으로 용액중에 미량 함유되어 있는 염소 이온을 질산은과 반응시켜 정량 분석함에 있어서, ClKα와 AgLα의 강도를 동시에 측정하여 AgLα의 강도를 내부표준으로 사용하여 표준용액을 이용하여 염소이온의 농도 대 ClKα/AgLα의 강도와의 검량곡선을 작성한 후, 분석하고자 하는 미지시료용액의 경우도 동일한 방법으로 시료조제를 하고나서 ClKα/AgLα의 강도를 측정하고, 앞서 작성된 검량곡선을 이용하여 정량분석함을 특징으로 하는 여지법을 이용한 용액중의 미량 염소이온 형광 X-선 분석방법.In quantitative analysis by reacting silver nitrate with chlorine ions contained in the solution by fluorescence X-ray analysis using excitation method, the intensity of ClKα and AgLα were measured simultaneously and AgLα intensity was used as internal standard. After preparing the calibration curve between the concentration of chlorine ion and the strength of ClKα / AgLα, measure the strength of ClKα / AgLα after preparing the sample in the same way for the unknown sample solution to be analyzed. Trace chlorine ion fluorescence X-ray analysis method in solution using the method characterized in that the quantitative analysis using. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019940040298A 1994-12-31 1994-12-31 Fluorescent x-ray analysis method of micro-chlorine ion using paper disc method KR0158562B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019940040298A KR0158562B1 (en) 1994-12-31 1994-12-31 Fluorescent x-ray analysis method of micro-chlorine ion using paper disc method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019940040298A KR0158562B1 (en) 1994-12-31 1994-12-31 Fluorescent x-ray analysis method of micro-chlorine ion using paper disc method

Publications (2)

Publication Number Publication Date
KR960024345A true KR960024345A (en) 1996-07-20
KR0158562B1 KR0158562B1 (en) 1999-03-30

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940040298A KR0158562B1 (en) 1994-12-31 1994-12-31 Fluorescent x-ray analysis method of micro-chlorine ion using paper disc method

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101368512B1 (en) * 2012-04-25 2014-02-28 현대제철 주식회사 Method for manufacturing test sheet for analysis on chlorine content

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Publication number Publication date
KR0158562B1 (en) 1999-03-30

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